A Study on Malfunction Mode and Failure Rate Properties of Semiconductor by Impact of Pulse Repetition Rate (펄스 반복률에 의한 반도체 소자의 오동작 모드와 고장률에 관한 연구)
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- Journal of the Korean Institute of Electrical and Electronic Material Engineers
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- v.28 no.6
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- pp.360-364
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- 2015