• Journal of the Korean Crystal Growth and Crystal Technology
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• v.10 no.3
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• pp.205-210
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• 2000

Lead titanate thin films were fabricated on Si(100) wafer and ITO-coated glass substrates by metal organic chemical vapor deposition using ultrasonic spraying. When the ratio (Ti/Pb) of starting materials was 1.2, the films deposited on Si wafer had a single perovskite phase. The films deposited on ITO-coated glass had higher growth rate than that on Si wafer. As deposition temperature was increased from $530^{\circ}C$ to $570^{\circ}C$, dielectric constant was increased due to the increase of crystallinity and grain size. At $570^{\circ}C$, dielectric constant and dielectric loss of the films were 205 and 0.016, respectively. When the deposition temperature is higher than $600^{\circ}C$, dielectric constant was decreased.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.19 no.5
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• pp.251-255
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• 2009

Nanocomposites based on coupling $TiO_2$ matrix with nanosized noble metals (Pt,Au) particles exhibited promising photoelectrode properties. The $M/TiO_2$ (M=Pt,Au) nanocomposite thin films were deposited on quartz and ITO glass substrates using a co-sputtering method. $TiO_2$ in rutile form is the dominant crystalline phase for as-deposited nanocomposite films. Along with heat treatment up to $600^{\circ}C$, XRD peaks of the rutile phase as well as those of noble metal increased in intensity and decreased in width, indicating the growth of crystallites. The anodic photocurrents of $M/TiO_2$ (M=Au,Pt) thin films were observed not only in the UV range but also in the visible light range. The photocurrent of the nanocomnosite films extended to the visible light region by dispersion of nano-sized noble metal in the $TiO_2$ matrix.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2009.10a
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• pp.248-248
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• 2009

GaN 기반 LED 소자의 ITO 표면에 sol-imprinting 기술을 이용하여 잔여층 없이 $TiO_2$ 나노 패턴을 형성하였다. 알콕사이드 계열의 $TiO_2$ sol과 Si 몰드로부터 복제된 PDMS 몰드를 사용하여 표면에 패턴을 형성하고, 이 후 annealing을 통해 내부에 남아있던 불순물을 제거하고 다결정 $TiO_2$을 형성하였다. 표면에 형성된 $TiO_2$ 나노 패턴이 LED 소자 내부에서 발생한 빛의 전반사를 억제하기 때문에 소자의 광추출 효율이 증가하였다.

• Journal of the Korean Vacuum Society
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• v.7 no.1
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• pp.17-23
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• 1998

$Pb(Fe_{0.5}Nb_{0.5}O_3(PFN)$ thin films were prepared by rf magnetron co-sputtering method on $SiO_2/Si$, ITO/glass, and $Pt/Ti/SiO_2/Si$ substrates and post-annealed at the $N_2$ atmosphere by RTA(rapid thermal annerling). The degree of crystallinity of PFN films was identified on various substrates. Electrical properties of PFN films was characterized for $Pt/PFN/Pt/Ti/SiO_2/Si$ structure. The composition of PFN films was estimated by EPMA (electron probe micro analysis). PFN films would be crystallized better to perovskite phase on ITO/glass substrate than $SiO_2/Si$ substrate. This may be induced by the deformation of Pb deficient pyrochlore phase due to Pb diffusion into $SiO_2/Si$ substrate. PFN films on $Pt/Ti/SiO_2/Si$ substrate. PFN films with 5-10% Pb excess were crystallized to perovskite phase from $500^{\circ}C$ temperature. In summary, we show that Pb composition and annealing temperature were critically influenced on crystallinity to perovskite phase. When PFN film with 17% Pb excess was annealed at $600^{\circ}C$ at the $N_2$ atmosphere for 300kV/cm and 88. Its remnant polarization coercive field $2.0 MC/cm^2$ and 144kV/cm, respectively.

• Korean Journal of Materials Research
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• v.13 no.4
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• pp.259-265
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• 2003

For the aim of thin microwave absorbers used in mobile telecommunication frequency band, this study proposed a high permittivity dielectrics(λ/4 spacer) coated with ITO thin films of 377 $\Omega$/sq(impedance transformer). High frequency dielectric properties of ferroelectric ceramics, electrical properties of ITO thin films and microwave absorbing properties of ITO/dielectrics were investigated. Ferroelectric materials including $BaTiO_3$(BT), 0.9Pb($Mg_{1}$3/Nb$_{2}$3/)$O_3$-0.1 $PbTiO_3$(PMN-PT), 0.8 Pb (Mg$_{1}$3/$Nb_{2}$3/)$O_3$-0.2 Pb($Zn_{1}$3$_Nb{2}$3/)$O_3$(PMN-PZN) were prepared by ceramic processing for high permittivity dielectrics,. The ferroelectric materials show high dielectric constant and dielectric loss in the microwave frequency range. The microwave absorbance (at 2 ㎓) of BT, 0.9PMN-0.1PT, and 0.8PMN-0.2PZN were found to be 60%(at a thickness of 3.5 mm), 20% (2.5 mm), and 30% (2.5 mm), respectively. By coating the ITO thin films on the ferroelectric substrates with λ/4 thickness, the microwave absorbance is greatly improved. Particularly, when the surface resistance of ITO films is closed of 377 $\Omega$/sq, the reflection loss is reduced to -20 ㏈(99% absorbance). This is attributed to the wave impedance matching controlled by ITO thin films at a given thickness of high permittivity dielectrics of λ/4 (3.5 mm for BT, 2.5 mm for PMN-PT and PMN-PZN at 2 ㎓). It is, therefore, successfully proposed that the ITO/ferroelectric materials with controlled surface resistance and high dielectric constant can be useful as a thin microwave absorbers in mobile telecommunication frequency band.

• Journal of the Korean Vacuum Society
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• v.10 no.4
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• pp.416-423
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• 2001

Microstructural, optical and dielectric properties of $SrTiO_3$ thin films were investigated. These films were deposited on the ITO glasses by rf-magnetron sputtering at room temperature and subequently heat treated in $O_2$ atmosphere at various temperatures. It has been found from X-ray diffraction patterns that as-deposited films prepared at room temperature are amorphous, while the films heat treated at temperature range of 400~$600^{\circ}C$ reveal the structure of pyrochlore. On the other hand, the structure of perovskite is dominantly observed in the films heat treated at temperatures over $650^{\circ}C$ in which the drastic changes of optical band gap and dielectric constant are observed. In addition, the phase transition peak is observed at $272^{\circ}C$ in the films heat treated at $600^{\circ}C$, while the dielectric dispersion is observed at near $310^{\circ}C$ in the films heat treated at $650^{\circ}C$.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.534-534
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• 2013

본 연구에서는 RF/DC 마그네트론 스퍼터링 시스템을 이용하여 co-sputtering 방법으로 TiO2와 ZnO를 이용하여 인버티드 유기태양전지용 버퍼층을 제작하고 TiO2와 ZnO의 함량에 따른 인버티드 유기 태양전지 특성을 비교하였다. Ti-Zn-O 버퍼층은 기존의 버퍼층 제작에 사용되던 용액 공정 대신 스퍼터링 시스템을 이용하여 제작하였다. ITO 전극 상부에 곧바로 Ti-Zn-O를 성막하여 Anode와 버퍼층이 일체화된 투명 전극을 제작하고 ZnO와 TiO2 함량이 유기 태양전지의 특성에 미치는 영향을 연구하였다. 버퍼층의 TiO2와 ZnO 함량에 따른 광학적, 구조적특성을 UV/Vis spectrometry와 X-ray diffraction (XRD), TEM 등으로 분석하였으며, Ti-Zn-O 박막의 실제 버퍼 층으로서의 적용 가능성을 알아보기 위해 인버티드 유기태양전지로 제작하여 그 특성을 평가하였다. 기존의 인버티드 유기태양전지의 특성이 fill factor of 55.58%, short circuit current of 8.33 mA/cm2, open circuit voltage of 0.66 V, efficiency 3.06%인데 반해 최적 조건의 Ti-Zn-O 버퍼층을 적용했을 경우 fill factor of 52.05%, short circuit current of 8.81 mA/cm2, open circuit voltage of 0.66 V, efficiency 3.03%인 우수한 유기태양전지의 특성을 보임으로써 스퍼터링 공법으로 제작된 Ti-Zn-O 박막의 인버티드 유기태양전지용 버퍼 층으로서의 적용 가능성을 확인하였다.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.29 no.2
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• pp.69-74
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• 2016

In this study, we proposed an a-IGZO (amorphous In-Ga-Zn-O) TFT (thin-film transistor) with off-planed source/drain structure. Furthermore, two different electrode materials (ITO and Ti) were applied to the source and drain contacts for performance improvement of a-IGZO TFTs. When the ITO with a large work-function and the Ti with a small work-function are applied to drain electrode and source contact, respectively, the electrical performances of a-IGZO TFTs were improved; an increased driving current, a decreased leakage current, a high on-off current ratio, and a reduced subthreshold swing. As a result of gate bias stress test at various temperatures, the off-planed S/D a-IGZO TFTs showed a degradation mechanism due to electron trapping and both devices with ITO-drain or Ti-drain electrode revealed an equivalent instability.

• Proceedings of the KIEE Conference
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• 1997.07d
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• pp.1491-1493
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• 1997

In this study, Sol-Gel derived $Ba_{0.7}Sr_{0.3}TiO_3$ (BST(70/30)) thin films were investigated. The stock solution of BST were fabricated and spin-coated on the Pt/Ti/$SiO_2$/Si and ITO/glass substrates. The coated specimen were dried at $300^{\circ}C$ and finally annealed at $650{\sim}750^{\circ}C$. To analyse crystallization condition and microstructural morphology for different substrates, XRD, and SEM analysis were processed. In the BST(70/30) composition. dielectric constant and loss characteristics measured at 1kHz were 173, 0.01% for Pt/Ti/$SiO_2$/Si substrates and 181, 0.019% for ITO/glass substrates, respectively.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.10 no.6
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• pp.418-424
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• 2000

Pure $TiO_2$and 10 mol % Pb-doped $TiO_2(Pb_xTi_{1-x}O_2$(x = 0.1)) powder and thin films have been prepared by the sol-gel method. Titanium isopropoxide and ethanol are used for pure $TiO_2$, lead acetate trihydrate and titanium triisopropoxide monoacethylacetonate are used for Pb-doped $TiO_2$, respectively. Films are coated on p-type Si(100) wafer and ITO glass substrates by the sol-gel spin-coating method. The powder and multi-coated films are annealed at different temperature (400~$800^{\circ}C$) for phase formation and crystallization. TGA/DTA, XRD analysis, SEM and UV-visible transmission spectroscopy have been used to study the characteristics of the powder and films. XRD results show that the films are polycrystalline, anatase type and oriented predominantly to the A(101) plane. A slight shift in the d-spacing for the Pb-doped film indicates the incorporation of the Pb into $TiO_2$lattice. A shift of the absorption wavelength in the transmission spectrum towards longer wavelength has been observed about $Pb_xT_{1-x}O_2$(x = 0.1) thin film, which indicates a decrease in the bandgap of $TiO_2$upon Pb-doping.