• Title/Summary/Keyword: ITO(Indium-Tin Oxide)

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The Etching Properties of Indium Tin Oxide Thin Films in O2/BCl3/Ar Gas Mixture Using Inductively Coupled Plasma (유도결합플라즈마를 이용한 O2/BCl3/Ar가스에 따른 Indium Tin Oxide 박막의 식각 특성 연구)

  • Wi, Jae-Hyung;Woo, Jong-Chang;Kim, Chang-Il
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.23 no.10
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    • pp.752-758
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    • 2010
  • The etching characteristics of indium tin oxide (ITO) thin films in an $O_2/BCl_3/Ar$ plasma were investigated. The etch rate of ITO thin films increased with increasing $O_2$ content from 0 to 2 sccm in $BCl_3$/Ar plasma, whereas that of ITO decreased with increasing $O_2$ content from 2 sccm to 6 sccm in $BCl_3$/Ar plasma. The maximum etch rate of 65.9 nm/m in for the ITO thin films was obtained at 2 sccm $O_2$ addition. The etch conditions were the RF power of 500 W, the bias power of 200 W, the process pressure of 15 mTorr, and the substrate temperature of $40^{\circ}C$. The analysis of x-ray photo electron spectroscopy (XPS) was carried out to investigate the chemical reactions between the surfaces of ITO thin films and etch species.

A Study on the Properties of Indium-Tin-Oxide(ITO) Films Deposited by DC magnetron sputtering method (DC magnetron sputtering 방법으로 형성한 Indium-Tin-Oxide(ITO) 박막의 특성 연구)

  • An, Myung-Hwan
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.10 no.3
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    • pp.473-478
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    • 2006
  • High quality indium tin oxide (ITO) thin films have been prepared by DC magnetron sputtering technique. By controlling the deposition parameters such as substrate temperature and oxygen flow rate, we were able to minimize the negative ion damage during the deposition. Films pr데ared under such conditions were found to posses an excel]ent electrical resistivity of $1.6\times10^{-4}{\Omega}cm$ and also found to have a optical transmission above 90%. We also observe that, increasing the oxygen now rate above 4 sccm leads to an increase in electrical resistivity of the films while the transmission was found to saturate with the increase in the oxygen gas flow.

Feasibility of Indium Tin Oxide (ITO) Swarf Particles to Transparent Conductive Oxide (TCO)

  • Hong, Sung-Jei;Yang, DuckJoo;Cha, Seung Jae;Lee, Jae-Yong;Han, Jeong-In
    • Current Photovoltaic Research
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    • v.3 no.2
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    • pp.50-53
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    • 2015
  • Indium (In) is widely used for transparent electrodes of photovoltaics as a form of indium tin oxide (ITO) due to its superior characteristics of environmental stability, relatively low electrical resistivity and high transparency to visible light. However, In has been worn off in proportion to growth the In related market, and it leads to raise of price. Although In is obtained from ITO target scarps, much harmful elements are used for the recycling process. To decrease of harmful elements, ITO swarf particles obtained from target scraps was characterized whether it is feasible to transparent conductive oxide (TCO). The ITO swarf was crushed with milling process, and it was mixed with new ITO nanoparticles. The mixed particles were well dispersed into ink solvent to make-up an ink, and it was well coated onto glass substrate. After heat-treatment at $400^{\circ}C$ under $N_2$ rich environments, optical transmittance at 550 nm and sheet resistance of the ITO ink coated layer was 71.6% and $524.67{\Omega}/{\square}$, respectively. Therefore, it was concluded that the ITO swarf was feasible to TCO of touch screen panel.

Inkjet Printable Transparent Conducting Oxide Electrodes

  • Kim, Han-Gi
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2011.05a
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    • pp.59.2-59.2
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    • 2011
  • We have demonstrated ink-jet printed indium tin oxide (ITO) and indium tin zinc oxide (IZTO) electrodes for cost-efficient organic solar cells (OSCs). By ink-jetting of crystalline ITO nano-particles and performing a rapid thermal anneal at $450^{\circ}C$, we were able to obtain directly patterned-ITO electrodes with an average transmittance of 84.14% and a sheet resistance of 202.7 Ohm/square without using a conventional photolithography process. The OSCs fabricated on the directly patterned ITO electrodes by ink-jet printing showed an open circuit voltage of 0.57 V, short circuit current of 8.47 mA/cm2, fill factor of 44%, and power conversion efficiency of 2.13%. This indicates that the ITO directly-patterned by ink-jet printing is a viable alternative to sputter-grown ITO electrodes for cost-efficient printing of OSCs due to the absence of a photolithography process for patterning and more efficient ITO material usage.

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전자빔 증착법에 의한 Indium Tin Oxide박막의 증착속도에 따른 광학적 물성변화

  • O, Gyu-Jin;Kim, Seon-Pil;Kim, Eun-Gyu
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.08a
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    • pp.330-330
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    • 2012
  • 일반적으로 투명전극 재료로서 이용되는 Indium Tin Oxide (ITO)는 높은 전기전도도에도 불구하고, 가시광선 영역에서 높은 광학적 투과도를 지니고 있다. 즉, 비저항이 $10^{-3}{\Omega}/cm$ 보다 작으면서, 380 nm에서 780 nm사이의 가시광선 영역에서 80%이상의 투과도를 가지는 우수한 transparent conducting oxide 물질로 인식되고 있다. 또한 이 물질은 가시광선 영역에서의 굴절률이 대략 2정도이기 때문에, 다른 반도체재료와 진공사이의 계면에서 발생하는 반사를 줄여, 태양광전지나 LED 등에 이용될 수 있는 무반사 코팅재로 이용될 수 있다. 이러한 이유로 현재 각 분야에서 ITO에 관한 연구가 활발히 진행되고 있다. 본 연구에서는 ITO에 대한 기초연구로서, 전자빔 증착법으로 박막을 증착시키는 동안 증착속도에 따른 박막의 물성변화를 조사하였다. 또한 수직으로 증착할 때와 Glancing Angle Deposition 방법을 이용하였을 때, 증착속도에 따른 박막의 물성변화를 비교 분석하고자 하였다. 여기서, 증착속도는 $1{\AA}/s$에서 $4{\AA}/s$ 범위로 변화를 주었고, 증착물질과 기판의 각도는 $0^{\circ}$, $15^{\circ}$, $45^{\circ}$, $75^{\circ}$로 하였다. 먼저 수직으로 증착할 때, 증착속도의 변화에 따른 반사도, 투과도 및 굴절률과 증착단면의 구조를 비교하고, 다음으로 기판에 각도를 주어 박막을 증착하였을 때의 증착속도에 따른 박막의 광학적 및 구조적 물성의 변화를 측정하였다.

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Fabrication and characterization of Indium-Tin Oxide thin film on the commercial glass substrate (일반 현미경용 유리에 증착시킨 Indium-Tin Oxide 박막의 제작 및 특성)

  • 김여중;조길호
    • Journal of the Korean Vacuum Society
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    • v.9 no.1
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    • pp.30-35
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    • 2000
  • Indium-Tin Oxide (ITO) thin films were deposited on the commercial glass substrate by rf-magnetron sputtering. The ITO films with the thickness of 2,000~2,400 $\AA$ were prepared by changing the oxygen partial pressures of 2, 3, and 5%, as well as by changing the substrate temperature of $300^{\circ}C$ and $500^{\circ}C$. spectrophotometer, XRD, SEM, AFM, 4-point probe and Hall effect system were employed to characterize the ITO films. The optimum deposition conditions were the substrate temperature of $500^{\circ}C$ and oxygen partial pressure of 2-3%. At theses conditions, the ITO film showed the transmittance of 91%, the resistivity of $5.4\times10^{-3}\Omega$cm, the carrier concentration of $1.0\times10^{19}\textrm{cm}^{-3}$, and the carrier mobility of 150$\textrm{cm}^2$/Vsec. In XRD spectra, the (222) and (400) $In_2O_3$ planes were dominant under the optimum deposition conditions When the substrate was cleaned only by the method of ultrasonic cleaning without both pre-annealing and chemical treatment of the substrate, the ITO film exhibited the transmittance of 86%, the carrier concentration of $5.4\times10^{19}\textrm{cm}^{-3}$ and the mobility of 24$\textrm{cm}^2$/Vsec.

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Synthesis and Properties of ITO Nano Powders by Spray Drying Process (분무건조법에 의한 ITO 나노분말의 합성과 특성)

  • 허민선;최철진;권대환
    • Journal of Powder Materials
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    • v.11 no.1
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    • pp.22-27
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    • 2004
  • The Indium Tin Oxide(ITO) nano powders were prepared by spray drying and heat treatment process. The liquid solution dissolved Indium and Tin salts was first spray dried to prepare chemically homogeneous recursor powders at the optimum spray drying conditions. Subsequently, the precursor powders were subjected to eat treatment process. The nano size ITO powders was synthesized from the previous precursor powders and the npuities also were decreased with increasing heat treatment temperature. Furthermore, the lattice parameter of TO nano powders was increased by doping Tin into Indium with increasing heat treatment temperature. The par icle size of the resultant ITO powders was about 20∼50nm and chemical composition was composed of In:Sn =86:10 wt.% at 80$0^{\circ}C$.

Nd:YVO4 Laser Patterning of Various Transparent Conductive Oxide Thin Films on Glass Substrate at a Wavelength of 1,064 nm

  • Wang, Jian-Xun;Kwon, Sang Jik;Cho, Eou Sik
    • Transactions on Electrical and Electronic Materials
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    • v.14 no.2
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    • pp.59-62
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    • 2013
  • At an infra-red (IR) wavelength of 1,064 nm, a diode-pumped Q-switched $Nd:YVO_4$ laser was used for the direct patterning of various transparent conductive oxide (TCO) thin films on glass substrate. With various laser beam conditions, the laser ablation results showed that the indium tin oxide (ITO) film was removed completely. In contrast, zinc oxide (ZnO) film was not etched for any laser beam conditions and indium gallium zinc oxide (IGZO) was only ablated with a low scanning speed. The difference in laser ablation is thought to be due to the crystal structures and the coefficient of thermal expansion (CTE) of ITO, IGZO, and ZnO. The width of the laser-patterned grooves was dependent on the film materials, the repetition rate, and the scanning speed of the laser beam.

The Property Change of ITO Prepared by Reactive R.F. Sputtering in POP manufacturing Process (반응성 스퍼트링으로 형성된 ITO의 유전채 소성에 따른 특성변화)

  • Nam, Sang-Ok;Chi, Sung-Won;Sohn, Je-Bong;Huh, Keun-Do;Cho, Jung-Soo;Park, Chung-Hoo
    • Proceedings of the KIEE Conference
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    • 1997.07d
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    • pp.1411-1413
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    • 1997
  • The thin film that is electrically conductive and optically transparent is called conductive transparent thin film. ITO(Indium-Tin Oxide) which is a kind of conductive transparent thin film has been widely used in solar cell, transparent electrical heater, selective optical filter, FDP(Flat Display Panel) such as LCD (Liquid Crystal Display), PDP(Plasma Display Panel) and so on. Especially in PDP, ITO films is used as a transparent electrode in order to maintain discharge and decrease consumption power through the improvement of cell structure. In this study, we prepared ITO by reactive r.f. sputtering with indium-tin(Sn wt 10%) alloy target instead of indium-tin oxide target. The ITO films deposited at low temperature $150^{\circ}C$ and 8% $O_2$ partial pressure showed about $3.6{\Omega}/{\square}$. At the end of firing, the resistance of ITO was decreased, the optical transparence was improved above 90%.

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Modifications of ITO Surfaces in Organic EL Devices by $O_2$ Plasma Treatment (O$_2$ 플라즈마 처리에 의한 ITO 표면개질 변화에 따른 유기 EL 소자 특성)

  • 박상무;김형권;이덕출
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.52 no.6
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    • pp.261-266
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    • 2003
  • We investigated the effect of oxygen plasma treatment of indium-tin oxide(ITO) surface on the performance of electroluminescence(EL) devices. ITO surface treated oxygen plasma has been analyzed using atomic force microscope(AFM) and X-ray photoelectron spectroscopy(XPS), to investigate the relations between the properties of the ITO surface and the properties of the current-voltage-luminance(I-V-L) characteristics of the fabricated OLED with the structure of ITO(plasma treatment) / TPD / Alq$_3$/ Al. It is found that the oxygen plasma treatment of ITO anode improve the hole injection of the OLED due to the modification of the surface states. The treated ITO anode nay be low voltage with high luminance efficiency.