• Title/Summary/Keyword: IR lamp

Search Result 70, Processing Time 0.025 seconds

Design and Fabrication of an NIR Grism Si Optical Area Sensor Spectrometer with In-band Reference Wavelength (대역 내 기준 파장을 갖는 근적외선 그리즘 실리콘 광 면 센서 분광기 설계 및 제작)

  • Song, Jae-Won
    • Journal of Sensor Science and Technology
    • /
    • v.26 no.1
    • /
    • pp.28-34
    • /
    • 2017
  • An NIR grism Si optical area sensor spectrometer with in-band reference wavelength is designed and fabricated. It is composed of a transmission type diffraction grating (spatial density 300 line/mm), a rectangular N-BK7 prism (apex angle 30 degree), NIR filter(cutoff wavelength 720 nm), an imaging convex lens(focal length 50 mm F1.8) and an IR modified DSLR camera (Canon EOS40D) of Si optical area sensor ($3,888{\times}2,592$ pixels, pixel size $5.710{\mu}m$). "In-band reference wavelength function" is implemented using non-dispersive 0th diffraction order optical beam. The NIR grism spectrometer is tested in a laboratory using a halogen lamp and a Neon lamp. And the spectrometer is used in an astronomy field for obtaining the planet Jupiter NIR spectrum. In-band reference wavelength i.e. un-deviation wavelength is 846 nm, an wavelength resolution is 0.3027 nm/pixel, an wavelength resolving power is 2,794 and an wavelength range is 650~1,000 nm.

Analysis of Xe Plasma by LAS (레이저 흡수법을 이용한 제논 플라즈마 분석)

  • Yang, Jong-Kyung;Her, In-Sung;Lee, Jong-Chan;Choi, Yong-Sung;Park, Dae-Hee
    • Proceedings of the KIEE Conference
    • /
    • 2005.11a
    • /
    • pp.220-222
    • /
    • 2005
  • We can classify two cases in a way to observe an atom of gas state or a molecule using the laser. First case is way to use dispersion phenomenon like Rayleigh scattering, Thomson scattering, Mie scattering, Raman Scattering. And Second case is a way to use change phenomenon like a LAS (Laser Absorption Spectroscopy), LIF (Laser Induced Fluorescent). In this paper, we have measured the meta-stable density and the distribution by using a LAS method in Xe discharge lamp. The laser absorption spectroscopy (LAS) is useful to investigate the behavior of such species. The xenon atoms in the $1S_4$ and $1S_5$ generate excited $Xe^*$(147nm) and $Xe_{2}^*$(173nm) dimers in Xe plasma. It is found that the intensity of VUV 147nm emission is proportional to that of the IR 828nm emission, and the VUV 173nm emission is roughly proportional to that of the IR 823nm emission. The laser is used CW laser that consist of AlGaAs semiconductor and energy level is used 823.16nm wavelength. We measured signal of monochrometer from the lamp center while will change a discharge electric current by 6mA in 3mA and calculated meta-stable state density of a xenon atom through a measured value.

  • PDF

Implementation of Concentration Control System for Mixtures of Seaweed Using Photo Sensor (포토센서를 이용한 김 혼합물 농도 조절 시스템 구현)

  • Lee, Bae-Kyu;Choi, Jeong-Ho
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.24 no.4
    • /
    • pp.553-559
    • /
    • 2020
  • Seaweed(Laver), Korea's largest export product, is currently focused on mass production due to the market situation in Korea. This naturally led to a decrease in the quality of seaweed. Therefore, in this paper, the present method was produced and tested by changing the way of adjusting the ratio of seaweed mixing, which was dependent on the user's sense and experience in the production of seaweed. In addition, I developed an embedded measurement system that can determine the concentration of a mixture of gold in real time based on primary image information obtained through an IR LED lamp that generates a light source and a photo sensor that detects concentration. By collecting and storing precise data in real time, it is easier to cope with the previous year's data in a work environment that is repeated every winter.

The study of quantitative analysis for noxious gases of plastic materials by remote sensing open path FT-IR spectrometer (원격 측정용 개방 경로형 FT-IR spectrometer를 사용하여 플라스틱 재료의 유해 가스 정량 분석에 관한 연구)

  • Cho, Nam-Wook;Cho, Won-Bo;Kim, Hyo-Jin
    • Analytical Science and Technology
    • /
    • v.25 no.4
    • /
    • pp.230-235
    • /
    • 2012
  • It is to use many plastic materials as living essential goods. But when the fire is happened, owing to noxious gases, many men should be injured. Therefore as the noxious gases are measured by open path FT-IR spectrometer as remote monitoring, the demage of men could be minimized. Such this system consists of a Fourier transform spectrometer and infrared lamp fitted to long length. The study was to do the quantitative analysis on CO, $NO_2$, HCl, HF gas by remote monitoring open path FT-IR spectrometer. And the method of it should use MLR (multiple linearity regression) method. As result, It was confirmed to be more than 0.95 as $R^2$ of MLR. And then Urethane and PVC of plastic materials selected was burned, the concentration of polluted gases were measured by remote monitoring method.

Combination of Infrared Light Source and Barrier Filter for Suction Bruise Photography (음압에 의해 생성된 멍 촬영을 위한 적외선 광원과 필터 조합에 관한 연구)

  • Kim, Ju-Eun;Kim, Ji-Yeon;Jeon, So-Young;Kim, Eun-A;Yu, Je-Seol
    • The Journal of the Korea Contents Association
    • /
    • v.16 no.11
    • /
    • pp.693-698
    • /
    • 2016
  • Bruise caused by damages through physical compression and suction is one of evidences that can prove abuse or assault. It is essential for taking photography to prove a crime. Some studies about the Infrared (IR) light source have limitations that only one IR light source and one barrier filter were used. To find the best combination of filters and IR light sources, we produced suction bruise artificially and used three IR light sources and five barrier filters. Consequently, we found that the best combination is using a tungsten lamp and Kodak Wratten #18A barrier filter.

OES based PECVD Process Monitoring Accuracy Improvement by IR Background Signal Subtraction from Emission Signal (적외선 배경신호 처리를 통한 OES 기반 PECVD공정 모니터링 정확도 개선)

  • Lee, Jin Young;Seo, Seok Jun;Kim, Dae-Woong;Hur, Min;Lee, Jae-Ok;Kang, Woo Seok
    • Journal of the Semiconductor & Display Technology
    • /
    • v.18 no.1
    • /
    • pp.5-9
    • /
    • 2019
  • Optical emission spectroscopy is used to identify chemical species and monitor the changes of process results during the plasma process. However, plasma process monitoring or fault detection by using emission signal variation monitoring is vulnerable to background signal fluctuations. IR heaters are used in semiconductor manufacturing chambers where high temperature uniformity and fast response are required. During the process, the IR lamp output fluctuates to maintain a stable process temperature. This IR signal fluctuation reacts as a background signal fluctuation to the spectrometer. In this research, we evaluate the effect of infrared background signal fluctuation on plasma process monitoring and improve the plasma process monitoring accuracy by using simple infrared background signal subtraction method. The effect of infrared background signal fluctuation on plasma process monitoring was evaluated on $SiO_2$ PECVD process. Comparing the $SiO_2$ film thickness and the measured emission line intensity from the by-product molecules, the effect of infrared background signal on plasma process monitoring and the necessity of background signal subtraction method were confirmed.

Characterization of Soldering Property on Heating Condition by Infrared Lamp Soldering Process for C-Si Photovoltaic Modules (적외선 램프 가열방식을 이용한 태양전지 셀의 솔더링 공정 및 열처리 조건 별 특성 평가)

  • Son, Hyoun Jin;Lee, Jung Jin;Kim, Sung Hyun
    • Current Photovoltaic Research
    • /
    • v.4 no.2
    • /
    • pp.59-63
    • /
    • 2016
  • A key point of a soldering process for photovoltaic (PV) modules is to increase an adhesive strength leading a low resistivity between ribbon and cell. In this study, we intended to optimize a heating condition for the soldering process and characterize the soldered joint via physical and chemical analysis methods. For the purpose, the heating conditions were adjusted by IR lamp power, heating time and hot plate temperature for preheating a cell. Since then the peel test for the ribbon and cell was conducted, consequently the peel strength data shows that there is some optimum soldering condition. In here, we observed that the peel strength was modified by increasing the heating condition. Such a soldering property is affected by a various factors of which the soldered joint, flux and bus bar of the cell are changed on the heating condition. Therefore, we tried to reveal causes determining the soldering property through analyzing the soldered interface.

A Study on the Development of a pub level Silica Measuring Technology by the Split-beam Type System (스플리트빔 형태의 고정도 단위 실리카 측정기술 개발에 관한 연구)

  • 정경열;류길수
    • Journal of Advanced Marine Engineering and Technology
    • /
    • v.26 no.3
    • /
    • pp.382-388
    • /
    • 2002
  • Dissolved silica is one of fatal components at a boiler facility Therefore, a dissolved silica measurement system should be equipped for managing efficiently the boiler facility. Most of silica measurement systems are composed of a sensor module of single-beam type structure, and silica density is measured with a infrared spectrometry using the Lambert-beer method. However, such a system occurs measuring error of large range and inconsistency of a light source, because of measuring a standard sample and a measuring sample alternatively. This paper introduces a method that the sensor module has a split-beam type structure and a tungsten lamp. The proposed system can measure silica density quickly and precisely more than those composing of a single-beam type structure, because of measuring and comparing with two samples at a same time. And examination results are shown to compare efficiencies of the system and existing commercial products, and for an ammonia influence.

Development of Bonded Wafer Analysis System (본딩 웨이퍼 분석 시스템 개발)

  • Jang, Dong-Young;Ban, Chang-Woo;Lim, Young-Hwan;Hong, Suk-Ki
    • Transactions of the Korean Society of Mechanical Engineers A
    • /
    • v.33 no.9
    • /
    • pp.969-975
    • /
    • 2009
  • In this paper, bonded wafer analysis system is proposed using laser beam transmission; while the transmission model is derived by simulation. Since the failure of bonded wafer stems in void existence, transmittance deviations caused by the thickness of the void are analyzed and variations of the intensity through the void or defect easily have been recognized then the testing power has been increased. In addition, large screen display on laser study has been done which resulted in acquiring a feasible technique for analysis of the whole bonding surface. In this regard, three approaches are demonstrated in which Halogen lamp, IR lamp and laser have been tested and subsequently by results comparison the optimized technique using laser has been derived.

Failure analysis on the phenomenon of water condensing of automotive head lamp assembly (자동차용 head lamp의 수밀원인 분석)

  • Cho, Young-Jin;Jeon, Jong-Soo
    • Proceedings of the KSME Conference
    • /
    • 2008.11a
    • /
    • pp.1349-1354
    • /
    • 2008
  • In this study, we try to find the root cause of water condensing failures in a headlamp using chemical and mechanical analysis. Through the surface inspection by OM, SEM and CT, it was found that water infiltrate into the headlamp through hotmelt adhesive debonding part caused by adhesion force degradation and poor quality. IR spectra shows that adhesion force degradation are characterized by increase of some functional group(1742, 1710, 1649, 1016). Through the ESPI measurement, it is turned out that bonding structural change by thermal expansion and degradation of adhesive can be the cause of void generation. So it is recommended that cooling passage and the bonding part should be redesigned to give a guarantee of less thermal stress and high adhesion quality.

  • PDF