• Title/Summary/Keyword: IC Pakage

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Prediction of Crack Propagation Path Using Boundary Element Method in IC Packages (반도체 패키지의 경계요소법에 의한 균열진전경로의 예측)

  • Chung, Nam-Yong
    • Transactions of the Korean Society of Automotive Engineers
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    • v.16 no.3
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    • pp.15-22
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    • 2008
  • Applications of bonded dissimilar materials such as integrated circuit(IC) packages, ceramics/metal and resin/metal bonded joints, are very increasing in various industry fields. It is very important to analyze the thermal stress and stress singularity at interface edge in bonded joints of dissimilar materials. In order to investigate the IC package crack propagating from the edge of die pad and resin, the fracture parameters of bonded dissimilar materials and material properties are obtained. In this paper, the thermal stress and its singularity index for the IC package were analyzed using 2-dimensional elastic boundary element method(BEM). From these results, crack propagation direction and path by thermal stress in the IC package were numerically simulated with boundary element method.

Prediction of crack propagation path in IC package by BEM (경계요소법에 의한 반도체 패키지의 균열진전경로 예측)

  • Song, Chun-Ho;Chung, Nam-Yong
    • Proceedings of the KSME Conference
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    • 2001.06a
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    • pp.286-291
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    • 2001
  • Applications of bonded dissimilar materials such as IC package, ceramic/metal and resin/metal bonded joints, are very increasing in various industry fields. It is very important to analyze the thermal stress and stress singularity at interface edges in bonded joints of dissimilar materials. In orer to understand the package crack emanating from the edge of Die pad and Resin, fracture mechanics of bonded dissimilar materials and material properties are obtained. In this paper, the thermal stress and its singularity index for the IC package were analyzed using 2-dimensional elastic boundary element method. Crack propagation angle and path by thermal stress were numerically simulated with boundary element method.

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