• 한국초전도ㆍ저온공학회논문지
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• 제11권4호
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• pp.12-15
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• 2009

The $I_c$ degradation behavior of critical current in differently processed YBCO and SmBCO CC tapes with IBAD template has been investigated. It has been known that the residual strain in the CC tape will influence the shape of the $I_c$-strain window; $I_c$ may show a peak value if there exist a residual strain induced in the tape during manufacturing. The difference of residual strain may be resulted from the adopted different deposition techniques. In this study, bending test of CC tapes has been done using the Goldacker bending test rig which can produce both compressive and tensile bending strain continuously or alternately to the sample. For SmBCO CC tapes, in continuous compressive bending test, $I_c$ showed a minimal increase and did not degrade up to the largest strain that can be applied using the bending rig equivalent to 1.15% based on the sample thickness. However, in the case of alternate application of compressive and tensile bending strain, $I_c$ showed a larger degradation and a lower reversible limit when compared with the case of continuous application of the bending strain. When $I_c$ started to degrade significantly at the tension side, the reversibility ended, also at the compression side which is resulted from the permanent deformation like delamination or cracks that was induced due to tensile bending strain.

• Progress in Superconductivity
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• 제13권1호
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• pp.7-11
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• 2011

조성경사법을 이용하여 LMO/IBAD-MgO template 상에 EDDC 증착법을 이용하여 $Sm_{1+x}Ba_{2-x}Cu_{3+y}O_{7-d}$ 초전도 박막을 증착하였다. 테이프 형상의 기판상에 길이방향으로 $Sm_{1+x}Ba_{2-x}Cu_{3+y}O_{7-d}$ 박막의 조성비가 연속적으로 변하는 샘플을 얻을 수 있었고, 비접촉 Hallprobe를 이용하여 임계전류를 측정한 결과 조성비에 대응하는 연속적인 임계전류분포를 측정할 수 있었다. 본 조성비 영역 중 Sm:Ba:Cu = 1.01:1.99 :4.87의 조성비에서 최대의 임계전류를 보였다. 이 조성비에서 SmBCO 박막표면에 전체적으로 roof tile 형상의 결정립들이 관찰되었으며 국소적으로 2차상들이 관찰되었다. 조성 경사법을 이용하면 광범위한 조성비영역에서 신뢰도 높은 초전도특성, 결정배향성, 박막표면 형상 등을 조사할 수 있을 것으로 예상된다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2009년도 춘계학술대회 논문집
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• pp.1-2
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• 2009

The high critical current ($I_c$, A) of SmBCO coated conductor in a magnetic field, the high production rate and the high material yield are promising for applications. The inhomogeneity of Ie at the long length coated conduct is very important problem for electric application. So we researched the reason of inhomogeneity of $I_c$ at long length tape prepared by batch type co-evaporation system called by EDDC. The long length SmBCO coated conductors were developed on $LaMnO_3/IBAD-MgO/Y_2O_3/Al_2O_3$/Hastelloy C276 template. The distribution of $I_c$ are from 0 to 397 A/cm at 77 K and self field. We have studied the microstructures of these films by using SEM, EDS and X-ray diffraction. The XRD and composition by EDS results of SmBCO film reveals subtle difference. But, the microscopic observation by SEM show the microcrack at the sample with low $I_c$.

• 한국초전도ㆍ저온공학회논문지
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• 제16권2호
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• pp.1-6
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• 2014

The five-year national project in Japan for R&D of coated conductors and applications, named as the Materials and Power Applications of Coated Conductors (M-PACC) project, was finished at the end of FY2013. The project consists of four sub-themes as cable, transformer, SMES and coated conductors. In the theme of coated conductors, the fabrication process had been developed to satisfy the requirements from the applications such as in-field $I_c$ performance, low AC loss in the long tapes etc. Through the project, the remarkable progress was achieved as follows; a high in-field minimum $I_c$ value over 54A/cm-width under 3T at 77K was realized in a 200m long EuBCO tape with artificial pinning centers of $BaHfO_3$ by the pulsed laser deposition (PLD) technique on the IBAD template. On the other hand, the AC loss reduction was confirmed in the tapes fabricated by both PLD and the metal organic deposition (MOD) techniques by scribing 100m tapes into 10-filamments. Additionally, the mechanism of the delamination phenomenon was systematically investigated and the strength was improved by eliminating the origins of the weak points in the films. Through the development, all targeted goals were accomplished and the several results were appreciated as a world champion data.

• 한국초전도ㆍ저온공학회논문지
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• 제15권2호
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• pp.34-38
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• 2013

AC Losses for face to face stacks of four identical coated conductors (CCs) were numerically calculated using the H-formulation combined with the E-J power law and the Kim model. The motive sample was the face to face stack of four 2 mm-wide CC tapes with 2 ${\mu}m$ thick superconducting layer of which the critical current density, $J_c$, was $2.16{\times}10^6A/cm^2$ on IBAD-MgO template, which was suggested for the mitigation of ac loss as a round shaped wire by Korea Electrotechnology Research Institute. For the calculation the cross section of the stack was simply modeled as vertically aligned 4 rectangles of superconducting (SC) layers with $E=E_o(J(x,y,t)/J_c(B))^n$ in x-y plane where $E_o$ was $10^{-6}$ V/cm, $J_c$(B) was the field dependence of current density and n was 21. The field dependence of the critical current of the sample measured in four-probe method was employed for $J_c$(B) in the equation. The model was implemented in the finite element method program by commercial software. The ac loss properties for the stacks were compared with those of single 4 cm-wide SC layers with the same critical current density or the same critical current. The constraint for the simulation was imposed in two different ways that the total current of the stack obtained by integrating J(x,y,t) over the cross sections was the same as that of the applied transport current: one is that one fourth of the external current was enforced to flow through each SC. In this case, the ac loss values for the stacks were lower than those of single wide SC layer. This mitigation of the loss is attributed to the reduction of the normal component of the magnetic field near the SC layers due to the strong expulsion of the magnetic field by the enforced transport current. On the contrary, for the other case of no such enforcement, the ac loss values were greater than those of single 4cm-wide SC layer and. In this case, the phase difference of the current flowing through the inner and the outer SC layers of the stack was observed as the transport current was increased, which was a cause of the abrupt increase of ac loss for higher transport current.