• 대한안전경영과학회:학술대회논문집
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• 대한안전경영과학회 2004년도 추계학술대회
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• pp.229-235
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• 2004

This paper treats accelerated life tests for automotive connector. The contact resistance of connector is explained by some factors; the use time(calender time, real cycle), stresses and loads adapted in auto test. The relationships between contact resistance and some factors are compared and analyzed by regression models in various test conditions; field use-environment, manufacturer's test environment, and accelerated test condition. The consistency between of manufacturer's test and field test is examined. Finally, the future study on accelerated test for automotive connector is presented.

• 대한기계학회논문집A
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• 제38권11호
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• pp.1221-1229
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• 2014

본 논문은 가속시험법을 이용하여 추진축의 피로 수명을 예측하는 것이다. 가속시험방법으로는 교정가속시험법을 적용하였으며, 이 시험법은 시험시료 수량이 적을 경우에 시험시간 단축과 신뢰성을 높이는 매우 효과적인 방법이다. 두 수준의 고부하 스트레스 수준에서 피로시험을 수행하고, 외삽법과 가용한 시험시간을 고려하여 저부하 스트레스 시험 수준을 결정하여 피로시험을 수행하였다. 본 논문에서는 가속지수와 형상모수 등의 신뢰성 파라미터를 시험을 수행하여 획득하였고, 실제 사용 환경의 로드 스펙트럼을 분석하고 시험 결과와 비교하여 추진축의 수명을 예측할 수 있었다.

• 대한안전경영과학회:학술대회논문집
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• 대한안전경영과학회 2011년도 춘계학술대회
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• pp.419-432
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• 2011

제품의 신뢰성에 대한 소비자의 인식이 높아짐에 따라 기업에서는 높은 품질과 신뢰성 있는 제품을 만들기 위해 많은 노력을 하고 있다. 신뢰성은 기기, 부품, 재료 등 시스템이 규정된 조건하에서, 의도하는 기간 동안 규정된 기능을 고장 없이 수행할 수 있는 성질로 규정된다. 높은 신뢰성의 확보를 위한 제품의 신뢰성 시험은 많은 시간과 비용이 소모되기 때문에 현대의 빠른 시장 흐름에 따라가지 못한다. 특히, 최근 기술발전 속도가 빨라지고 제품 수명주기(Life Cycle)와 개발 기간이 짧아지고 있는 추세에 있으므로 이에 대응할 수 있는 신속한 시험방법의 실시가 반드시 필요한 시점이다. 위와 같은 신뢰성을 갖는 제품의 시험의 한계를 극복하고 시험시간을 단축하기 위한 여러 가지 방법이 연구되어 왔고, 그 중 가속 시험(Accelerated Test)에 대한 필요성과 요구가 계속 증가하고 있는 추세다. 본 연구에서는 단순부품과 재료의 신뢰도 정보를 신속하게 얻는데 매우 유용한 신뢰성 시험방법 중에 하나인 가속시험의 연구동향과 적용 현황을 분석하고 이의 효과적인 적용과 활용방안을 모색 하고자 한다.

• 한국컴퓨터정보학회논문지
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• 제23권11호
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• pp.67-74
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• 2018

The verification for the design limit margin of the power device for the information communication and surveillance systems using HALT(Highly Accelerated Life Test) reliability test is described. The HALT reliability test performs with a step stress method which change condition until the marginal step in a design and development phase. The HALT test methods are the low temperature(cold) step stress test, the high temperature(hot) step stress test, the thermal shock cyclic stess test, and the high temperature destruct limit(hot DL) step stress test. The power device is checked the operating performance during the test. In this paper, the HALT was performed to find out the design limit margin of the power device.

• 품질경영학회지
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• 제25권2호
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• pp.15-27
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• 1997

This paper describes a highly accelerated life test (HALT, USPCBT) method for rapid qualification testing of STH PWB(Silver Through Hole Printed Wiring Boards). This method was carried out to be an alternative to the present time-consuming standard 1344 hours life testing(THB). The accelerated life test conditions were $121^{\circ}C$/95%R.H. at 50V bias and without bias. Their results are compared with those observed in the standard 1344 hours life test at $40^{\circ}C$/95%R.H. at 50V bias and without bias. The studies were focused on the samples time-to-failure as well as the associated conduction and failure mechanisms. The abrupt drop of insulation resistance is due to the absorption of water vapour. And the continuous drop of insulation resistance is due to the Ag migration. The ratios of time-to-failure of HALT(USPCBT) to THB were 25 and 11 at 50V bias and without bias respectively.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2004년도 추계학술대회
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• pp.184-189
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• 2004

Shot peening process is used as one of the various kinds of techniques to improve the fatigue properties. However, to obtain fatigue properties of metal materials, many efforts and time are needed. Because the fatigue life of shot peened metals increases highly. In this paper, fatigue properties of shot peened Al 7075-T6 are estimated using the fundamental of accelerated life test to reduce the experimental. Experimental results show that the estimated life data almost agree with actual rotary bending fatigue test data within 7% error.

• 전력전자학회지
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• 제20권5호
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• pp.47-53
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• 2015

• 한국신뢰성학회지:신뢰성응용연구
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• 제17권4호
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• pp.355-361
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• 2017

Purpose: The purpose of this research is to establish the life test method for ceramic heater and identify the failure mechanisms. Methods: We do accelerated life test in the condition of thermal shock and failure analysis for failed samples. Conclusion: The main failure mechanisms of ceramic heater are identified as overstress failure mechanisms as results of failure analysis and the shape parameters of weibull distribution by accelerated life test are identified as 0.8, 1.2 and 0.4 each at $400^{\circ}C$, $600^{\circ}C$ and $900^{\circ}C$. At $900^{\circ}C$, the shape parameter 0.4 means that It is exactly initial failure caused that the stress exceeds the strength of ceramic heater highly and the shape parameters 0.8, 1.2 at $400^{\circ}C$, $600^{\circ}C$ means that the shape parameters are around 1.0 so that the main failure mechanism is overstress failure which is same result as failure analysis. It means that the appropriate life test method for ceramic heater is reliability qualification test method rather than accelerated life test.

• 한국신뢰성학회:학술대회논문집
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• 한국신뢰성학회 2011년도 춘계학술발표대회 논문집
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• pp.55-60
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• 2011

Recently, the application of electronics in vehicle is increasing, in order to assess the reliability of the electronics, highly accelerated life test is used, highly accelerated life test can assess the reliability of the electronics in the short time. In this study, optimized HALT technique can be applied to the electronics is proposed. The main results are as follows; i) HALT is proceed to the 8-step process. ii) The test mode of HALT is composed of the cold step stress, hot step stress, vibration step stress and combined environments stress. iii) The time dwell is set to at least 20 minutes.

• Transactions on Electrical and Electronic Materials
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• 제10권1호
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• pp.5-8
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• 2009

The reliability of multilayer ceramic capacitor with active thin dielectric layer was investigated by highly accelerated life test at various stress condition. The distribution of multilayer ceramic capacitor failure times is plotted as a function of time from Weibull distribution function. According to the test result, voltage acceleration factor is obtained from 2.24 to 2.96. The acceleration by temperature is much higher than other values of active thick dielectric layer. It is clear that median time to failure is affected by the stress voltage for high volumetric efficiency ceramic capacitors with active thin dielectric layer. The degradation under stress of voltage involves electromigration and accumulation of oxygen vacancy at Ni electrode interface of cathode.