• 제목/요약/키워드: Highly Accelerated Life Test(HALT)

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Verification for the design limit margin of the power device using the HALT reliability test

  • Chang, YuShin
    • 한국컴퓨터정보학회논문지
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    • 제23권11호
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    • pp.67-74
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    • 2018
  • The verification for the design limit margin of the power device for the information communication and surveillance systems using HALT(Highly Accelerated Life Test) reliability test is described. The HALT reliability test performs with a step stress method which change condition until the marginal step in a design and development phase. The HALT test methods are the low temperature(cold) step stress test, the high temperature(hot) step stress test, the thermal shock cyclic stess test, and the high temperature destruct limit(hot DL) step stress test. The power device is checked the operating performance during the test. In this paper, the HALT was performed to find out the design limit margin of the power device.

전장품의 신뢰성 향상을 위한 HALT기법 연구

  • 이희복;위신환;박동규
    • 한국신뢰성학회:학술대회논문집
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    • 한국신뢰성학회 2011년도 춘계학술발표대회 논문집
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    • pp.55-60
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    • 2011
  • Recently, the application of electronics in vehicle is increasing, in order to assess the reliability of the electronics, highly accelerated life test is used, highly accelerated life test can assess the reliability of the electronics in the short time. In this study, optimized HALT technique can be applied to the electronics is proposed. The main results are as follows; i) HALT is proceed to the 8-step process. ii) The test mode of HALT is composed of the cold step stress, hot step stress, vibration step stress and combined environments stress. iii) The time dwell is set to at least 20 minutes.

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가속수명시험을 이용한 은도통홀 인쇄회로기판의 신뢰성연구 (Accelerated Life Test and Data Analysis of the Silver Through Hole Printed Wiring Board)

  • 전영호;권이장
    • 품질경영학회지
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    • 제25권2호
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    • pp.15-27
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    • 1997
  • This paper describes a highly accelerated life test (HALT, USPCBT) method for rapid qualification testing of STH PWB(Silver Through Hole Printed Wiring Boards). This method was carried out to be an alternative to the present time-consuming standard 1344 hours life testing(THB). The accelerated life test conditions were $121^{\circ}C$/95%R.H. at 50V bias and without bias. Their results are compared with those observed in the standard 1344 hours life test at $40^{\circ}C$/95%R.H. at 50V bias and without bias. The studies were focused on the samples time-to-failure as well as the associated conduction and failure mechanisms. The abrupt drop of insulation resistance is due to the absorption of water vapour. And the continuous drop of insulation resistance is due to the Ag migration. The ratios of time-to-failure of HALT(USPCBT) to THB were 25 and 11 at 50V bias and without bias respectively.

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HALT 시험을 통한 HASS 시험의 설계 ("HALT" Test with "HASS" Test of the Design)

  • 유성규;조재립;강보철
    • 대한안전경영과학회:학술대회논문집
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    • 대한안전경영과학회 2009년도 춘계학술대회
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    • pp.489-499
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    • 2009
  • Through the process of HALT (Highly Accelerated Life Test) between 2003 to 2008, we are about to research on the design method for minimum test for all error modes that are classified and analyzed to obtain more margin able product.

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HALT 기술을 이용한 Note PC main board의 NDF성 고장 검토 사례 (The analysis on the NDF(No Defect Found) of Note PC main board using HALT)

  • 강상구;김재이
    • 한국신뢰성학회:학술대회논문집
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    • 한국신뢰성학회 2001년도 정기학술대회
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    • pp.397-403
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    • 2001
  • 본 논문은 시장 사용 조건에서 발생한 PC제품의 Main board 고장품이 회수 후 검토 시 정상적으로 기능하여 나타나는 NDF(No Defect Found) 판정 상황에 대한 효과적인 검토 방안을 제시한다. NDF 시료의 고장성 진위 여부를 가리기 위해 HALT(Highly Accelerated Life Test)기술을 응용한 결과 기존의 시험 검토 방법보다 높은 재현 효과를 보았다. 결함 제품의 잠재적인 취약부위를 단시간에 효과적으로 촉진하고 들춰내는 HALT 기술은 전자 제품의 NDF성 고장을 기술적으로 접근하여 개선할 수 있는 기초를 제공하는 유용한 가속 스트레스 시험 기술임이 입증되었다.

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HALT & HASS의 활용 (The utilize of HALT & HASS)

  • 유성규;김철희;조재립
    • 한국품질경영학회:학술대회논문집
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    • 한국품질경영학회 2010년도 춘계학술대회
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    • pp.274-280
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    • 2010
  • Through the process of HALT (Highly Accelerated Life Test) between 2003 to 2008, we are about to research on the design method for minimum test for all error modes that are classified and analyzed to obtain more margin able product.

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자동차 흡기유동제어밸브의 초가속수명시험 및 수명시험을 위한 신뢰성연구 (A Study on the HALT & Life time Test of the Swirl Control Actuator)

  • 김성옥;박상욱;이진식
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제14권1호
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    • pp.59-70
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    • 2014
  • The requirements of reliability verification for new products and technology are increasing more and more in accordance with the trend of climate change prevention and GHG reduction technology, functional skills. SCA(Swirl Control Actuator) is the important part of a car intake manifold system. This device generates swirl that is mixing the fuel and air into the engine combustion chamber. This is to improve output for engine and reduce the emission for exhaust. In this article reliability assessment criteria for swirl control actuator for automobiles are established in terms of basic HALT and life time test.

영상 제품 PBA Level에서의 HALT 적용 사례

  • 박상득;최완수;강상구;심진원
    • 한국신뢰성학회:학술대회논문집
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    • 한국신뢰성학회 2000년도 춘계학술대회 발표논문집
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    • pp.81-87
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    • 2000
  • 최근 신뢰성 가속 시험 분야에서 제품의 잠재 또는 취약 부위를 단기간에 효과적으로 검출할 수 있도록 개발된 HALT(Highly Accelerated Life Test) 기술을 당사에서 생산 중인 영상제품에 적용하였다. 적용 결과 HALT는 기존의 보증용 가속 시험에서 추구하는 고장 데이터의 통계적인 수명 예측이나 고장률 추정의 절차를 따르지 않고도 한계 스트레스 시험을 이용하여 제품의 잠재적인 취약부위를 단시간에 효과적으로 촉진하고 들춰 내어 전자 제품에 적용할 수 있는 유용한 가속 스트레스 시험 기술임이 입증되었다.

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개발부품의 설계취약점 분석을 위한 신뢰성 연구 (A Reliability Study on the Weak Point Analysis of the Development Parts)

  • 김성옥;박상욱;이상헌
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제13권1호
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    • pp.19-30
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    • 2013
  • The requirements of reliability verification for new products and technology are increasing more and more in accordance with the trend change of strength for safety technology, functional skills and emotional quality. In order to conduct the purpose of robust design from the stage of product development recently, the application of reliability technology has gradually increased such as detecting the failure mode throughout the HALT technique, accelerated tests and so on. The main results are as follows; i) through the pre-test and analysis, detected the basic performance and predictable failure mode, ii) HALT technique and process has been developed that can be applied test methods for the next new products.