• Title/Summary/Keyword: High-energy e-beam

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Change in Water Contact Angle of Carbon Contaminated TiO2 Surfaces by High-energy Electron Beam

  • Kim, Kwang-Dae;Tai, Wei Sheng;Kim, Young-Dok;Cho, Sang-Jin;Bae, In-Seob;Boo, Jin-Hyo;Lee, Byung-Cheol;Yang, Ki-Ho;Pack, Ok-Kyung
    • Bulletin of the Korean Chemical Society
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    • v.30 no.5
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    • pp.1067-1070
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    • 2009
  • We studied change in water contact angle on $TiO_2$ surfaces upon high-energy electron-beam treatment. Depending on conditions of e-beam exposures, surface OH-content could be increased or decreased. In contrast, water contact angle continuously decreased with increasing e-beam exposure and energy, i.e. change in the water contact angle cannot be rationalized in terms of the overall change in the surfacestructure of carbon-contaminated $TiO_2$. In the C 1s spectra, we found that the C-O and C=O contents gradually increased with increasing e-beam energy, suggesting that the change in the surface structure of carbon layers can be important for understanding of the wettability change. Our results imply that the degree of oxidation of carbon impurity layers on oxide surfaces should be considered, in order to fully understand the change in the oxide surface wettability.

Effect of high-energy neutron source on predicting the proton beam current in the ADS design

  • Zheng, Youqi;Li, Xunzhao;Wu, Hongchun
    • Nuclear Engineering and Technology
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    • v.49 no.8
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    • pp.1600-1609
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    • 2017
  • The accelerator-driven subcritical system (ADS) is driven by a neutron source from spallation reactions introduced by the injected proton beam. Part of the neutron source has energy as high as a few hundred MeV to a few GeV. The effects of high-energy source neutrons ($E_n$ > 20 MeV) are usually approximated by energy cut-off treatment in practical core calculations, which can overestimate the predicted proton beam current in the ADS design. This article intends to quantize this effect and propose a way to solve this problem. To evaluate the effects of high-energy neutrons in the subcritical core, two models are established aiming to cover the features of current experimental facilities and industrial-scale ADS in the future. The results show that high-energy neutrons with $E_n$ > 20 MeV are of small fraction (2.6%) in the neutron source, but their contribution to the source efficiency is about 23% for the large scale ADS. Based on this, a neutron source efficiency correction factor is proposed. Tests show that the new correction method works well in the ADS calculation. This method can effectively improve the accuracy of the prediction of the proton beam current.

Effect of Electron Beam Currents on Stabilization of Polyacrlonitrile Precursor Fiber (PAN 전구체 섬유의 안정화시 전자선 전류의 영향)

  • Shin, Hye Kyoung;Jeun, Joon Pyo;Kim, Hyun bin;Kang, Phil Hyun
    • Journal of Radiation Industry
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    • v.5 no.1
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    • pp.41-46
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    • 2011
  • Polyacrylonitrile (PAN) fibers are the most widely used precursor of the materials for carbon fibers. The conventional process of carbon fibers from PAN precursor fiber includes two step; stabilization at low temperature and carbonization at high temperature. Compared to thermal stabilization, the stabilization process by electron beam (E-beam) irradiation is a advanced and brief method. However, a stabilization by E-beam irradiation was required a high dose (over 5,000 kGy) and spend over 1.5 hr (1.14 MeV, 1 mA). In the present work the main goal is exploring a quick stabilization process by cotrolling E-beam currents. The effect of various E-beam currents on stabilization of PAN precursor fiber was studied by gel fraction test, thermo gravimertic analysis (TGA), differential scanning calorimetry (DSC), tensile strength, and scanning electron microscopy (SEM) images.

A Simulator for High Energy E-beam Lithography for Nano-Patterning (나노패터닝을 위한 고에너지 전자빔 리소그래피 시뮬레이터 개발 및 검증)

  • Kim Jinkwang;Kim Hak;Han Chanho;Chun Kukjin
    • Proceedings of the IEEK Conference
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    • 2004.06b
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    • pp.359-362
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    • 2004
  • Electron beam on high energy acceleration, which travels deeply and sharply through photoresist, became to be used in e-beam lithography apparatus for nano-patterning in due to its high resolution. An advanced electron beam lithography simulation tool is currently undergoing development for nano-patterning. This paper will demonstrate such simulation efforts with experiments at 200 keV e-beam lithography processes on PMMA, ZEP520 of which photoresist parameters and characteristics will be explained with simulation results. Neureuther parameters was extracted from the contrast curve of the resist

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Multiple Electron Beam Lithography for High Throughput (생산성 향상을 위한 멀티빔 리소그라피)

  • Choi, Sang-Kook;Yi, Cheon-Hee
    • Korean Journal of Optics and Photonics
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    • v.16 no.3
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    • pp.235-238
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    • 2005
  • A Multiple electron beam lithography system with arrayed microcolumns has been developed for high throughput applications. The small size of the microcolumn opens the possibility for arrayed operation on a scale commensurate. The arrayed microcolumns based on of Single Column Module (SCM) concept has been fabricated and successfully demonstrated. Low energy microcolumn lithography has been operated in the energy range from 250 eV to 300 eV for the generation of nano patterns. Probe beam current at the sample was measured about >1 nA at a total beam current of $0.5\;{\mu}A$ and a working distance of $\~1\;mm$. The magnitude of probe beam current is strong enough for the low energy lithography. The thin layers of PMMA resist have been employed. The results of nano-patterning by low energy microcolumn lithography will be discussed.

Investigation of Wetting Characteristics of Polymer Surfaces according to Electron Beam Irradiation (고분자 표면의 전자빔 조사에 따른 젖음특성 고찰)

  • Lee, Hyun Joong;Park, Keun;Kim, Byung Nam
    • Journal of the Korean Society for Precision Engineering
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    • v.33 no.1
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    • pp.45-51
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    • 2016
  • The present study uses an electron beam (e-beam) to modify the wetting characteristics of thermoplastic polymer surfaces. A high energy e-beam irradiated various polymer surfaces (PET, PMMA, and PC), with variations in irradiation time and applied current. The water contact angles were measured on the e-beam irradiated surfaces in order to investigate the changes in the surface energy and the relevant wettability. Furthermore, XPS analyses were performed to investigate the chemical composition change in the e-beam irradiated surfaces; the results showed that the hydrophilic groups (C-O) increased after the electron beam irradiation. Also, water collection tests were performed for various polymer samples in order to investigate the effect of the surface energy on the ability of water collection, from which it can be seen that the irradiated surfaces revealed better water-collecting capability than pure polymer surfaces.

Measurement of Defect Energy Level in MgO Layer

  • Son, Chang-Gil;Song, K.B.;Jeoung, S.J.;Park, E.Y.;Kim, J.S.;Choi, E.H.;J, S.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08b
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    • pp.1380-1383
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    • 2007
  • The secondary electron emission coefficient (${\gamma}$) of the cathode is an important factor for improving the discharge characteristics of AC-PDP, because of its close relationship to discharge voltage. In this experiment, we have investigated the electronic structure of the energy band in the MgO layer responsible for the high ${\gamma}$. We used three kinds of MgO pellet that have another component, and each MgO layers have been deposited by electron beam evaporation method. The work-functions of MgO layer have been investigated from their ion-induced secondary electron emission coefficient (${\gamma}$), respectively, using various ions with different ionization energies in a ${\gamma}-FIB$ (Focused Ion Beam) system. We have compared work-function with ${\gamma}-FIB$ system current signal for measurement defect energy level in MgO layer. MgO-A in the three types has lowest work-function value (4.12eV) and there are two defect energy levels.

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Decay Process of Charge Distribution in E-Beam Irradiated Polymers (E-빔 조사된 폴리머의 전하 분포의 축퇴 과정)

  • Yun, Ju-Ho;Choi, Yong-Sung;Lee, Kyung-Sup
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.11a
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    • pp.329-330
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    • 2007
  • Decay processes of accumulated charge in e-beam irradiated polymers during elevating temperature are observed using pulsed electro-acoustic measurement system. Since the polymeric materials have many superior properties such as light-weight, good mechanical strength, high flexibility and low cost, they are inevitable materials for spacecrafts. In space environment, however, the polymers sometimes have serious damage by irradiation of high energy charged particles. When the polymers of the spacecraft are irradiated by high energy charged particles, some of injected charges accumulate and remain for long time in the bulk of the polymers. Since the bulk charges sometimes cause the degradation or breakdown of the materials, the investigation of the charging and the decay processes in polymeric materials under change of temperature is important to decide an adequate material for the spacecrafts. By measuring the charge behavior in e-beam irradiated polymer, such as polyimide or polystyrene, it is found that the various accumulation and decay patterns are observed in each material. The results seem to be useful and be helpful to progress in the reliability of the polymers for the spacecraft.

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A Study on the Optical Transmittance of High-energy Electron-beam Irradiated IGZO Thin Films (고 에너지 전자빔 조사된 IGZO 박막의 광 투과도에 대한 연구)

  • Yun, Eui-Jung
    • Journal of the Institute of Electronics and Information Engineers
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    • v.51 no.6
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    • pp.71-77
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    • 2014
  • In this paper, we investigated the effects of high-energy electron beam irradiation (HEEBI) on the optical transmittance of InGaZnO (IGZO) films grown on transparent Corning glass substrates, with a radio frequency magnetron sputtering technique. The IGZO thin films deposited at low temperature were treated with HEEBI in air at room temperature (RT) with an electron beam energy of 0.8 MeV and doses of $1{\times}10^{14}-1{\times}10^{16}electrons/cm^2$. The optical transmittance of the IGZO films was measured using an ultraviolet visible near-infrared spectrophotometer (UVVIS). The detailed estimation process for separating the transmittance of HEEBI-treated IGZO films from the total transmittance of IGZO films on transparent substrates treated with HEEBI is given in this paper. Based on the experimental results, we concluded that HEEBI with an appropriate dose of $10^{14}electrons/cm^2$ causes a maximum increase in the transparency of IGZO thin films. We also concluded that HEEBI treatment with an appropriate dose shifted the optical band gap ($E_g$) toward the lower energy region from 3.38 to 3.31 eV. This $E_g$ shift suggested that HEEBI in air at RT with an appropriate dose acts like a thermal annealing treatment in vacuum at high temperature.