• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1995.11a
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• pp.126-130
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• 1995

$CdS_{1-x}Te_{1-x}$ polycrystalline thin films were fabricated from CdS and CdTe powder by co-evaporation method at $10^{-6}$ Torr. The Optimum evaporation condition was substrate temperature $T_{s}$=$150^{\circ}C$, evaporation time t=30 min. XRD spectrums indicated that the crystal structure chanced from zinc blonde (x$\leq$0.22) to wurtzite (x$\geq$0.96) through mixed structure (0.22$\leq$0.74) as composition value x increase to CdS. Conductive type was n-type by hot point probe method. van der Pauw method was not applicable for x<0,5 due to high hall voltages, Electrical resistivity and Hall carrier mobility were decreased as x increase, while Hall carrier concentration was increased. The optical bandgap of $CdS_{1-x}Te_{1-x}$ polycrystalline thin films measure d at R.T. had quardratic form and the bowing parameter was fitted as 1.98eV for theoretical value of 2.0eV. I-V characteristics of In/CdTe/$CdS_{x}Te_{1-x}$Au Schottky diodes showed that CdS-rich one had better forward characteristics than CdTe-rich one.

• 한국초전도학회:학술대회논문집
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• 2009.07a
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• pp.77-77
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• 2009

• Progress in Superconductivity and Cryogenics
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• v.15 no.1
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• pp.1-5
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• 2013

We transformed the shape of a YBCO sample with striation to reduce hysteresis and ac losses. And we chose several points to analyze in detail and visualized superconducting properties like critical transition temperature, distribution of the magnetic field, distribution of the current density and hysteresis in a non-destructive manner based on Low Temperature Scanning Laser Hall Probe Microscopy (LTSLHPM) to examine the homogeneity of the sample.

• Progress in Superconductivity
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• v.10 no.2
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• pp.92-98
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• 2009

The magnetic field profiles near the surface of a $Sm_1Ba_2Cu_3O_{7-\delta}$ coated conductor(CC-tape) under magnetic field and current that were applied simultaneously with phase differences ${\phi}s$ were measured using scanning Hall probe method. Measurements were carried out along the elliptic load lines with $\phi=90^{\circ}\;and\;45^{\circ}$ for some $B_{peak},\;I_{peak}$ values. From the measured field profiles, sheet current density J(x, $B_a,\;I_a$) and magnetic flux density $B_0(x,\;B_a,\;I_a)$ profiles in the CC-tape were calculated. Using these J(x, $B_a,\;I_a$) and $B_0(x,\;B_a,\;I_a)$ profiles, we estimated the hysteresis energy loss Q in the CC-tape. The estimated Qs, together with our previous results for $\phi=0^{\circ}$ from [9], were compared with theoretical values based on Brandt's calculation.

• Progress in Superconductivity and Cryogenics
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• v.17 no.2
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• pp.25-30
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• 2015

In order to realize economical applications, it is important to reduce the ac loss of 2G high-temperature superconductor coated conductors. It seems to be reasonable that a multi-filamentary wire can decrease the magnetization loss. In this study, we prepared two samples of YBCO coated conductors with striations. We measured local superconducting properties of both samples by using Low Temperature Scanning Laser and Hall Probe Microscopy (LTSLHPM). The distribution of the local critical temperature of samples was analyzed from experimental results of Low Temperature Scanning Laser Microscopy (LTSLM) near the superconducting transition temperature. According to LTSLM results, spatial distributions of the local critical temperature of both samples are homogeneous. The local current density and the local magnetization in samples were explored from measuring stray fields by using Scanning Hall Probe Microscopy (SHPM). From SHPM results, the remanent field pattern of the one bridge sample in an external magnetic field confirms the Bean's critical state model and the three bridge sample has similar remanent field pattern of the one bridge sample. The local magnetization curve in the three bridge sample was measured from external fields from -500 Oe to 500 Oe. We visualized that the distribution of local hysteresis loss are related in the distribution of the remanent field of the three bridge sample. Although the field dependence of the critical current density must be taken into account, the relation of the local hysteresis loss and the remanent field from Bean's model was useful.

• Proceedings of the Korean Vacuum Society Conference
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• 1999.07a
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• pp.184-184
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• 1999

반도체소자의 고집적, 미세화에 따라 MOSFET 소자에서의 고농도, 미세접합이 요구되고 있다. 이러한 고농도, 미세접합을 형성하기 위하여 기존의 저에너지 이온주입법을 대체 또는 병행할 목적으로 플라즈마 이온주입방법이 활발히 연구되고 있다. 본 연구에서는 플라즈마 이온주입방법을 이용하여 (100) 실리콘 기판에 보론을 주입후 열처리하여 형성된 p+층의 도펀트의 활성화와 이온주입으로 인한 실리콘 기판의 손상을 고찰하였다. 본 실험에서 (100)실리콘 기판에 도핑할 소스 가스로 BF3을 주입하고, D.C. pulse 플라즈마 도핑시스템을 사용하여 플라즈마 내의 보론이온을 웨이퍼 홀더에 -1~-5kV의 인가된 음전압에 의해 가속시키어 실리콘 웨이퍼에 주입하였다. 주입에너지 -1kV, -3kV, -5kV와 1$\times$1015, 3$\times$1515의 dose로 주입된 실리콘 기판을 급속가열방식(RTP)을 사용하여 $600^{\circ}C$~110$0^{\circ}C$의 온도구간에서 10초와 30초로 열처리하여 도펀트의 활성화와 미세접합을 형성한 후 SIMS, four-point probe, Hall 측정, 그리고 FT-IR을 이용하여 플라즈마 이온주입된 도펀트의 거동과 활성화율을 관찰하였고 FT-IR과 TEM의 분석을 통하여 이온주입으로 인한 실리콘 기판의 손상을 고찰하였다. SIMS, four-point probe, Hall 측정, 그리고 FT-IR의 분석으로 열처리 온도의 증가에 따라 도펀트의 활성화율이 증가하였고, 이온주입 에너지와 dose 그리고 열처리 시간의 증가에 따라서 주입된 도펀트의 활성화는 증가하였다. 그리고 주입에너지와 dose 그리고 열처리 시간의 증가에 따라서 주입된 도펀트의 활성화는 증가하였다. 그리고 주입에너지와 dose를 증가시키면 접합깊이가 증가함을 관찰하였다. 이온주입으로 인한 기판손상의 분석을 광학적 방법인 FT-IR과 미세구조를 분석할 수 있는 TEM을 이용하여 분석하였다. 이온주입으로 인한 dislocation이나 EOR(End Of Range)과 같은 extended defect가 없었고, 이온주입으로 인한 비정질층도 없는 p+층을 얻을수 있었다.

• Proceedings of the Materials Research Society of Korea Conference
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• 2003.03a
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• pp.100-100
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• 2003

본 연구에서는 Si에 Mn을 첨가한 Si$_{l-x}$Mn$_{x}$ 박막의 전기적 및 자기적 특성을 조사하였다. Si$_{l-x}$Mn$_{x}$ 박막은 MBE(Molecular Beam Epitaxy)를 이용하여 native oxide층을 제거하지 않은 (100)Si wafer 위에 성장하였다. Substrate 온도는 50$0^{\circ}C$로 하였으며, 첨가한 Mn 농도는 20%에서부터 80%까지였다. 전기적 특성은 Hall, 4-point probe를 통하여 측정하였고, 자기적 특성은 VSM, FMR, SQUID을 이용하여 측정하였다. 상 분석은 XRD, TEM을 이용하여 관찰하였다 Si$_{l-x}$Mn$_{x}$ 박막은 Hall 측정 결과 상온에서 P-type carrier를 가지며, 비저항은 반도체 영역인 7.6$\times$$10^{-4}$~4.2$\times$$10^{-2}$(ohm-cm)의 값을 가진다. 상온 VSM, 측정결과 Mn의 양이 52% 첨가 시 포화 자화 값이 가장 높은 40emu/cc를 가지며, Mn의 양이 증가할수록 포화 자화 값이 증가하다 다시 감소하는 경향을 가진다. FMR, SQUID 측정에서도 이러한 경향을 확인할 수 있었다 특히, SQUID 분석 결과 두 개 이상의 자성 상이 존재하는 것을 관찰할 수 있었다. XRD, TEM 관찰결과, Si$_{l-x}$Mn$_{x}$은 poly crystal로 성장하였으며, Mn 농도에 따라 여러 상들이 관찰되었다.따라 여러 상들이 관찰되었다.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2001.05a
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• pp.303-306
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• 2001

Using THz time-domain spectroscopy (THz-TDS), the power absorption and the real conductivity of silica sand are measured terahertz frequency range. It is impossible to measure the characterization of the silica sand by simple electrical measurements using mechanical contacts, e.g., Hail effect or four-point probe measurements. However, the THz-TDS technique can measure not only electrical but also optical characterization of the sample. Also this technique can measure frequency dependent results. Especially, the real conductivity was increased according to THz frequency this is unusual material compare with metal and semiconductor materials; the measured real conductivity are not followed by the simple Drude theory.

• Progress in Superconductivity
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• v.14 no.1
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• pp.1-10
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• 2012

We fabricated a closed coils by using resistive-joint method and the joint resistance of the coils were estimated by field decay technique in liquid nitrogen. We used the Runge-kutta method for the numerical analysis to calculate the decay properties. The closed coil was wound by $(Bi,Pb)_2Sr_2Ca_2Cu_3O_x$/Ag tape. Both ends the tape were overlapped and soldered to each other. The current was induced in a closed coils by external magnetic flux density. Its decay characteristic was observed by means of measuring the magnetic flux density generated by induced current at the center of the closed coil with hall sensor. The joint resistance was calculated as the ratio of the inductance of the loop to the time constants. The joint resistances were evaluated as a function of critical current of loop, contact length, sweep time, and external magnetic flux density in a contact length of 7 cm. It was observed that joint resistance was dependent on contact length of a closed coil, but independent of critical current, sweep time, and external magnetic flux density. The joint resistance was measured to be higher for a standard four-probe method, compared with that for the field decay technique. This implies that noise of measurement in a standard four-probe method is larger than that of field decay technique. It was estimated that joint resistance was $8.0{\times}10^{-9}{\Omega}$ to $11.4{\times}10^{-9}{\Omega}$ for coils of contact length for 7 cm. It was found that 40Pb/60Sn solder are unsuitable for persistent mode.

• Journal of the Korean Society for Nondestructive Testing
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• v.9 no.1
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• pp.22-29
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• 1989

The important point of MPI is the analysis of leakage field in the defective regions. The analysis of leakage field depends on many factors such like geometry and character of defect. In general the calculation of magnetic leakage fields arising from such defects presents an extremely complicated mathematical problem and is practically insoluable, since the inhomogeneities have complex geometrical shapes and may differ in physical nature. Therefore, this paper describes Hall probe measurements of residual leakage field around artificial flaws in alloy steel bar, and shows how the results to recent developments in 2D dipole and analytic models of the magnetic field defect interaction.