• 한국진공학회지
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• 제3권1호
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• pp.122-129
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• 1994

MWPECVD법으로 CH3CHO-H2 계와 CH4-H2-O2 계로부터 Si 기판 위에 다이아몬드박막을 성장 시키고 성장된 박막을 SEM XRD 및 Raman 분광기로 평가하고 박막과 입자의 성장률을 조사하였다. 마이크로 판전력 950W 반응관압력 80torr 수소유량 200sccm 기판온도 95$0^{\circ}C$ 및 CH3CHO농도 3.5%로 5시간 성장시킨 다이아몬드의 박막성장율은 $4mu$m/hr가 되어고 12%$960^{\circ}C$로 Si기판 위에 5시간 성장시킨 다이아몬드의 박막성장율은 3.2$\mu$m/hr가 되었다.

• 한국결정학회지
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• 제10권1호
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• pp.20-27
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• 1999

CaF2 단결정을 흑연도가니를 사용하여 He 분위기 하에서 탄만법으로 성장시켰다. 수화방지를 위해 PbF2를 출발물질에 도포하였다. 열구배에 따른 계면의 움직임인 성장속도는 배플판에 의해 성공적으로 조절되었다. 결정성장의 최적조건은 온도구배가 37℃/cm, 냉각속도가 10℃/hr 및 2.5tw% PbF2를 사용한 경우로, 성장속도는 약 3.2 mm/hr이었으며, 위로 볼록한 고액계면을 갖는 단결정이 성장되었다. IR분석 결과, 1500∼4000 cm-1(6.7∼2.5 ㎛)영역에서 약 96%의 투과도를 보였다. 결함밀도를 측정하기 위해, 성장축에 수직 및 수평으로 절단한 면을 농축 H2SO4에서 약 30분간 에칭하여 간섭현미경으로 관찰한 결과, 각각 3.4×104/cm2였다. 이러한 결과는 수화에 따른 성장된 단결정의 투명도의 경향과 일치하였다. 결정에 대한 XRD분석 결과 우선성장 방향은 <311>이었다.

• 한국세라믹학회지
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• 제34권11호
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• pp.1159-1164
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• 1997

Magnetite(Fe3O4) powders were synthesized through glycothermal reaction by using crystalline $\alpha$-FeOOH as precursor and ethyleanne glycol as solvent. The phase, morphology and particle size of synthesized powders were characterized by XRD and an SEM. When only ethylene glycol was used as solvent, the phase was transformed from $\alpha$-FeOOH to $\alpha$-Fe2O3 and finally Fe3O4 at 27$0^{\circ}C$ for 6hr without morphological change. But by addition of water, Fe3O4 powders were synthesized at 23$0^{\circ}C$ for 3hr through solution-recrystalization process. As the content of water addition increased, the particle shape changed from sphere to octahedron and the partcle size increased. When the excess amount of water added, residual $\alpha$-FeOOH or $\alpha$-Fe2O3 was recrystalized.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1992년도 추계학술대회 논문집
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• pp.132-135
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• 1992

Diamond thin films by MWPECVD in methane-hydrogen mixed gas were studied, with emphasis on the investigation of the effect of discharge power and pressure. As a result, the growth rate of diamond thin films was affected by discharge power and the surface morphology of diamond thin films was affected by pressure. The growth rate of diamond films was about 1.65 ${\mu}m$/hr under the condition of MW power: 900W, pressure: 60torr, $H_2$ flow rate: 60sccm, $CH_4$ concentration: 1 % and deposition time: 5hr. The deposited diamond films were identified by SEM, XRD and Raman spectrophotometer.

• 한국반도체및디스플레이장비학회:학술대회논문집
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• 한국반도체및디스플레이장비학회 2006년도 춘계학술대회
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• pp.194-197
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• 2006

Lead-free bismuth-layered perovskite ferroelectric europium-substituted $Bi_{4}Ti_{3}O_{12}(BTO)$ thin films have been successfully deposited on Pt/Ti/$SiO_2$/Si substrate by a sol-gel spin-coating process. $Bi(TMHD)_3,\;Eu(THMD)_3,\;Ti(OiPr)_4$ were used as the precursors, which were dissolved in 2-methoxyethanol. The thin films were annealed at various temperatures from $600^{\circ}\;to\;720^{\circ}C$ in oxygen ambient for 1 hr, which was followed by post-annealed for 1 hr after depositing a Pt electrode to enhance the electrical properties. X-ray diffraction (XRD) and scanning electron microscopy (SEM) were used to analyze the crystallinity and surface morphology of layered perovskite phase, respectively. The remanent polarization value of the BET thin films annealed at $720^{\circ}C\;was\;25.95{\mu}C/cm^2$ at an applied voltage of 5 V.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2003년도 하계학술대회 논문집 C
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• pp.1427-1429
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• 2003

The $ZnNb_2O_6$ ceramics with 3wt% CuO were prepared by the conventional mixed oxide method. The ceramics were sintered at the temperature of $1000^{\circ}C{\sim}1075^{\circ}C$ for 3hr. in air. The structural properties were investigated with sintering temperature by XRD and SEM. Also, the microwave dielectric properties were investigated with sintering temperature. Increasing the sintering temperature, the peak of second phase($Cu_3Nb_2O_8$) was increased. In the case of $ZnNb_2O_6$+CuO(3wt%) ceramics sintered at $1025^{\circ}C$ for 3hr, the dielectric constant, quality factor were 21.73, 19.276, respectively.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2002년도 추계학술대회 논문집 Vol.15
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• pp.27-30
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• 2002

Boron Phosphide films were deposited on the glass substrate at the low temperature, $550^{\circ}C$, $480^{\circ}C$, by the reaction of $B_{2}H_{6}$, with $PH_{3}$ using CVD. The reactant gas rates were 50 cc/min and 20 cc/min for $B_{2}H_{6}$, 50 cc/min and 40 cc/min for $PH_{3}$ and $1.5\ell$/min for $N_{2}$ carrier gas. The films were annealed for 1hour, 3hours in $N_{2}$ ambient at $550^{\circ}C$ and $400^{\circ}C$. The deposition rate was $1000{\AA}$/min and the refractive index of film was 2.6. From results of XRD measurement the films have the preferred orientation of (1 0 1). For as deposited the film, the data of VIS spectrophotometer show 75.49%, 76.71% for 1hr-annealed and 86.4% for 3hrs-annealed. From AFM datas the surface condition of obtained films are was shown $73{\AA}$, $88.9{\AA}$ and $220{\AA}$ for as-deposited, for 1hr-annealed and for 3hr annealed, respectively.

• 한국세라믹학회지
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• 제28권9호
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• pp.730-738
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• 1991

Machinable ceramics containing ${\beta}$-spodumene crystal was fabricated by melting method using domestic pyrophyllite. Raw materials were batched by molar ratio of 8:2, 7:3, 6:4, and 5:5 for fluorophlogopite and ${\beta}$-spodumene. These compounds were melted at 1450$^{\circ}C$ for 1 hr and formed in graphite mold. Base glasses were heat-treated according to 2-step schedule which was determined from DTA, XRD analysis and SEM observation. Fabricated machinable ceramics have excellent themal, chemical properties and machinability.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1989년도 추계학술대회 논문집 학회본부
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• pp.149-150
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• 1989

Diamond thin films were synthesised from the mixed gases of $CH_4$ and $H_2$ on silicon substrate by R.F plasma CVD and films deposited were investigated by SEM. XRD and Raman spectroscope. From these result, cubo-octahedral diamond particles were synthesised under the following condition: methane concentration. 1.0vol% ; pressure of reactor, 0.3torr ; R.F power, 500W ; reaction time, 20hr.

• 한국산학기술학회논문지
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• 제11권2호
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• pp.409-413
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• 2010

실리콘 기판에 GaN 에피성장을 확인하기 위해, P형 Si(100) 기판 전면에 버퍼층으로 10 nm 두께의 코발트실리사이드를 형성시켰다. 형성된 코발트실리사이드 층을 HF로 크리닝하고, PA-MBE (plasma assisted-molecular beam epitaxy)를 써서 저온에서 500 nm의 GaN를 성막하였다. 완성된 GaN은 광학현미경, 주사탐침현미경, TEM, HR-XRD를 활용하여 특성을 확인하였다. HF 크리닝을 하지 않은 경우에는 GaN 에피택시 성장이 진행되지 않았다. HF 크리닝을 실시한 경우에는 실리사이드 표면의 국부적인 에칭에 의해 GaN성장이 유리하여 모두 GaN $4\;{\mu}m$ 정도의 두께를 가진 에피택시 성장이 진행되었다. XRD로 GaN의 <0002> 방향의 결정성 (crsytallinity)을 $\omega$-scan으로 판단한 결과 Si(100) 기판의 경우 2.7도를 보여 기존의 사파이어 기판 정도로 우수할 가능성이 있었다. 나노급 코발트실리사이드를 버퍼로 채용하여 GaN의 에피성장이 가능할 수 있었다.