• 한국고분자학회:학술대회논문집
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• 한국고분자학회 2006년도 IUPAC International Symposium on Advanced Polymers for Emerging Technologies
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• pp.333-333
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• 2006

We synthesized two novel polynorbornene derivatives, chiral poly(norbornene acid methyl ester) (C-PNME) and racemic poly(norbornene acid n-butyl ester) (R-PNME), which are potential low dielectric constant materials for applications in advanced microelectronic and display devices. Thin films of these polymers deposited on substrates were investigated by structural analyses using synchrotron grazing incidence X-ray scattering, specular reflectivity and ellipsometry. These analyses provided important information on the structure, electron density gradient across film thickness, chain orientation, refractive index and thermal expansion of the polymers in substrate-supported thin films. The structural characteristics and properties of the thin films were first dependent on the polymer chain' tacticity and further influenced by film thickness and thermal annealing.

• 한국광학회지
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• 제13권3호
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• pp.189-196
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• 2002

파장 50 $\AA$ 이하의 연엑스선 영역에서 사용될 평면결상형 연엑스선 분광기의 구성요소와 정렬조건을 결정하고 분광기의 분광학적 특성을 해석하였다. 평면결상형 연엑스선 분광기는 토로이드거울, 실틈, 비등간격 오목에돌이발, 연엑스선 검출기로 구성되어 있다. 토로이드거울과 홈간격이 2400 grooves/mm인 비등간격 오목에돌이발을 사용하여 공간분해된 빛띠가 단일 평면 위에 결상되도록 분광기를 구성하였다. 토로이드거울은 연엑스선 광선이 에돌이발에 비스듬하게 입사할 때 발생되는 비점 수차를 보상하기 위해 사용되었다. 파면수차 이론을 적용하여 분광기가 가지는 파장분해와 공간분해를 계산하고, 에돌이 현상에 대한 스칼라 이론을 적용하여 에돌이발의 에돌이효율을 계산하였다.

• Journal of Magnetics
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• 제9권2호
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• pp.52-59
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• 2004

As deposited and annealed MTJs with the structure of $Ta(5 nm)/Cu(10 nm)/Ta(5 nm)/Ni_{80}Fe_{20}(2 nm)/Cu(5 nm)/ Ir_{25}Mn_{75}(10 nm)/Co_{70}Fe_{30}(2.5 nm)/Al-O/Co_{70}Fe_{30}(2.5nm)/Ni_{80}Fe_{20}(t)/Ta(5nm)/Ni_{80}Fe_{20}(t)/Ta(5 nm)$, where t=10, 30, 60 and 100 nm were characterized by XRD and magnetic hysteresis loops measurements. The XRD measurements were done in grazing incidence $(GID scan-2{\theta})$ and ${\theta}-2{\theta}$ geometry, by rocking curve $(scan-{\omega})$ and pole figures in order to establish correlation between texture and crystallites size and magnetic parameters of exchange biased and interlayer coupling. The variations of shifting and coercivity field of free and pinned layers after annealing in $300^{\circ}C$ correlate with the improvement of ［111］ texture and grains size of $Ni_{80}Fe_{20}$ and $Ir_{25}Mn_{75}$ respectively. The exchange biased and the coercivity fields of the pinned layer linearly increased with increasing grain size of $Ir_{25}Mn_{75}$, The reciprocal proportionality between interlayer coupling and coercivity fields of the free layer and grain size of $Ni_{80}Fe_{20}$ was found. The enhancement of interlayer coupling between pinned and free layers, after annealing treatment, indicates on the correlated in-phase roughness of dipolar interacting interfaces due to increase of crystallites size of $Ni_{80}Fe_{20}$.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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• pp.188.1-188.1
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• 2014

Aluminum is widely used as a material for electrode on silicon based devices. Especially, aluminum films are used as backside and front-side electrodes in silicon quantum dot (QD) solar cells. In this point, the diffusion of aluminum is very important for the enhancement of power conversion efficiency by improvement of contact property. Aluminum was deposited on a Si (100) wafer and a Si QD layer by ion beam sputter system with a DC ion gun. The Si QD layer was fabricated by $1100^{\circ}C$ annealing of the $SiO_2/SiO_1$ multilayer film grown by ion beam sputtering deposition. Cs ion beam with a low energy and a grazing incidence angle was used in SIMS depth profiling analysis to obtain high depth resolution. Diffusion behavior of aluminum in the Al/Si and Al/Si QD interfaces was investigated by secondary ion mass spectrometry (SIMS) as a function of heat treatment temperature. It was found that aluminum is diffused into Si substrate at $450^{\circ}C$. In this presentation, the effect of heat treatment temperature and Si nitride diffusion barrier on the diffusion of Al will be discussed.

• Current Photovoltaic Research
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• 제5권3호
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• pp.69-74
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• 2017

Here we report the influence of thermal treatment on the performance of high efficiency polymer solar cells with the bulk heterojunction films of poly[4,8-bis(5-(2-ethylhexyl)thiophen-2-yl)benzo[1,2-b:4,5-b'] dithiophene-alt-3-fluorothieno[3,4-b]thiophene-2-carboxylate] (PTB7-Th) and [6,6]-phenyl $C_{71}$ butyric acid methyl ester ($PC_{71}BM$). The crystalline nanostructure of PTB7-Th:$PC_{71}BM$ layers, which were annealed at three different temperatures, was investigated by employing synchrotron radiation grazing incidence X-ray diffraction (GIXD) technique. Results showed that the device performance was slightly reduced by thermal annealing at $50^{\circ}C$ but became significantly poor by thermal annealing at $100^{\circ}C$. The poor device performance by thermal annealing was attributed to the collapse in the crystalline nanostructure of PTB7-Th in the PTB7-Th:$PC_{71}BM$ layers as evidenced by the GIXD measurements that exhibited huge reduction in the intensity of PTB7-Th (100) peak even at $50^{\circ}C$.

• Applied Science and Convergence Technology
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• 제25권3호
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• pp.56-60
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• 2016

The ALD process is an adequate technique to meet the requirements that come with the downscaling of semiconductor devices. To obtain thin films of the desired standard, it is essential to understand the thermal decomposition properties of the precursors. As such, this study examined the thermal decomposition properties of TEMAHf precursors and its effect on the formation of $HfO_2$ thin films. FT-IR experiments were performed before deposition in order to analyze the thermal decomposition properties of the precursors. The measurements were taken in the range of $135^{\circ}C-350^{\circ}C$. At temperatures higher than $300^{\circ}C$, there was a rapid decrease in the absorption peaks arising from vibration of $Sp^3$ C-H stretching. This showed that the precursors experienced rapid decomposition at around $275^{\circ}C-300^{\circ}C$. $HfO_2$ thin films were successfully deposited by Atomic Layer Deposition (ALD) at $50^{\circ}C$ intervals between $150^{\circ}C$ to $400^{\circ}C$; the deposited films were characterized using a reflectometer, X-ray photoelectron spectroscopy (XPS), Grazing Incidence X-ray Diffraction (GIXRD), and atomic force microscopy (AFM). The results illustrate the relationship between the thermal decomposition temperature of TEMAHf and properties of thin films.

• 지구물리와물리탐사
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• 제15권3호
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• pp.121-128
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• 2012

탄성파의 수치 모델링은 유한한 경계에서 발생하는 인공적인 반사파의 제거를 위한 경계조건을 필요로 한다. 이 연구에서는 주파수영역의 탄성파 수치 모델링에 CFS-PML (Complex Frequency Shifted-Perfectly Matched Layer) 경계조건을 적용하였다. 수치모델링 검증을 위해 Lamb's Problem의 해석해와 수치모델링 결과를 비교한 결과 일치하였다. 모형 내의 운동에너지, 최대크기오차, 그리고 스펙트럼오차를 통하여 CFS-PML경계조건이 기존의 흡수경계조건들 보다 유한경계에서 발생한 인공적인 반사파를 효과적으로 제거할 수 있음을 확인하였다. CFS-PML경계조건의 변수 ${\kappa}_{max}$와 ${\alpha}_{max}$의 최적값은 운동에너지를 이용하여 산정할 수 있었다. 또한, 주파수에 따른 함수로 정의된 ${\alpha}_{max}$를 변수로 갖는 변형된 CFS-PML경계조건을 제안하여 기존 PML경계조건, CFS-PML경계조건, 그리고 변형된 CFS-PML경계조건의 성능을 운동에너지, 최대크기오차, 스펙트럼 오차로 비교하였다. 기존 PML경계조건에서 나타난 스쳐가는 입사각에 대한 반사파 문제가 CFS-PML경계조건, 그리고 변형된 CFS-PML경계조건에서는 개선되었다.

• Macromolecular Research
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• 제16권7호
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• pp.575-585
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• 2008

There are two beamlines (BLs), 4C1 and 4C2, at the Pohang Accelerator Laboratory that are dedicated to small angle X-ray scattering (SAXS). The 4C1 BL was constructed in early 2000 and is open to public users, including both domestic and foreign researchers. In 2003, construction of the second SAXS BL, 4C2, was complete and commissioning and user support were started. The 4C2 BL uses the same bending magnet as its light source as the 4C1 BL. The 4C1 BL uses a synthetic double multilayer monochromator, whereas the 4C2 BL uses a Si(111) double crystal monochromator for both small angle and wide angle X-ray scattering. In the 4C2 BL, the collimating mirror is positioned behind the monochromator in order to enhance the beam flux and energy resolution. A toroidal focusing mirror is positioned in front of the monochromator to increase the beam flux and eliminate higher harmonics. The 4C2 BL also contains a digital cooled charge coupled detector, which has a wide dynamic range and good sensitivity to weak scattering, thereby making it suitable for a range of SAXS and wide angle X-ray scattering experiments. The general performance of the 4C2 BL was initially tested using standard samples and further confirmed by the experience of users during three years of operation. In addition, several grazing incidence X-ray scattering measurements were carried out at the 4C2 BL.