• Title/Summary/Keyword: Ge

Search Result 3,244, Processing Time 0.033 seconds

Effect of Germanium Treatment in Culture Medium on Germanium Absorption by Callus Induced from Brown Rice (배지내 게르마늄 처리가 현미 유도 캘러스의 게르마늄 흡수에 미치는 영향)

  • 권태오;남궁승박;박병우
    • KOREAN JOURNAL OF CROP SCIENCE
    • /
    • v.41 no.6
    • /
    • pp.729-735
    • /
    • 1996
  • This study was carried out to investigate the effect of Germaniwn(Ge) treatment in the culture media on the Ge absorption by the callus induced from brown rice cv. Dongjinbyeo. MS medium was more effective on the growth ratio of callus and the content of Ge and some inorganic elements except K in callus than N$_{6}$ medium. The more Ge treatment in the N$_{6}$ or MS medium, the more Ge absorption by the callus, but the growth ratio of callus and the content of Ca, Mg, and K in callus were decreased. The content of Fe, Mn, Zn, and Cu was increased under treatment up to 100~200mg /$\ell$ Ge, but tended to be decreased under treatment more than that of Ge concentration. Under treatment less than 150mg /$\ell$ Ge, GeO$_2$(inorganic Ge) was more effective on the Ge absorption by callus than Ge-132(organic Ge), but Ge-132 was more effective on the Ge ab-sorption by callus and the activity of callus in case of treatment more than 150mg /$\ell$ Ge. The lower pH of culture medium, the higher Ge content in the callus. When callus was cultured on medium supplemented with Ge and 0.1~1.0mM of citric acid or myo-inositol, content of Ge and some inorganic elements in callus, as well as growth and dry weight of callus, were tend to increase in comparison to control, but myo-inositol was more effective on them than citric acid.cid.

  • PDF

Ab Initio Study of Mechanism of Forming Spiro-Ge-Heterocyclic Ring Compound From C2Ge=Ge: and Formaldehyde

  • Lu, Xiuhui;Li, Yongqing;Ming, Jingjing
    • Bulletin of the Korean Chemical Society
    • /
    • v.34 no.12
    • /
    • pp.3690-3694
    • /
    • 2013
  • The $H_2Ge=Ge:$ and its derivatives ($X_2Ge=Ge:$, X = H, Me, F, Cl, Br, Ph, Ar${\ldots}{\ldots}$) is a new species. Its cycloaddition reactions is a new area for the study of germylene chemistry. The mechanism of the cycloaddition reaction between singlet state Cl2Ge=Ge: and formaldehyde has been investigated with CCSD(T)//MP2/$6-31G^*$ method. From the potential energy profile, it could be predicted that the reaction has only one dominant reaction pathway. The reaction rule presented is that the two reactants first form a fourmembered Ge-heterocyclic ring germylene through the [2+2] cycloaddition reaction. Because of the 4p unoccupied orbital of Ge: atom in the four-membered Ge-heterocyclic ring germylene and the ${\pi}$ orbital of formaldehyde forming a ${\pi}{\rightarrow}p$ donor-acceptor bond, the four-membered Ge-heterocyclic ring germylene further combines with formaldehyde to form an intermediate. Because the Ge: atom in intermediate hybridizes to an $sp^3$ hybrid orbital after transition state, then, intermediate isomerizes to a spiro-Ge-heterocyclic ring compound via a transition state. The research result indicates the laws of cycloaddition reaction between $H_2Ge=Ge:$ and formaldehyde, and laid the theory foundation of the cycloaddition reaction between $H_2Ge=Ge:$ and its derivatives ($X_2Ge=Ge:$, X = H, Me, F, Cl, Br, Ph, Ar${\ldots}{\ldots}$) and asymmetric ${\pi}$-bonded compounds, which is significant for the synthesis of small-ring and spiro-Ge-heterocyclic compounds. The study extends research area and enriches the research content of germylene chemistry.

Study on the oxidation behavior of Poly $Si_{1-x}Ge_x$ films (Poly $Si_{1-x}Ge_x$ 박막의 산화 거동 연구)

  • 강성관;고대홍;오상호;박찬경;이기철;양두영;안태항;주문식
    • Journal of the Korean Vacuum Society
    • /
    • v.9 no.4
    • /
    • pp.346-352
    • /
    • 2000
  • We investigated the oxidation behavior of poly $Si_{1-x}Ge_x$ films (X=0.15, 0.42) at $700^{\circ}C$ in wet oxidation ambients and analyzed the oxide by XPS, RBS, and cross-sectional TEM. In the case of poly $Si_{0.85}Ge_{0.15}$ films, $SiO_2$ was formed on the poly $Si_{1-x}Ge_x$ films and Ge was rejected from growing oxide, subsequently leading to the increase of Ge content. In the case of poly $Si_{0.58}Ge_{0.42}$ films, we found that $SiO_2-GeO_2$ were formed on the poly $Si_{1-x}Ge_x$ films due to high Ge content. Finally, we proposed the oxidation model of poly $Si_{1-x}Ge_x$ films.

  • PDF

Holographic Data Grating Formation of AsGeSeS Single layer, Ag/AsGeSeS double layer And AsGeSeS/Ag/AsGeSeS Muti-layer Thin Films with the DPSS Laser (DPSS Laser에 의한 AsGeSeS,Ag/AsGeSeS 와 AsGeSeS/Ag/AsGeSeS 박막의 홀로그래픽 데이터 격자형성)

  • Koo, Yong-Woon;Koo, Sang-Mo;Cho, Won-Ju;Chung, Hong-Bay
    • Proceedings of the KIEE Conference
    • /
    • 2006.10a
    • /
    • pp.55-56
    • /
    • 2006
  • We investigated the diffraction grating efficiency by the DPSS laser beam wavelength to improve the diffraction efficiency on AsGeSeS & Ag/ AsGeSeS thin film. Diffraction efficiency was obtained from DPSS(532nm)(P:P)polarized laser beam on AsGeSeS, Ag/ AsGeSeS and AsGeSeS/Ag/AsGeSeS thin films. As a result, for the laser beam intensity, 0.24 mW, single AsGeSeS thin film shows the highest value of 0.161% diffraction efficiency at 300 s and for 2.4 mW, it was recorded with the fastest speed of 50 s, which the diffraction grating forming speed is faster than that of 0.24 mW beam. Ag/ AsGeSeS and AsGeSeS/ Ag/ AsGeSeS multi-layered thin film also show the faster grating forming speed at 2.4 mW and higher value of diffraction efficiency at 0.24 mW.

  • PDF

A study on the Poly-$Si_{1-x}Ge_x$ thin film deposition (I) Variation of the deposition rate and Ge composition with deposition parameters (다결정 $Si_{1-x}Ge_x$박막 증착에 관한 연구(I) 증착변수에 따른 증착속도 및 Ge조성 변화)

  • 이승호;어경훈;소명기
    • Journal of the Korean Crystal Growth and Crystal Technology
    • /
    • v.7 no.4
    • /
    • pp.578-588
    • /
    • 1997
  • Poly-$Si_{1-x}Ge_x$ films on oxidized Si wafer were prepared by rapid thermal chemical vapor deposition using the $SiH_4$ and $GeH_4$ gaseous mixture at various deposition conditions. The deposition temperature, $SiH_4\;: GeH_4$ flow ratio and pressure were varied from 400 to $600^{\circ}C$, 1 : 0.1-2 : 1 and 1 to 50 torr, respectively. In this work, we have investigated the change of Ge composition of poly-$Si_{1-x}Ge_x$ films deposited with the variation of deposition parameters and the effect of Ge composition on the deposition rate. From the experimental results, it was observed that the deposition rate increased with increasing deposition temperature and Ge composition. On the other hand, the Ge composition decreased with increasing temperature. As the deposition pressure increased, the deposition rate and Ge composition were increased linearly to 10 torr but increased slowly above it, which has been attributed to the slower rate of surface reaction than mass transfer.

  • PDF

Effect of Germanium Treatment on the Quality of 'Niitaka' Pear Fruit (게르마늄 처리가 배 '신고' 과실품질 특성에 미치는 영향)

  • Kim, Tae-Yeon;Kim, Wol-Soo;Choi, Hyun-Sug
    • Food Science and Preservation
    • /
    • v.16 no.5
    • /
    • pp.675-679
    • /
    • 2009
  • We investigated how Germanium (Ge) application, and the application method, affected 'Niitaka' (Pyrus pyrifolia) fruit quality in a conventional orchard. Ge-treated pears weredark yellow in color, indicating appropriate maturation. Other fruit characteristics, and weight, did not significantly differ between tests and controls. Compared to controls, fruit from Ge-treated trees had more soluble solids, a lower acid content, and fewer stone cells, which reduced fruit chewiness. Ge-treated trees showed a higher Ge concentration in fruit but a lower calcium (Ca) concentration. Other fruit mineral nutrients, includingP, K, and Mg, did not differ in level between Ge-treated fruit and controls. Ge-treated fruit showed greater firmness and a heavier specific weight during 6 months of storage, compared to control fruit. Therefore, Ge treatment reduced fruit pithiness, which can be a problem in 'Niitaka' pears. Overall, there was no significant difference between Ge-treated and control fruit qualities, but a combined Ge treatment (fertilization plus foliar application plus trunk injection) slightly improved fruit quality.

Temperature dependence of photoluminescence for blue and green light emitting porous Ge and spark processed Ge (청색 및 녹색 발광 다공성 Ge 및 스파크 제조된 Ge의 광발광의 온도의존성)

  • 장성식
    • Journal of the Korean Crystal Growth and Crystal Technology
    • /
    • v.8 no.3
    • /
    • pp.442-447
    • /
    • 1998
  • Visible photoluminescence (PL) has been observed generally in the blue and green spectral region from anodically etched porous Ge as well as spark processed Ge. Porous Ge which is prepared by anodic etching without UV light illumination displays the PL peak max of 52 nm (2.38 eV), while porous Ge with UV light illumination exhibits PL peak blue shift to a 470 nm (2.63 eV). Spark processed Ge shows a PL peak max of 520 nm with shoulder peaks at 420 nm and 610nm. The values of energy shift as a function of decreasing temperature between 300 K and 20 K is 0.53 and $1.89\;meVK^{-1}$ for anodic etched Ge without UV illumination and with UV illumination, respectively. On the contrary, no continuous blue shift of PL peak as a function of decreasing temperature is observed for the green luminescing spark processed Ge. From the results of PL as a function of temperature the origin of blue and green luminescing anodically etched Ge as well as spark processed Ge is discussed.

  • PDF

Structural properties of GeSi/Si heterojunction compound semiconductor films by using SPE (SPE법을 통해 형성된 $Ge_xSi_{1-x}/Si$이종접합 화합물 반도체의 결정분석)

  • 안병열;서정훈
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.4 no.3
    • /
    • pp.713-719
    • /
    • 2000
  • In order to Prepare the$Ge_xSi_{1-x}/Si$(111) heterosructure by solid phase epitaxy (SPE), about 1000A of Au and about 1000A Ge were sequentially deposited on the Si(111) substrate. The resulting Ge/Au/Si(111) samples were isochronically annealed in the high vacuum condition. The behaviors of Au and Ge during thermal annealing and the structural Properties of $Ge_xSi_{1-x}$ films were characterized by Auger electron spectroscopy (AES), X-ray diffraction (XRD) and high resolution transmission electron microscopy (TEM). The a-Ge/Au/Si(111) structure was converted to the Au/GeSi/Si(111) structure. Defects such as stacking faults, point defects and dislocations were found at the GeXSil-X(111) interface, but the film was grown epitaxially with the matching face relationship of $Ge_xSi_{1-x}/$(111)/Si(111). Twin crystals were also found in the $Ge_xSi_{1-x}/$(111) matrix.

  • PDF

HVCVD를 이용한 다결정 SiGe 박막의 증착 및 활성화 메카니즘 분석

  • 강성관;고대홍;전인규;양두영;안태항
    • Proceedings of the Korean Vacuum Society Conference
    • /
    • 1999.07a
    • /
    • pp.66-66
    • /
    • 1999
  • 최근 들어 다결정 SiGe은 MOS(Metal-Oxide-Semiconductor)에서 기존에 사용되던 다결정 Si 공정과의 호환성 및 여러 장점으로 인하여 다결정 Si 대안으로 많은 연구가 진행되고 있다. 고농도로 도핑된 P type의 다결정 SiGe은 Ge의 함량에 따른 일함수의 조절과 낮은 비저항으로 submicrometer CMOS 공정에서 게이트 전극으로 이용하려는 연구가 진행되고 있으며, 55$0^{\circ}C$ 이하의 낮은 온도에서도 증착이 가능하고, 도펀트의 활성화도가 높아서 TFT(Thin Film Transistor)에서도 유용한 재료로 검토되고 있다. 현재까지 다결정 SiGe의 증착은 MBE, APCVD, RECVD. HV/LPCVD 등 다양한 방법으로 이루어지고 있다. 이중 HV/LPCVD 방법을 이용한 증착은 반도체 공정에서 게이트 전극, 유전체, 금속화 공정 등 다양한 공정에서 사용되고 있는 방법으로 현재 사용되고 있는 반도체 공정과의 호환성의 장점으로 다결정 SiGe 게이트 전극의 증착 공정에 적합하다고 할 수 있다. 본 연구에서는 HV/LPCVD 방법을 이용하여 게이트 전극으로의 활용을 위한 다결정 SiGe의 증착 메카니즘을 분석하고 Ex-situ implantation 후 열처리에 따라 나타나는 활성화 정도를 분석하였다. 도펀트를 첨가하지 않은 다결정 SiGe을 주성엔지니어링의 EUREKA 2000 장비를 이용하여, 1000$\AA$의 열산화막이 덮혀있는 8 in 웨이퍼에 증착하였다. 증착 온도는 55$0^{\circ}C$에서 6$25^{\circ}C$까지 변화를 주었으며, 증착압력은 1mtorr-4mtorr로 유지하였다. 낮은 증착압력으로 인한 증착속도의 감소를 방지하기 위하여 Si source로서 Si2H6를 사용하였으며, Ge의 Source는 수소로 희석된 10% GeH4와 100% GeH4를 사용하였다. 증착된 다결정 SiGe의 Ge 함량은 RBS, XPS로 분석하였으며, 증착된 박막의 두께는 Nanospec과 SEM으로 관찰하였다. 또한 Ge 함량 변화에 따른 morphology 관찰과 변화 관찰을 위하여 AFM, SEM, XRD를 이용하였으며, 이온주입후 열처리 온도에 따른 활성화 정도의 관찰을 위하여 4-point probe와 Hall measurement를 이용하였다. 증착된 다결정 SiGe의 두게를 nanospec과 SEM으로 분석한 결과 Gem이 함량이 적을 때는 높은 온도에서의 증착이 더 빠른 증착속도를 나타내었지만, Ge의 함량이 30% 되었을 때는 온도에 관계없이 일정한 것으로 나타났다. XRD 분석을 한 결과 Peak의 위치가 순수한 Si과 순수한 Ge 사이에 존재하는 것으로 나타났으며, ge 함량이 많아짐에 따라 순수한 Ge쪽으로 옮겨가는 경향을 보였다. SEM, ASFM으로 증착한 다결정 SiGe의 morphology 관찰결과 Ge 함량이 높은 박막의 입계가 다결정 Si의 입계에 비해 훨씬 큰 것으로 나타났으며 근 값도 증가하는 것으로 나타났다.

  • PDF

The density-of-states effective mass and conductivity effective mass of electrons and holes in relaxed or strained Ge and ${Ge_{0.8}}{Sn_{0.2}}$ (완화된 또는 응력변형을 겪는 Ge과 ${Ge_{0.8}}{Sn_{0.2}}$에서 전자와 정공의 상태밀도 유효질량과 전도도 유효질량)

  • 박일수;전상국
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.13 no.8
    • /
    • pp.643-650
    • /
    • 2000
  • Density-of-states effective mass(m*$_{d}$) and conductivity mass(m*$_{c}$)for Ge and Ge$_{0.8}$/Sn$_{0.2}$ are obtained by using 8$\times$8 k.p and strain Hamiltonians. It is shown that m*$_{d}$ and m*$_{c}$ for electrons in Ge/Ge$_{0.8}$/Sn$_{0.2}$(001) and Ge$_{0.8}$/Sn$_{0.2}$/Ge(001) are much smaller than those for electrons in relaxed Ge mainly due to the increase of interaction caused by the strain between the conduction band and valence bands at the $\Gamma$ point. The lift of degeneracy in Ge/Ge$_{0.8}$/Sn$_{0.2}$(001) and Ge/Ge$_{0.8}$/Sn$_{0.2}$(001) makes m*$_{d}$ and m*$_{c}$ for holes smaller than those in relaxed Ge and results in the decrease of the interband scattering as well as interband scattering. The decrease of the interband scattering is more obvious in Ge/Ge$_{0.8}$/Sn$_{0.2}$(001) because of its large splitting energy between the heavy hole and light hole band. Therefore, Ge/Ge$_{0.8}$/Sn$_{0.2}$(001) is expected to be good candidate for the development of ultra high-speed CMOS device.CMOS device.eed CMOS device.CMOS device.

  • PDF