• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.70-70
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• 2010

일차원 나노구조를 갖는 재료는 크기효과 뿐만 아니라 단결정성, 일차원성으로 인해 새로운 물리적, 화학적 성질과 높은 표면적-부피비 등으로 인하여 많은 관심의 대상이 되고 있다. 일차원 나노구조 중에 특히 GaAs 나노와이어의 경우, 미래의 전자 소자 혹은 광자 소자로서의 잠재력 때문에 많은 연구가 이루어지고 있다. GaAs 나노와이어는 MOCVD(Metal-Organic Chemical Vapor Deposition), CBE(Chemical Beam Epitaxy), MBE(Molecular Beam Epitaxy)등의 방법으로 성장시킬 수 있다. 본 연구에서는 아크 방전법으로 합성한 단일벽 탄소나노튜브 템플릿 위에 GaAs를 MBE로 성장시켜 다공성의 GaAs-탄소나노튜브 복합체를 제작하였다. GaAs는 성장온도를 $400^{\circ}{\sim}600^{\circ}C$ 사이로 변화시켜 성장시켰다. 성장온도가 $500^{\circ}C$ 미만일 경우에는 GaAs가 탄소나노튜브 위에서 입상구조로 성장이 되었으며 $500^{\circ}C$ 이상에서는 탄소나노튜브 위에 나노와이어가 성장되었다. 또한, 제작된 GaAs-탄소나노튜브 복합체를 전자 소스로서의 응용가능성을 보기 위해 전계 방출 특성을 측정하였다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2005.11a
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• pp.76-77
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• 2005

Single crystal $CuAlSe_2$ layers were grown on thoroughly etched semi-insulating GaAs(100) substrate at 410$^{\circ}C$ with hot wall epitaxy (HWE) system by evaporating $CuAlSe_2$ source at $680^{\circ}C$. The crystalline structure of the single crystal thin films was investigated by the photoluminescence(PL) and double crystal X-ray diffraction (DCXO). The temperature dependence of the energy band gap of the $CuAlSe_2$ obtained from the absorpt ion spectra was wel1 described by the Varshni's relation, $E_g$(T) = 2.8382 eV - ($8.86\times10^{-4}$ eV/H)$T_2$/(T + 155K). After the as-grown single crystal $CuAlSe_2$ thin films were annealed in Cu-, Se-, and Al-atmospheres, the origin of point defects of single crystal $CuAlSe_2$ thin films has been investigated by PL at 10 K. The native defects of $V_{cd}$, $V_{se}$, $Cd_{int}$, and $Se_{int}$ obtained by PL measurements were classified as donors or acceptors. And we concluded that the heat-treatment in the Cu-atmosphere converted single crystal $CuAlSe_2$ thin films to an optical n-type. Also. we confirmed that hi in $CuAlSe_2$/GaAs did not form the native defects because Al in single crystal $CuAlSe_2$ thin films existed in the form of stable bonds.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.370-370
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• 2011

I-III-IV2족의 Cu(In,Ga)Se2 (CIGS) 박막 태양전지는 3단계(three-stage) 동시증발공정을 통하여 약 19.9%의 최고의 효율을 보유하고 있다. 3단계 공정에 있어 IV2족 Se의 증발 속도 또는 증착압력은 우선 배향성 제어 및 표면 미세구조 영향 등에 큰 영향을 미치는 것으로 알려져 있다. 본 연구에서는 CIGS 박막 합성을 위한 3단계 공정에서 각 단계별 Se 분압의 변화를 주어, 각 공정 단계에서 Se 분압의 변화가 CIGS 박막의 미세구조 및 셀 효율에 미치는 영향을 분석하였다. 3단계 공정에서 Cu, In, Ga 분압은 고정시키고, Se 분압의 크기 순서대로 1, 2, 3으로 변화시켜 CIGS 박막을 제조하였다. 이 박막의 미세구조, 특히, 우선 배향성, 표면의 기공, 결정성을 제어 하기 위하여 3단계 공정에서 1st stage 이후 Se 분압을 증가시키는 방법($3{\rightarrow}1$, $2{\rightarrow}1$)과 1st stage 이 후 Se 분압을 감소시키는 방법($1{\rightarrow}3$, $1{\rightarrow}2$)을 적용하여 비교하였다. 그 결과 3단계에서 1st stage 이후 Se 분압을 증가시킴으로써 (220)/(204)의 우선 배향성을 촉진시키며, 결정성을 개선하였고, 1st stage 이후 Se 분압을 감소시킴으로써 CIGS 박막 표면의 기공을 제거하고, 결정성을 향상시켰다. 이렇게 1st stage이 후 Se 분압을 증가시킴으로써 (220)/(204)의 우선 배향성의 촉진과 결정성 개선은 단락 전류(Jsc)를 증가시켰으며, 1st stage 이후 Se 분압을 감소시킴으로써 CIGS 박막 표면의 기공을 제거와 결정성 개선은 개방전압(Voc)의 증가효과를 가져왔다.

• Applied Microscopy
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• v.25 no.3
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• pp.75-81
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• 1995

The microstructural characterization of ternary $ZnS_{x}Se_{1-x}$(x=0.085) on GaAs(001) substrate grown up to $2{\mu}m\;at\;300^{\circ}C$ by molecular beam epitaxy(MBE) which has a single growth chamber was investigated by high resolution transmission electron microscope (HRTEM) working at 300 kV with point resolution of 0.18nm. The interface in the ZnSSe/GaAs specimen maintains a pseudomorphism with the substrate, but the epilayer has high density of stacking faults and moire fringes. The pits which had formed along <111> direction were found at the interface of ZnSSe/GaAs. The pits were responsible for producing defects in both epilayer and substrate. The wavy interface which has the difference of 15nm in height was found to maintain the pseudomorphism with the substrate and no stacking faults were found around the interface. However there exists faint and fine moire fringes in the epilayer near interface.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.07a
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• pp.330-333
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• 2002

The substrate temperature is an important parameter in thin film deposition process. In this paper the effects of the substrate temperature on the properties of CuIn0.75Ga0.25Se2(CIGS) thin films are reported. Structure, surface morphology and optical properties of CIGS thin films deposited at various substrate temperatures have been investigated using a number of analysis techniques. X-ray diffraction (XRD) analysis shows that CIGS films exhibit a strong <112> preferred orientation. As expected, at higher substrate temperatures the films displayed a higher degree of crystallinity. The <112> peak was also enhanced and other CIGS peaks appeared simultaneously These results were supported by experimental work using Raman spectroscopy. The Raman spectra of the as-grown CIGS thin films show only the Al mode peak. The intensity of this peak was enhanced at higher deposition temperatures. Scanning electron microscopy (SEM) results revealed very small grains in films fabricated at 48$0^{\circ}C$ substrate temperature. When the substrate temperature was increased the average grain size also increased together with a reduction in the number and size of the voids. The deposition temperature also had a significant influence on the transmission spectra.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.26 no.9
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• pp.701-706
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• 2013

We have focused on the conversion efficiency of CIGS thin film solar cell prepared by co-evaporation method as well as the optimization of process condition. The total thickness of back electrode was fixed at 1 ${\mu}m$ and the structural, electric and optical properties of CIGS thin film were investigated by varying the thickness of Mo:Na bottom layer from 0 to 500 nm. From the experimental results, the content of Na was appeared as 0.28 atomic percent when the thickness of Mo:Na layer was 300 nm with compactly densified plate-shape surface morphology. From the XRD measurements, (112) plane was the strongest preferential orientation together with secondary (220) and (204) planes affecting to the crystallization. The lowest roughness and resistivity were 2.67 nm and 3.9 ${\Omega}{\cdot}cm$, respectively. In addition, very high carrier density and hole mobility were recorded. From the optimization of Mo:Na layer, we have achieved the conversion efficiency of 9.59 percent.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.05c
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• pp.63-66
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• 2002

Bi-layer Mo films were deposited on sodalime glass substrates using DC magnetron sputtering. As the gas pressure and power density, the resistivity varied from $1.5{\times}10^{-5}$ to $4.97{\times}10^{-4}{\Omega}{\cdot}cm$. Furthermore, stress direction yielded compressive-to-tensile transition stress curves. The microstructure of the compressive stress films which had poor adhesion consists of tightly packed columns, but of the tensile-stressed films had less dense structure. Under all gas pressure conditions, Mo films exhibited distinctly increasing optical reflection with decreasing gas pressure. The expansion of (110) peak width with the gas pressure meant the worse crystalline growth. Also, The highest efficiency was 15.2% on 0.2 $cm^2$. The fill factor, open circuit voltage and short circuit current were 63 %, 570 m V and 42.6 $mA/cm^2$ respectively.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.08a
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• pp.276-276
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• 2011

진공증착법으로 ITO (indium-tin-oxide) 기판 위에 $AgGaSe_2$ 박막을 성장시켜 그 구조와 광학적 특성을 조사하였다. X-선 회절 분석에 의하여 살창상수는 a=5.97 ${\AA}$와 c=10.88 ${\AA}$이고, 황동광(chalcopyrite) 구조를 하고 있었으며, 그 성장 방향은 (112)방향으로 선택 성장됨을 알 수 있었다. 증착된 박막과 200~400$^{\circ}C$로 열처리한 박막의 실온에서 측정한 광학적인 에너지 띠 간격은 2.02 eV에서 2.28 eV까지 변하였다. 또한 열린회로로 구성되어 있는 시료의 표면에 광 펄스를 주입하여 표면에서 형성된 전하들의 거동을 광유기 방전 특성(PIDC) 방법을 이용하여 조사하였다. 초기전위 V0로 형성된 시료의 양단을 주행하는 운반자 농도, 전류밀도 및 전기장 효과를 관찰하여 운반자의 주행시간, 이동도 그리고 전하운반자 농도를 계산한 결과는 각각 42 ${\mu}s$~81 ${\mu}s$, $1.9{\times}10^{-1}\;cm^2/Vs$~$5.7{\times}10^{-2}\;cm^2/Vs$ 그리고 약 $6.0{\times}10^{17}/cm^3$~$2.0{\times}10^{18}/cm^3$이었으며, p-형 전도를 나타내었다. 원자 힘 현미경 실험으로 제곱평균제곱근 거칠기와 입계크기를 조사하였으며, X-선 광전자 분광실험으로 원소들의 결합상태를 관찰하였다.

• Korean Journal of Materials Research
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• v.30 no.3
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• pp.131-135
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• 2020

Silver nanowire (AgNW) networks have been adopted as a front electrode in Cu(In,Ga)Se2 (CIGS) thin film solar cells due to their low cost and compatibility with the solution process. When an AgNW network is applied to a CIGS thin film solar cell, reflection loss can increase because the CdS layer, with a relatively high refractive index (n ~ 2.5 at 550 nm), is exposed to air. To resolve the issue, we apply solution-processed ZnO nanorods to the AgNW network as an anti-reflective coating. To obtain high performance of the optical and electrical properties of the ZnO nanorod and AgNW network composite, we optimize the process parameters - the spin coating of AgNWs and the concentration of zinc nitrate and hexamethylene tetramine (HMT - to fabricate ZnO nanorods. We verify that 10 mM of zinc nitrate and HMT show the lowest reflectance and 10% cell efficiency increase when applied to CIGS thin film solar cells.

• Journal of the Optical Society of Korea
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• v.18 no.5
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• pp.582-588
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• 2014

We study polarization-dependent spontaneous emission (SE) rate and light extraction efficiency (LEE) in localized-surface-plasmon (LSP)-coupled light emitting diodes (LEDs). The closely packed seven $Ag/SiO_2$ core-shell (CS) nanoparticles (NPs) lie on top of the GaN surface for LSP coupling with a radiated dipole. According to the dipole direction, both the SE rate and the LEE are significantly modified by the LSP effect at the $Ag/SiO_2$ CS NPs when the size of Ag, the thickness of $SiO_2$, and the position of the dipole source are varied. The enhancement of the SE rate is related to an induced dipole effect at the Ag, and the high LEE is caused by light scattering with an LSP mode at $Ag/SiO_2$ CS NPs. We suggest the optimum position of the quantum well (QW) in blue InGaN/GaN LEDs with $Ag/SiO_2$ CS NPs for practical application.