• Molecules and Cells
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• v.19 no.1
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• pp.104-113
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• 2005

Large inversions are well characterized in the chloroplast genomes of land plants. In contrast, reports of small inversions are rare and involve limited plant groups. In this study, we report the widespread occurrence of small inversions ranging from 5 to 50 bp in fully and partially sequenced chloroplast genomes of both monocots and dicots. We found that small inversions were much more common than large inversions. The small inversions were scattered over the chloroplast genome including the IR, SSC, and LSC regions. Several small inversions were uncovered in chloroplast genomes even though they shared the same overall gene order. The majority of these small inversions were located within 100 bp downstream of the 3' ends of genes. All had inverted repeat sequences, ranging from 11 to 24 bp, at their ends. Such small inversions form stem-loop hairpin structures that usually have the function of stabilizing the corresponding mRNA molecules. Intra-molecular recombination between the inverted sequences in the stem-forming regions are responsible for generating flip-flop orientations of the loops. The presence of two different orientations of the stem-loop in the trnL-F noncoding region of a single species of Jasminum elegans suggests that a short inversion can be generated within a short period of time. Small inversions of non-coding sequences may influence sequence alignment and character interpretation in phylogeny reconstructions, as shown in nine species of Jasminum. Many small inversions may have been generated by parallel or back mutation events during chloroplast genome evolution. Our data indicate that caution is needed when using chloroplast non-coding sequences for phylogenetic analysis.

• The Transactions of the Korea Information Processing Society
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• v.7 no.1
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• pp.235-244
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• 2000

This paper presents a low power PLL based clock geneator circuit for microprocessors. It generates 32MHz${\sim}$1GHz clocks and can be integrated inside microprocessor chips. A high speed D Flip-Flop is designed using dynamic differential latch and a new Phase Frequency Detector(PFD) based on this FF is presented. The PFD enjoys low error characteristics in phase sensitivity and the PLL using this PFD has a low phase error. To improve the linearity of voltage controlled oscillator(VCO) in PLL, the voltage to current converter and current controlled oscillator combination is suggested. The resulting PLL provides wide lock range and extends frequency of generated clocks over 1 GHz. The clock generator is designed by using $0.65\;{\mu}m$ CMOS full custom technology and operates with $11\;{\mu}s$ lock-in time. The power consumption is less than 20mW.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.48 no.2
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• pp.20-27
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• 2011

A CMOS Image Sensor(CIS) mounted on mobile appliances always needs a low power consumption because of the battery life cycle. In this paper, we propose novel power reduction techniques such as a data flip-flop circuit with leakage current elimination, a low power single slope A/D converter with a novel comparator, and etc. Based on 0.13um CMOS process, the chip satisfies QVGA resolution($320{\times}240$ pixels) whose pitch is 2.25um and whose structure is 4-Tr active pixel sensor. From the experimental results, the ADC in the middle of CIS has a 10-b resolution, the operating speed of CIS is 16 frame/s, and the power dissipation is 25mW at 3.3V(Analog)/1.8V(Digital) power supply. When we compare the proposed CIS with conventional ones, the power consumption is reduced approximately by 22% in sleep mode, 20% in operating mode.

• The Journal of Korean Association of Computer Education
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• v.22 no.5
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• pp.27-37
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• 2019

In this study, for the purpose of reflection level analysis of high school students in HW design learning which is based on online simulation, we carried out 5 lessons of HW learning and analyzed there reflection levels for 5 individual time of reflection content. The reflection level analysis results for each time of learning shows that the reflection level of the $3^{rd}$ time learning of D-Flip Flop is the highest score with 1.23. The correlation analysis result between the reflection contents presents that high positive correlation between learning content and task resolving method(r=.781, p<.01), and negative design correlation between task resolving method and alternative resolving method. The HW learning satisfaction survey result shows 4.2, and most of the participant students provided opinions that the HW design learning is required and current learning contents is a bit difficult to follow. We could recognize HW design learning is required to have composition of curriculum with basic and advanced contents, and on-off lines combined.

• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.11
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• pp.187-192
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• 2014

Various researches are performed to extract significant features from continuous images. The FAST algorithm has the simple structure for arithmetic operation and it is easy to extraction the features in real time. For this reason, the FPGA based hardware accelerator is implemented and widely applied for the FAST algorithm. The hardware accelerator needs the threshold to extract the features from images. The threshold is influenced not only the number of extracted features but also the total execution time. Therefore, the way of threshold control is important to stabilize the total execution time and to extract features as much as possible. In order to control the threshold, this paper proposes the PI controller. The function and performance for the proposed PI controller are verified by using test images and the PI control logic is designed based on Xilinx Vertex IV FPGA. The proposed scheme can be implemented by adding 47 Flip Flops, 146 LUTs, and 91 Slices to the FAST hardware accelerator. This proposed approach only occupies 2.1% of Flip Flop, 4.4% of LUTs, and 4.5% of Slices and can be regarded as a small portion of hardware cost.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.9 s.351
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• pp.1-9
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• 2006

In the System-on-Chip(SoC) design, the global wires are critical parts for the performance. Therefore, the global wires need to be pipelined using flip-flops or latches. Since the timing constraint of the latch is more flexible than it of the flip-flop, the latch-based design can provide a better solution for the clock period. Retiming is an optimizing technique which repositions memory elements in the circuits to reduce the clock period. Traditionally, retiming is used on gate-level netlist, but retiming for SoC is used on macro-level netlist. In this paper, we extend the previous work of retiming for SoC using flip-flops to retiming for SoC using single-phase clocked latches. In this paper we propose a MILP for retiming for SoC using single-phase clocked latches, and apply the fixpoint computation to solve it. Experimental results show that retiming for SoC using latches reduces the clock period of circuits by average 10 percent compared with retiming for SoC using flip-flops.

• Journal of IKEEE
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• v.7 no.1 s.12
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• pp.9-15
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• 2003

An optimized finite-field multiplier is proposed for encryption and error correction devices. It is based on a modified Linear Feedback Shift Register (LFSR) which has lower power consumption and smaller area than prior LFSR-based finite-field multipliers. The proposed finite field multiplier for GF(2n) multiplies two n-bit polynomials using polynomial basis to produce $z(x)=a(x)^*b(x)$ mod p(x), where p(x) is a irreducible polynomial for the Galois Field. The LFSR based on a serial multiplication structure has less complex circuits than array structures and hybrid structures. It is efficient to use the LFSR structure for systems with limited area and power consumption. The prior finite-field multipliers need 3${\cdot}$m flip-flops for multiplication of m-bit polynomials. Consequently, they need 6${\cdot}$m latches because one flip-flop consists of two latches. The proposed finite-field multiplier requires only 4${\cdot}$m latches for m-bit multiplication, which results in 1/3 smaller area than the prior finite-field multipliers. As a result, it can be used effectively in encryption and error correction devices with low-power consumption and small area.

• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.5
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• pp.443-450
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• 2013

This paper propose a new ROM data encoding method that takes into account of a sequential access pattern to reduce the power consumption in ROMs used in applications such as FIR filters that access the ROM sequentially. In the proposed encoding method, the number of 1's, of which the increment leads to the increase of the power consumption, is reduced by applying an exclusive-or (XOR) operation to a bit pair composed of two consecutive bits in a bit line. The encoded data can be decoded by using XOR gates and D flip-flops, which are usually used in digital systems for synchronization and glitch suppression. By applying the proposed encoding method to coefficient ROMs of FIR filters designed by using various design methods, we can achieve average reduction of 43.7% over the unencoded original data in the power consumption, which is larger reduction than those achieved by previous methods.

• The Transactions of the Korea Information Processing Society
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• v.2 no.3
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• pp.425-432
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• 1995

In this paper we propose a design and implementation technique of a universal automatic test pattern generator(UATPG) which is well suited for VLSI digital circuits. UATPG is designed to extend the capabilities of the existing APTG and to provide a convenient environment to computer-aided design(CAD) users. We employ heuristic techniques in line justification and fault propagation for functional gates during test pattern generation for a target fault. In addition, the flip-flops associated with design for testability (DFT) are exploited for pseudo PIs and pseudo POs to enhance the testabilities of VLSI circuits. As a result, UATPG shows a good enhancement in convenient usage and performance.

• Journal of the Korean Institute of Telematics and Electronics
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• v.13 no.3
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• pp.1-6
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• 1976

In this paper, a method of test pattern generation for the functional failure in both combinational and sequentlal logic networks by using exterded Boole an difference is proposed. The proposed technique provides a systematic approach for the test pattern generation procedure by computing Boolean difference of the Boolean function that represents the Logic network for which the test patterns are to be generated. The computer experimental results show that the proposed method is suitable for both combinational and asynchronous sequential logic networks. Suitable models of clocked flip flops may make it possible for one to extend this method to synchronous sequential logic networks.