• Title/Summary/Keyword: Flash method

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Friction Welding Analysis of Welding Part Shape with Flow Gallery by Friction Welding (마찰용접에 의해 유동부를 갖는 용접부 형상의 마찰용접해석)

  • Yeom S. H.;Nam K. O.;Yoo Y. S.;Hong S. I.
    • Proceedings of the Korean Society for Technology of Plasticity Conference
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    • 2005.10a
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    • pp.109-112
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    • 2005
  • Friction welding is welding method to use frictional heat of two material. A defect of friction welding is that create flash. The flash is part that must have cut after welding finished. But the welding part with flow gallery by friction welding can't cut flash. Therefore the welding part with flow gallery was designed with no effect in flow. In this research, decide the welding shape parameter of welding part with flow gallery and do friction welding analysis. In friction welding analysis, must input necessary S-S curve, friction coefficient by temperature change, upset pressure, RPM etc. According to analysis result, decided the optimal shape of welding part with no effect in flow.

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Development of A Virtual Classroom for Computer System Architecture Based on The Flash ActionScript (플래시 액션스크립트 기반의 컴퓨터 시스템 구조 가상 학습실 개발)

  • Seo, Ho-Joon;Kim, Dong-Sik;Seo, Sam-Jun
    • Proceedings of the KIEE Conference
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    • 2002.07d
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    • pp.2614-2616
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    • 2002
  • According to the appearance of various virtual websites using multimedia technologies for engineering education, the internet applications in engineering education have drawn much interests. But unidirectional communication, simple text/image based webpages and tedious learning process without motivation etc. have made the lowering of educational efficiency in cyberspace. Thus, to cope with these difficulties this paper presents a web-based educational Flash movies based on ActionScript language for understanding the principles of the computer system architecture. The proposed Flash movies provides the improved learning methods which can enhance the interests of learners. The results of this paper can be widely used to improve the efficiency of cyberlectures in the cyber university. Several sample Flash movies are illustrated to show the validity of the proposed learning method.

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Caching and Prefetching Policies Using Program Page Reference Patterns on a File System Layer for NAND Flash Memory (NAND 플래시 메모리용 파일 시스템 계층에서 프로그램의 페이지 참조 패턴을 고려한 캐싱 및 선반입 정책)

  • Kim, Gyeong-San;Kim, Seong-Jo
    • Proceedings of the IEEK Conference
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    • 2006.06a
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    • pp.777-778
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    • 2006
  • In this thesis, we design and implement a Flash Cache Core Module (FCCM) which operates on the YAFFS NAND flash memory. The FCCM applies memory replacement policy and prefetching policy based on the page reference pattern of applications. Also, implement the Clean-First memory replacement technique considering the characteristics of flash memory. In this method the decision is made according to page hit to apply prefetched waiting area. The FCCM decrease I/O hit frequency up to 37%, Compared with the linux cache and prefetching policy. Also, it operated using less memory for prefetching(maximum 24% and average 16%) compared with the linux kernel.

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Estimation of Flash Points of Flammable Liquid Mixtures with Non-flammable Liquids (난연성액체에 따른 가연성 액체혼합물의 인화점 추산)

  • 이수경;엄종호;하동명;이성민
    • Journal of the Korean Society of Safety
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    • v.7 no.3
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    • pp.53-59
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    • 1992
  • A general theory is developed which enables closed-cup flash points of mixtures of flammable and non-flammable liquid to be estimated from a knowledge of a certain properties of flammability diagram by thermodynamic method. The estimated equations is shown the effect of both the flame inhibiting properties of the vapor of the non-flammable component and the relative volatility of that component. The vapor phase flame inhibition effect results in a even greater elevation of flash points than the rotative volatility of that component. Especially in cases of similar vapor phase flame inhibition of the non-flammable component, the rotative volatility is affected greater elevation of flash points(extinguishing effect).

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Reliability Analysis by Lateral Charge Migration in Charge Trapping Layer of SONOS NAND Flash Memory Devices (SONOS NAND 플래시 메모리 소자에서의 Lateral Charge Migration에 의한 소자 안정성 연구)

  • Sung, Jae Young;Jeong, Jun Kyo;Lee, Ga Won
    • Journal of the Semiconductor & Display Technology
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    • v.18 no.4
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    • pp.138-142
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    • 2019
  • As the NAND flash memory goes to 3D vertical Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) structure, the lateral charge migration can be critical in the reliability performance. Even more, with miniaturization of flash memory cell device, just a little movement of trapped charge can cause reliability problems. In this paper, we propose a method of predicting the trapped charge profile in the retention mode. Charge diffusivity in the charge trapping layer (Si3N4) was extracted experimentally, and the effect on the trapped charge profile was demonstrated by the simulation and experiment.

Nanosecond Laser Flash Photolysis Study of 5-Styryl-1,3-dimethyluracil

  • Shim Sang Chul;Shin Eun Ju;Chae Kyu Ho
    • Bulletin of the Korean Chemical Society
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    • v.6 no.4
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    • pp.234-238
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    • 1985
  • The photoisomerization of 5-styryl-1,3-dimethyluracil is studied with nanosecond laser flash photolysis technique at room temperature. The laser flash photolysis of E-isomer produces the transient absorption spectrum regarded as the triplet-triplet absorption, but the transient absorption of Z-isomer does not show the typical decay curve, probably due to the facile photocyclization reaction during the laser flash photolysis. Using the energy transfer method on nanosecond laser spectroscopy, the energy of the lowest triplet state for E isomer is estimated to lie between 41.8 and 47 kcal/mol. The triplet lifetime for E-isomer obtained from the decay curve of the transient absorption is ca. 93ns. The $S_1 → T_1$ intersystem crossing of E-isomer on direct excitation is relatively inefficient at room temperature supporting the singlet mechanism for direct photoisomerization.

FSM-based Programmable Built-ln Self Test for Flash Memory (플래시 메모리를 위한 유한 상태 머신 기반의 프로그래머블 자체 테스트)

  • Kim, Ji-Hwan;Chang, Hoon
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.44 no.6 s.360
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    • pp.34-41
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    • 2007
  • We popose a programmed on-line to FSM-based Programmable BIST(Buit-In Self-Test) with selected command, to select a test algorithm from a predetermined set of algorithms that are built in the Flash memory BIST. Thus, the proposed scheme greatly simplifies the testing process. Besides, the proposed FSM-based Programmable BIST is more efficient in terms of circuit size and test data to be applied, and it requires less time to configure the Flash memory BIST. We also will develop a programmable Flash memory BIST generator that automatically produces Verilog code of the proposed BIST architecture for a given set of test algorithms. If experiment the proposed method, the proposed method will achieves a good flexibility with smaller circuit size compared with previous methods.

Effects of source bias on the programming characteristics of submicron EPROM/Flash EEPROM (Submicron EPROM/flash EEPROM의 프로그램 특성에 대한 소오스 바이어스의 영향)

  • 박근숙;이재호;박근형
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.3
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    • pp.107-116
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    • 1996
  • Recently, the flash memory has been abstracting great attention in the semiconductor market in the world because of its potential applications as mass storage devices. One of the most significant barriers to the scalling-down of the stacked-gate devices such as EPROM's and flash EEPROM's is the large subthreshold leakage in the unselected cells connected with the bit line of a selected cell in the array during programming. The large subthreshold leakge is majorly due to the capacitive coupling between the floating gates of the unselectd cells and the bit line of selected cell. In this paper, a new programming method to redcue significantly the drain turn-on leakage in the unselected cells during programming has been studied, where a little positive voltage (0.25-0.75V) is applied to the soruce during programming unlike the conventional programming method in which the source is grounded. The resutls of the PISCES simulations and the electrical measurements for the standard EPROM with 0.35.mu.m effective channel length and 1.0.mu.m effective channel width show that the subthreshold leakage in the unselectd cells is significantly large when the source is grounded, whereas it is negligibly small when the source is biased ot a little positive voltage during programming. On the other hadn, the positive bias on the source is found to have little effects on the programming speed of the EPROM.

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The Study of New Reconstruction Method for Brain SPECT on Dual Detector System (Dual detector system에서 Brain SPECT의 new reconstruction method의 연구)

  • Lee, Hyung-Jin;Kim, Su-Mi;Lee, Hong-Jae;Kim, Jin-Eui;Kim, Hyun-Joo
    • The Korean Journal of Nuclear Medicine Technology
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    • v.13 no.1
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    • pp.57-62
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    • 2009
  • Purpose: Brain SPECT study is more sensitive to motion than other studies. Especially, when applying 1-day subtraction method for Diamox SPECT, it needs shorter study time in order to prevent reexamination. We were required to have new study condition and analysing method on dual detector system because triple head camera in Seoul National University Hospital is to be disposed. So we have tried to increase image quality and make the dual and triple head to have equivalent study time by using a new analysing program. Materials and Methods: Using IEC phantom, we estimated contrast, SNR and FWHM. In Hoffman 3D brain phantom which is similar with real brain, we were on the supposition that 5% of injected doses were distributed in brain tissue. To compare with existing FBP method, we used fan-beam collimator. And we applied 15 sec, 25 sec/frame for each SEPCT studies using LEHR and LEUHR. We used OSEM2D and Onco-flash3D reconstruction method and compared reconstruction methods between applied Gaussian post-filtering 5mm and not applied as well. Attenuation correction was applied by manual method. And we did Brain SPECT to patient injected 15 mCi of $^{99m}Tc$-HMPAO according to results of Phantom study. Lastly, technologist, MD, PhD estimated the results. Results: The study shows that reconstruction method by Flash3D is better than exiting FBP and OSEM2D when studied using IEC phantom. Flowing by estimation, when using Flash3D, both of 15 sec and 25 sec are needed postfiltering 5 mm. And 8 times are proper for subset 8 iteration in Flash3D. OSEM2D needs post-filtering. And it is proper that subset 4, iteration 8 times for 15sec and subset 8, iteration 12 times for 25sec. The study regarding to injected doses for a patient and study time, combination of input parameter-15 sec/frame, LEHR collimator, analysing program-Flash3D, subset 8, iteration 8times and Gaussian post-filtering 5mm is the most appropriate. On the other hands, it was not appropriate to apply LEUHR collimator to 1-day subtraction method of Diamox study because of lower sensitivity. Conclusions: We could prove that there was also an advantage of short study time effectiveness in Dual camera same as Triple gamma camera and get great result of alternation from existing fan-beam collimator to parallel collimator. In addition, resolution and contrast of new method was better than FBP method. And it could improve sensitivity and accuracy of image because lesser subjectivity was input than Metz filter of FBP. We expect better image quality and shorter study time of Brain SPECT on Dual detector system.

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Development of Flash-less Die for Forming of Shoe-Outsole (신발 밑창 성형을 위한 플래시 방지형 금형 개발)

  • 박건형;여홍태;허관도
    • Proceedings of the Korean Society for Technology of Plasticity Conference
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    • 2003.10a
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    • pp.255-258
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    • 2003
  • In this study, to develop a flash-less die for forming of shoe-outsole, experiments and forming analysis were carried out. In order to reduce the extra-materials, of feet method and mass distribution method are used in the preform design. To improve the accuracy of contact surface of dies, the contact status of dies are measured by using the pressure film. The vertical pressing die structure and the guide-gutter system have been developed for the discharge of extra-materials and re-pressing. By the investigation, flash of shoe-outsole was considerably reduced.

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