• 제목/요약/키워드: Film Defects

검색결과 463건 처리시간 0.023초

공압출 다층 플라스틱 필름 라인을 위한 결함 검사 시스템 (An Inspection System for Multilayer Co-Extrusion Blown Plastic Film Line)

  • 한종우;무하마드 타릭 마흐무드;최영규
    • 반도체디스플레이기술학회지
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    • 제11권2호
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    • pp.45-51
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    • 2012
  • Multilayer co-extrusion blown film construction is a popular technique for producing plastic films for various packaging industries. Automated detection of defective films can improve the quality of film production process. In this paper, we propose a film inspection system that can detect and classify film defects robustly. In our system, first, film images are acquired through a high speed line-scan camera under an appropriate lighting system. In order to detect and classify film defects, an inspection algorithm is developed. The algorithm divides the typical film defects into two groups: intensity-based and texture-based. Intensity-based defects are classified based on geometric features. Whereas, to classify texture-based defects, a texture analysis technique based on local binary pattern (LBP) is adopted. Experimental results revealed that our film inspection system is effective in detecting and classifying defects for the multilayer co-extrusion blown film construction line.

편광필름 결함검출을 위한 영상처리기법 (An Image Processing Technique for Polarizing Film Defects Detection)

  • 손상욱;류근택;배현덕
    • 전자공학회논문지 IE
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    • 제45권2호
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    • pp.20-27
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    • 2008
  • 본 논문에서는 TFT-LCD 편광필름의 결함을 검출하기 위한 새로운 영상처리기법을 제안한다. 레이저 반사광을 이용하여 획득한 편광필름 영상에서 우선 배경잡음을 제거하기 위하여 형태론적 영상처리기법(열림, 닫힘)을 사용한다. 배경잡음이 제거된 영상으로부터 결함을 검출하기 위하여 2차원 LMS 적응 예측기를 사용하여 밝은 결함을 검출하고 통계적 특성을 이용하여 어두운 결함을 검출한다. 산업현장에서 제공된 TFT-LCD 편광필름을 사용하여 제안된 기법의 성능을 평가한다.

영상 세그멘테이션 및 템플리트 매칭 기술을 응용한 필름 결함 검출 시스템 (A Film-Defect Inspection System Using Image Segmentation and Template Matching Techniques)

  • 윤영근;이석룡;박호현;정진완;김상희
    • 한국정보과학회논문지:데이타베이스
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    • 제34권2호
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    • pp.99-108
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    • 2007
  • 본 논문에서는 TFT-LCD에 사용되는 편광 필름(polarized film)의 제작 과정 중 최종 단계에서 수행되는 필름의 결함 검출 및 결함 유형을 판정하기 위한 필름 결함 검출 시스템(Film Defect Inspection System: FDIS)을 설계하고 이를 구현하였다. 제안한 시스템은 영상 세그멘테이션 기법을 이용하여 편광 필름 영상으로부터 결함을 검출하였고, 검출된 결함의 영상을 분석하여 결함 유형을 판정할 수 있도록 설계되었다. 결함 유형의 판정은 결함 영역의 형태적 특성 및 질감(texture) 등의 특징을 추출하여 템플리트(template) 데이타베이스에 저장된 기준(reference) 결함 영상과 비교함으로써 수행된다. FDIS를 이용한 실험 결과, 테스트 영상에서 모든 결함 영역을 빠른 시간 안에 (평균 0.64초), 정확히 검출하였으며(Precision 1.0, Recall 1.0), 결함 유형을 판정하는 실험에서도 평균 Precision 0.96, Recall 0.95로 정확도가 매우 높은 것을 관찰할 수 있었다. 또한 회전 변형을 적용한 경우의 결함 유형 검출 실험에서도 평균 Precision 0.95, Recall 0.89로 제안한 기법이 회전 변환에 대하여 견고함을 보여 주었다.

필름 인서트 사출성형 공정의 오버랩 불량 개선을 위한 필름 고정 시스템 개발 (Development of Film Fixing System for Improving Overlap Defects in the Film Insert Injection Molding Process)

  • 김정호;문지훈;박홍석
    • 한국생산제조학회지
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    • 제22권3호
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    • pp.472-479
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    • 2013
  • We carried out research into an environmentally friendly injection molding process that involves filling the mold with polymer after thin films are fixed into the cavity, without the coating, plating process. Film insert injection molding is a new technique in which molten plastic resin is injected into the cavity after films are precisely attached to the side of the mold wall. In the film insert injection molding process, the insert film is moved by the flow of the molten plastic resin. Overlap defects cause a decline in the productivity and the quality of the manufactured goods. To reduce overlap defects, new injection mold parts are proposed to produce automotive exterior parts using thin films. It is suggested that the best possible method would be to fix the thin films to one side of the mold wall, and develop interior pins to fix the films in the mold. Based on this new pin fixing system, the problem of the film being moved by the flow of the molten resin was improved.

비젼 시스템을 이용한 LCD용 편광 필름의 결함 검사에 관한 연구 (A study on the defect inspection on the LCD polarizer film using the Vision system)

  • 박종성;정규원;강찬구
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 2002년도 추계학술대회 논문집
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    • pp.164-169
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    • 2002
  • Recently, LCD(Liquid Crystal Display) is the display product widely used on various fields of industry. This is generally composed of many parts. Among many parts, polarizer film control the intensity of the transmitted light according to the degree of rotation of the polarizer axis. Therefore, this film must be free from defects. But it contains many defects such as the defects caused by dust or different thing, adhesive badness, scratch. Presently, the inspection of these defects is depending on the sight of operator. In this paper, we propose the vision system composed of telecentric lens and optical mirror. This system use the coaxial illumination and the light is specularly reflected on the optical mirror. And we develop the image processing algorithm using the threshold and morphological technique.

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Surface Hardness Measurement of Anodic Oxide Films on AA2024 based an Ink-Impregnation Method

  • Moon, Sungmo;Rha, Jong-joo
    • 한국표면공학회지
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    • 제53권2호
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    • pp.80-86
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    • 2020
  • This paper is concerned with type of imperfections present within the anodic oxide films on AA2024 and surface hardness of the anodic film measured after ink-impregnation. The anodic oxide films were formed for 25 min at 40 mA/㎠ and 15±0.5℃ and 300 rpm of magnet stirring rate in 20% sulfuric acid solution. The ink-impregnation allows clear observations of not only the imperfections within the anodic oxide films but also an indentation mark on the oxide film surface made by a pyramidal-diamond penetrator for the hardness measurement. There were observed four different regions in the anodic oxide films on AA2024 and the surface hardness of the anodic oxide films appeared to be crucially dependent on the type of defects, showing 60~100 Hv on the oxide surface region I with large size black defect, 100~140 Hv on the oxide surface region II with large size grey defect, 140~170 Hv on the oxide surface region III with mall size black and/or grey defects and 170~190 Hv on the oxide surface region IV without defects. The pyramidal indentation marks were observed to be distorted in the regions with a large size black and grey defects, while no distortion of the indentation mark was observed in the regions with small size defects and without visible defects.

Vision Inspection and Correction for DDI Protective Film Attachment

  • Kang, Jin-Su;Kim, Sung-Soo;Lee, Yong-Hwan;Kim, Young-Hyung
    • 한국정보기술학회 영문논문지
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    • 제10권2호
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    • pp.153-166
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    • 2020
  • DDI(Display Driver IC) are used to drive numerous pixels that make up display. For stable driving of DDI, it is necessary to attach a protective film to shield electromagnetic waves. When the protective film is attached, defects often occur if the film is inclined or the center point is not aligned. In order to minimize such defects, an algorithm for correcting the center point and the inclined angle using camera image information is required. This technology detects the corner coordinates of the protective film by image processing in order to correct the positional defects where the protective film is attached. Corner point coordinates are detected using an algorithm, and center point position finds and correction values are calculated using the detected coordinates. LUT (Lookup Table) is used to quickly find out whether the angle is inclined or not. These algorithms were described by Verilog HDL. The method using the existing software requires a memory to store the entire image after processing one image. Since the method proposed in this paper is a method of scanning by adding a line buffer in one scan, it is possible to scan even if only a part of the image is saved after processing one image. Compared to those written in software language, the execution time is shortened, the speed is very fast, and the error is relatively small.

Correlation Between Energy Gap and Defect Formation of Al Doped Zinc Oxide on Carbon Doped Silicon Oxide

  • Oh, Teresa;Kim, Chy Hyung
    • Transactions on Electrical and Electronic Materials
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    • 제15권4호
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    • pp.207-212
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    • 2014
  • Aluminum-doped zinc oxide (AZO) films were deposited on SiOC/Si wafer by an RF-magnetron sputtering system, by varying the deposition parameters of radio frequency power from 50 to 200 W. To assess the correlation of the optical properties between the substrate and AZO thin film, photoluminescence was measured, and the origin of deep level emission of AZO thin films grown on SiOC/Si wafer was studied. AZO formed on SiOC/Si substrates exhibited ultraviolet emission due to exciton recombination, and the visible emission was associated with intrinsic and extrinsic defects. For the AZO thin film deposited on SiOC at low RF-power, the deep level emission near the UV region is attributed to an increase of the variations of defects related to the AZO and SiOC layers. The applied RF-power influenced an energy gap of localized trap state produced from the defects, and the gap increased at low RF power due to the formation of new defects across the AZO layer caused by lattice mismatch of the AZO and SiOC films. The optical properties of AZO films on amorphous SiOC compared with those of AZO film on Si were considerably improved by reducing the roughness of the surface with low surface ionization energy, and by solving the problem of structural mismatch with the AZO film and Si wafer.

고성능 아연-이온 전지의 고품질 집전체를 위한 그래핀 필름의 결함 제어 (Controlling Defects in Graphene Film for Enhanced-Quality Current Collector of Zinc-Ion Batteries with High Performance)

  • 이영근;안건형
    • 한국재료학회지
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    • 제33권4호
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    • pp.159-163
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    • 2023
  • Zinc-ion Batteries (ZIBs) are currently considered to be effective energy storage devices for wearable electronics because of their low cost and high safety. Indeed, ZIBs show high power density and safety compared with conventional lithium ion batteries (LIBs) and exhibit high energy density in comparison with supercapacitors (SCs). However, in spite of their advantages, further current collector development is needed to enhance the electrochemical performance of ZIBs. To design the optimized current collector for high performance ZIBs, a high quality graphene film is suggested here, with improved electrical conductivity by controlling the defects in the graphene film. The graphene film showed improved electrical conductivity and good electron transfer between the current collector and active material, which led to a high specific capacity of 346.3 mAh g-1 at a current density of 100 mA g-1, a high-rate performance with 116.3 mAh g-1 at a current density of 2,000 mA g-1, and good cycling stability (68.0 % after 100 cycles at a current density of 1,000 mA g-1). The improved electrochemical performance is firmly because of the defects-controlled graphene film, leading to improved electrical conductivity and thus more efficient electron transfer between the current collector and active material.

Ektaspeed Plus 방사선사진, 간접 디지털 영상 및 Digora 영상의 치근단 병소의 판독능 비교 (Detectability of Ektaspeed Plus Film, Digitized and Digora Images for Artificial Periapical Bone Lesions)

  • 조봉혜;나경수;이희주
    • 치과방사선
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    • 제28권2호
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    • pp.461-470
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    • 1998
  • The comparative detectability of the artificial periapical defects among Ektaspeed Plus film. digitized and digora images was evaluated. The artifical defects were made in the cancellous bone and cancellous-cortical junction with the size of 1.0×0.8mm², 1.4×1.1mm² and 2.8×2.2mm². The defects in cancellous-cortical junction extended into cortical bone with the depth of 0, 0.5 and 1.0 mm. The results were as follows : 1. In junctional defects Ektaspeed Plus film for 2.8×12.2mm² defect showed the highest detectability. But significant difference were only found between Ektaspeed Plus films and digitized images (p<0.05). 2. Almost all defects within cacellous bone were not detected except a few digitized and Digora images for the size of 2.8×2.2mm². Digora images for them showed significant differences with Ektaspeed Plus films and digitized images (p<0.05). 3. The sensitinity of all imaging modalities were 0.9 or 1.0 in junctional defects for the size of 1.4×2.2mm² and 2.8×2.2mm². For cancellous defects, Digora image showed the highest sensitivity of 0.6 for the size of 2.8×2.2mm². 4. Significant differences for change of exposure time were found in most group of Ektaspeed Plus films and digitized images (p<0.05) . But there was no significant differences in Digora images for cacellous defects.

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