• Title/Summary/Keyword: Fault Management Process

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A Quality Assurance Process Model on Fault Management

  • Kim, Hyo-Soo;Baek, Cheong-Ho
    • Journal of Information Processing Systems
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    • v.2 no.3 s.4
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    • pp.163-169
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    • 2006
  • So far, little research has been conducted into developing a QAPM (Quality Assurance Process Model) for telecommunications applications on the basis of TMN. This is the first trial of the design of TMN-based QAPM on fault management with UML. A key attribute of the QAPM is that it can easily identify current deficiencies in a legacy system on the basis of TMN architecture. Using an empirical comparison with the legacy systems of a common carrier validates the QAPM as the framework for a future mode of the operation process. The results indicate that this paper can be used to build ERP(Enterprise Resource Planning) for a telecommunications fault management solution that is one of the network management application building blocks. The future work of this paper will involve applying the QAPM to build ERP for RTE (Real Time Enterprise) fault management solution and more research on ERP design will be necessary to accomplish software reuse.

Fault-Free Process for IT System with TRM(Technical Reference Model) based Fault Check Point and Event Rule Engine (기술분류체계 기반의 장애 점검포인트와 이벤트 룰엔진을 적용한 무장애체계 구현)

  • Hyun, Byeong-Tag;Kim, Tae-Woo;Um, Chang-Sup;Seo, Jong-Hyen
    • Information Systems Review
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    • v.12 no.3
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    • pp.1-17
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    • 2010
  • IT Systems based on Global Single Instance (GSI) can manage a corporation's internal information, resources and assets effectively and raise business efficiency through consolidation of their business process and productivity. But, It has also dangerous factor that IT system fault failure can cause a state of paralysis of a business itself, followed by huge loss of money. Many of studies have been conducted about fault-tolerance based on using redundant component. The concept of fault tolerance is rather simple but, designing and adopting fault-tolerance system is not easy due to uncertainty of a type and frequency of faults. So, Operational fault management that working after developed IT system is important more and more along with technical fault management. This study proposes the fault management process that including a pre-estimation method using TRM (Technical Reference Model) check point and event rule engine. And also proposes a effect of fault-free process through built fault management system to representative company of Hi-tech industry. After adopting fault-free process, a number of failure decreased by 46%, a failure time decreased by 56% and the Opportunity loss costs decreased by 77%.

Machine Learning Process for the Prediction of the IT Asset Fault Recovery (IT자산 장애처리의 사전 예측을 위한 기계학습 프로세스)

  • Moon, Young-Joon;Rhew, Sung-Yul;Choi, Il-Woo
    • KIPS Transactions on Software and Data Engineering
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    • v.2 no.4
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    • pp.281-290
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    • 2013
  • The IT asset is a core part that supports the management objective of an organization, and the fast settlement of the IT asset fault is very important. In this study, a fault recovery prediction technique is proposed, which uses the existing fault data to address the IT asset fault. The proposed fault recovery prediction technique is as follows. First, the existing fault recovery data were pre-processed and classified by fault recovery type; second, a rule was established for the keyword mapping of the classified fault recovery types and reported data; and third, a machine learning process that allows the prediction of the fault recovery method based on the established rule was presented. To verify the effectiveness of the proposed machine learning process, company A's 33,000 computer fault data for the duration of six months were tested. The hit rate for fault recovery prediction was approximately 72%, and it increased to 81% via continuous machine learning.

One-class Classification based Fault Classification for Semiconductor Process Cyclic Signal (단일 클래스 분류기법을 이용한 반도체 공정 주기 신호의 이상분류)

  • Cho, Min-Young;Baek, Jun-Geol
    • IE interfaces
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    • v.25 no.2
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    • pp.170-177
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    • 2012
  • Process control is essential to operate the semiconductor process efficiently. This paper consider fault classification of semiconductor based cyclic signal for process control. In general, process signal usually take the different pattern depending on some different cause of fault. If faults can be classified by cause of faults, it could improve the process control through a definite and rapid diagnosis. One of the most important thing is a finding definite diagnosis in fault classification, even-though it is classified several times. This paper proposes the method that one-class classifier classify fault causes as each classes. Hotelling T2 chart, kNNDD(k-Nearest Neighbor Data Description), Distance based Novelty Detection are used to perform the one-class classifier. PCA(Principal Component Analysis) is also used to reduce the data dimension because the length of process signal is too long generally. In experiment, it generates the data based real signal patterns from semiconductor process. The objective of this experiment is to compare between the proposed method and SVM(Support Vector Machine). Most of the experiments' results show that proposed method using Distance based Novelty Detection has a good performance in classification and diagnosis problems.

Bootstrap-Based Fault Identification Method (붓스트랩을 활용한 이상원인변수의 탐지 기법)

  • Kang, Ji-Hoon;Kim, Seoung-Bum
    • Journal of Korean Society for Quality Management
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    • v.39 no.2
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    • pp.234-243
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    • 2011
  • Multivariate control charts are widely used to monitor the performance of a multivariate process over time to maintain control of the process. Although existing multivariate control charts provide control limits to monitor the process and detect any extraordinary events, it is a challenge to identify the causes of an out-of-control alarm when the number of process variables is large. Several fault identification methods have been developed to address this issue. However, these methods require a normality assumption of the process data. In the present study, we propose a bootstrapped-based $T^2$ decomposition technique that does not require any distributional assumption. A simulation study was conducted to examine the properties of the proposed fault identification method under various scenarios and compare it with the existing parametric $T^2$ decomposition method. The simulation results showed that the proposed method produced better results than the existing one, especially in nonnormal situations.

Intelligent Fault Diagnosis System Using Hybrid Data Mining (하이브리드 데이터마이닝을 이용한 지능형 이상 진단 시스템)

  • Baek, Jun-Geol;Heo, Jun
    • Proceedings of the Korean Operations and Management Science Society Conference
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    • 2005.05a
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    • pp.960-968
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    • 2005
  • The high cost in maintaining complex manufacturing process makes it necessary to enhance an efficient maintenance system. For the effective maintenance of manufacturing process, precise fault diagnosis should be performed and an appropriate maintenance action should be executed. This paper suggests an intelligent fault diagnosis system using hybrid data mining. In this system, the rules for the fault diagnosis are generated by hybrid decision tree/genetic algorithm and the most effective maintenance action is selected by decision network and AHP. To verify the proposed intelligent fault diagnosis system, we compared the accuracy of the hybrid decision tree/genetic algorithm with one of the general decision tree learning algorithm(C4.5) by data collected from a coil-spring manufacturing process.

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A Fault Diagnosis Methodology for Module Process of TFT-LCD Manufacture Using Support Vector Machines (SVM을 이용한 TFT-LCD 모듈공정의 불량 진단 방안)

  • Shin, Hyun-Joon
    • Journal of the Semiconductor & Display Technology
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    • v.9 no.4
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    • pp.93-97
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    • 2010
  • Fast incipient fault diagnosis is becoming one of the key requirements for economical and optimal process operation management in high-tech industries. Artificial neural networks have been used to detect faults for a number of years and shown to be highly successful in this application area. This paper presents a novel test technique for fault detection and classification for module process of TFT-LCD manufacture using support vector machines (SVMs). In order to evaluate SVMs, this paper examines the performance of the proposed method by comparing it with that of multilayer perception, one of the artificial neural network techniques, based on real benchmarking data.

RBR Based Network Configuration Fault Management Algorithms using Agent Collaboration (에이전트들 간의 협력을 통한 RBR 기반의 네트워크 구성 장애 관리 알고리즘)

  • Jo, Gwang-Jong;An, Seong-Jin;Jeong, Jin-Uk
    • The KIPS Transactions:PartC
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    • v.9C no.4
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    • pp.497-504
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    • 2002
  • This paper proposes fault diagnosis and correction algorithms using agent collaboration, and a management model for managing network configuration faults. This management model is composed of three processes-fault detection, fault diagnosis and fault correction. Each process, based on RBR, operates on using rules which are consisted in Rule-based Knowledge Database. Proposed algorithm selves the complex fault problem that a system could not work out by itself, using agent collaboration. And the algorithm does efficiently diagnose and correct network configuration faults in abnormal network states.

Fast and Memory Efficient Method for Optimal Concurrent Fault Simulator (동시 고장 시뮬레이터의 메모리효율 및 성능 향상에 대한 연구)

  • 김도윤;김규철
    • Proceedings of the IEEK Conference
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    • 1998.10a
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    • pp.719-722
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    • 1998
  • Fault simulation for large and complex sequential circuits is highly cpu-intensive task in the intergrated circuit design process. In this paper, we propose CM-SIM, a concurrent fault simulator which employs an optimal memory management strategy and simple list operations. CM-SIM removes inefficiencies and uses new dynamic memory management strategies, using contiguous array memory. Consequently, we got improved performance and reduced memory usage in concurrent fault simulation.

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Real-Time Fault Detection in Discrete Manufacturing Systems Via LSTM Model based on PLC Digital Control Signals (PLC 디지털 제어 신호를 통한 LSTM기반의 이산 생산 공정의 실시간 고장 상태 감지)

  • Song, Yong-Uk;Baek, Sujeong
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.44 no.2
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    • pp.115-123
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    • 2021
  • A lot of sensor and control signals is generated by an industrial controller and related internet-of-things in discrete manufacturing system. The acquired signals are such records indicating whether several process operations have been correctly conducted or not in the system, therefore they are usually composed of binary numbers. For example, once a certain sensor turns on, the corresponding value is changed from 0 to 1, and it means the process is finished the previous operation and ready to conduct next operation. If an actuator starts to move, the corresponding value is changed from 0 to 1 and it indicates the corresponding operation is been conducting. Because traditional fault detection approaches are generally conducted with analog sensor signals and the signals show stationary during normal operation states, it is not simple to identify whether the manufacturing process works properly via conventional fault detection methods. However, digital control signals collected from a programmable logic controller continuously vary during normal process operation in order to show inherent sequence information which indicates the conducting operation tasks. Therefore, in this research, it is proposed to a recurrent neural network-based fault detection approach for considering sequential patterns in normal states of the manufacturing process. Using the constructed long short-term memory based fault detection, it is possible to predict the next control signals and detect faulty states by compared the predicted and real control signals in real-time. We validated and verified the proposed fault detection methods using digital control signals which are collected from a laser marking process, and the method provide good detection performance only using binary values.