A Study on the Built-in Test Circuit Design for Parallel Testing of CAM(Content Addressable Memory) (CAM(Content Addressable Memory)의 병렬테스팅을 위한 Built-in 테스트회로 설계에 관한 연구)
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- The Journal of Korean Institute of Communications and Information Sciences
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- v.19 no.6
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- pp.1038-1045
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- 1994