• 제목/요약/키워드: Emitter series resistance

검색결과 18건 처리시간 0.021초

2차원 BJT의 전기적 특성 및 왜곡 해석 시뮬레이션 (Simulation for the analysis of distortion and electrical characteristics of a two-dimensional BJT)

  • 이종화;신윤권
    • 전자공학회논문지D
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    • 제35D권4호
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    • pp.84-92
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    • 1998
  • A program was developed to analyze the electrical characteristics and harmonic distrotion in a two-dimensional silicon BJT. The finite difference equations of the small signal and its second and thired harmonics for basic semiconductor equations are formulated treating the nonlinearity and time dependence with Volterra series and Taylor series. The soluations for three sets of simultaneous equations were obtained sequantially by a decoupled iteration method and each set was solved by a modified Stone's algorithm. Distortion magins and ac parameters such as input impedance and current gains are calculated with frequency and load resistance as parameters. The distortion margin vs. load resistancecurves show cancellation minima when the pahse of output voltage shifts. It is shown that the distortionof small signal characteristics can be reduced by reducing the base width, increasing the emitter stripe length and reducing the collector epitaxial layer doping concentration in the silicon BJT structure. The simulation program called TRADAP can be used for the design and optimization of transistors and circuits as well as for the calculation of small signal and distortion solutions.

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결정질 실리콘 태양전지의 전면 전극의 패턴에 따른 전류 밀도 및 특성 저항 변화에 대한 영향과 효율 변화 (Effect of Different Front Metal Design on Efficiency Affected by Series Resistance and Short Circuit Current Density in Crystalline Silicon Solar Cell)

  • 정수정;신승현;최동진;배수현;강윤묵;이해석;김동환
    • 한국재료학회지
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    • 제27권10호
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    • pp.518-523
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    • 2017
  • In commercial solar cells, the pattern of the front electrode is critical to effectively assemble the photo generated current. The power loss in solar cells caused by the front electrode was categorized as four types. First, losses due to the metallic resistance of the electrode. Second, losses due to the contact resistance of the electrode and emitter. Third, losses due to the emitter resistance when current flows through the emitter. Fourth, losses due to the shading effect of the front metal electrode, which has a high reflectance. In this paper, optimizing the number of finger on a $4{\times}4$ solar cell is demonstrated with known theory. We compared the short circuit current density and fill factor to evaluate the power loss from the front metal contact calculation result. By experiment, the short circuit current density($J_{sc}$), taken in each pattern as 37.61, 37.53, and $37.38mA/cm^2$ decreased as the number of fingers increased. The fill factor(FF), measured in each pattern as 0.7745, 0.7782 and 0.7843 increased as number of fingers increased. The results suggested that the efficiency(Eff) was measured in each pattern as 17.51, 17.81, and 17.84 %. Throughout this study, the short-circuit current densities($J_{sc}$) and fill factor(FF) varied according to the number of fingers in the front metal pattern. The effects on the efficiency of the two factors were also investigated.

에피텍셜 베이스 실리콘 태양전지에서 Buried Contact 효과 (Effect of Buried Contact on the Epitaxial Base Silicon Solar Cell)

  • 장지근;임용규;정진철
    • 한국재료학회지
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    • 제13권5호
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    • pp.313-316
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    • 2003
  • The new epitaxial base cell as a high efficiency Si solar cell was fabricated and the effect of buried contact on the cell characteristics was investigated. In our experiments, the cell with buried contact showed the open circuit voltage of 0.62 V, the short circuit current of 40 mA, the fill factor of 0.7, and the efficiency of 10% under the incident light of AM-1 100 ㎽/$\textrm{cm}^2$. The insertion of buried contact in the epitaxial base structure brought the fabricated cell to the efficiency improvement of about 33%. The cell proposed in this paper has the structural superiority in the fabrication of high efficiency solar cell due to the carrier drift transport in the optical absorption region and the formation of back surface field by $p^{-}$ $p^{+}$ epitaxial base, and the reduction of emitter series resistance by n+ buried contact.

Textured 표면을 갖는 에피텍셜 베이스 실리콘 태양전지 (Textured Surface Epitaxial Base Silicon Solar Cell)

  • 장지근;임용규;정진철
    • 마이크로전자및패키징학회지
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    • 제10권2호
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    • pp.33-37
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    • 2003
  • Si 태양전지의 효율 개선을 위해 textured 표면을 갖는 에피텍셜 베이스 전지(TSEB)를 제작하고 이의 전기광학적 특성을 조사하였다. 제작된 전지는 AM-1 100 mW/$cm^2$ 입사광 아래에서 개방전압이 0.62 V로, 단락전류가 40 mA로, 충실도가 0.7, 전력변환 효율이 16%로 나타났다. 본 연구에서 제안된 전지는 $P^-/P^+$ 에피구조에 의한 광흡수 영역에서 캐리어의 드리프트 이동과 효과적 배면전계의 형성, 그리고 buried contact을 통한 낮은 직렬저항 등으로 인해 고효율 Si 태양전지의 제작에 적합한 구조로 판단된다.

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Si 태양전지(太陽電池)의 표면재결합(表面再結合) 전류(電流)가 포화전류(飽和電流)에 미치는 영향(影響) (The Effect of Surface Recombination Current on the Saturation Current in Si Solar Cell)

  • 신기식;이기선;최병호
    • 태양에너지
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    • 제8권2호
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    • pp.12-18
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    • 1988
  • The effect of surface recombination current density on the saturation current density in Si solar cell has been studied. Theoretical model for surface recombination current was set up from emitter transparent model of M.A. Shibib, and saturation current of Si solar cell made by ion implantation method was also measured by digital electrometer. The theoretical surface recombination current density which is the same as saturation surface recombination current density in Shibib model was $10^{-11}[A/cm^2]$ and the measured value was ranged from $8{\times}10^{-10}$ to $2{\times}10^{-9}[A/cm^2]$. Comparing with the ideal p-n junction of Shockley, transparent emitter model shows improved result by $10^2$ order of saturation current density. But there still exists $10^2$ order of difference of saturation current density between theoretical and actual values, which are assumed to be caused by 1) leakage current through solar cell edge, 2) recombination of carriers in the depletion layer, 3) the series resistance effect and 4) the tunneling of carriers between states in the band gap.

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MOCVD를 이용한 화합물 반도체 Solar Cell의 개발-Field Aided Heteroface 전지 (Design and Fabrication of Compound Semiconductor Solar Cells Grown by MOCVD-Field Aided Heteroface Cell)

  • 창기근;엄우용;임성규
    • 전자공학회논문지A
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    • 제28A권9호
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    • pp.752-760
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    • 1991
  • The computer aided analysis is performed to investigate the influence of physical parameters (thickness and doping concentration, etc.) in the window, emitter, base on the efficiency characteristics of a uniformly doped hetroface cell. A field aided heteroface cell is newly designed on a basis of optimum data obtained from the theoretical analysis. The field aided heteroface cell fabricated using MOCVD exhibits a total/active area conversion efficiency of EFF. (tot) = 18.9% /EFF. (act.) = 21.4% under the natural incident light of 56.2 mW/cm\ulcorner having a low series resistance of Rs = 0.94 \ulcornercm\ulcornerand a high spectral response of S.R. (ext) > 90% in a range of $7700{\AA}$ < $8500{\AA}$.

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실리콘 태양전지의 금속전극 특성 (Characteristics of metal contact for silicon solar cells)

  • 조은철;김동섭;민요셉;조영현;;이수홍
    • 태양에너지
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    • 제17권1호
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    • pp.59-66
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    • 1997
  • 개방전압과 단락전류와 같은 태양전지 출력변수들은 접합깊이, 도핑농도, 금속접합 및 태양전지구조에 의한 변수들이다. 태양전지 설계의 중요한 요소로서 인이 도핑된 에미터와 금속사이의 금속접합은 일함수 차이가 작아 낮은 직렬저항을 가져야 한다. PESC 태양전지는 금속 접합장벽 전극으로 티타늄을 사용한다. 새로운 접합장벽 전극물질로 티타늄과 일함수가 비슷하지만 전기전도도가 우수한 크롬은 금속 접합장벽 전극으로 유망한 금속이다. 티타늄은 일함수 차가 작지만, 접합장벽으로 크롬은 태양전지 제조시 티타늄보다 우수한 전기적 특성들을 갖는다. 본 논문에서는 실리콘 태양전지의 접합장벽 금속전극의 특성을 비교 분석하였다.

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PERC 태양전지에서 반사방지막과 p-n 접합 사이에 삽입된 SiOx 층의 두께가 Potential-Induced Degradation (PID) 저감에 미치는 영향 (Thickness Effect of SiOx Layer Inserted between Anti-Reflection Coating and p-n Junction on Potential-Induced Degradation (PID) of PERC Solar Cells)

  • 정동욱;오경석;장은진;천성일;유상우
    • 마이크로전자및패키징학회지
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    • 제26권3호
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    • pp.75-80
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    • 2019
  • 친환경 및 고효율의 장점 때문에 신재생 에너지원으로 널리 사용되고 있는 실리콘 태양 전지는 모듈을 직렬 연결하여 발전할 때 500-1,500 V의 전압이 걸리게 된다. 모듈 프레임과 태양 전지 사이에 걸린 이러한 고전압 차에 의해 장시간 가동시 효율 및 최대 출력이 감소하는 현상인 potential-induced degradation(PID)은 실리콘 태양 전지의 수명을 단축시키는 주요 원인 중 하나로 알려져 있다. 특별히 전면 유리의 $Na^+$ 이온이 고전압에 의해 반사방지막을 거쳐 실리콘 내부로 확산하여 실리콘 내부 적층 결함 등에 축적되는 것이 PID의 원인으로 보고되고 있다. 본 연구에서는 p-형 PERC(passivated emitter and rear contact) 구조 실리콘 태양전지를 대상으로 $Na^+$ 이온의 확산 장벽으로 작용할 수 있는 $SiO_x$층이 p-n 접합과 반사방지막 사이에 삽입되었을 때 그 두께가 PID 현상 완화에 미치는 영향을 연구하였다. 96 시간 동안 1,000 V의 전압을 연속적으로 가한 후 병렬 저항, 효율 및 최대 출력을 측정한 결과 삽입된 $SiO_x$ 장벽층의 두께가 7-8 nm 이상일 때 비로소 PID 현상이 효과적으로 완화되는 것으로 나타났다.