• Title/Summary/Keyword: Electron-Beam

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Electron Emission Mechanism in the Surface Conduction Electron Emitter Displays

  • Cho, Guang-Sup;Choi, Eun-Ha;Kim, Young-Guon;Kim, Dai-Il
    • 한국정보디스플레이학회:학술대회논문집
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    • 2000.01a
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    • pp.139-140
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    • 2000
  • The origin of the display current in the surface conduction electron emitter displays has been verified in the calculation of the electron trajectory. Some electrons move directly toward the display surface as an anode current which is generated due to the inertial force of electron motion along the curved electric field lines with a small curvature near the fissure area..

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Finite Element Analysis for Electron Optical System of a Thermionic SEM (열전자방사형 주사전자 현미경 전자광학계의 유한요소해석)

  • Park, Keun;Jung, Huen-U.;Kim, Dong-Hwan;Jang, Dong-Young
    • Proceedings of the KSME Conference
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    • 2007.05a
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    • pp.1288-1293
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    • 2007
  • The present study covers the design and analysis of a thermionic scanning electron microscope (SEM) column. The SEM column contains an electron optical system in which electrons are emitted and moved to form a focused beam, and this generates secondary electrons from the specimen surfaces, eventually making an image. The electron optical system mainly consists of a thermionic electron gun as the beam source, the lens system, the electron control unit, and the vacuum unit. In the design process, the dimension and capacity of the SEM components need to be optimally determined with the aid of finite element analyses. Considering the geometry of the filament, a three-dimensional (3D) finite element analysis is utilized. Through the analysis, the beam emission characteristics and relevant trajectories are predicted from which a systematic design of the electron optical system is enabled. The validity of the proposed 3D analysis is also discussed by comparing the directional beam spot radius. As a result, a prototype of a thermionic SEM is successfully developed with a relatively short time and low investment costs, which proves the adoptability of the proposed 3D analysis.

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Sterilizing Effect of Electron Beam on Ginseng Powders (Electron Beam 조사에 의한 인삼분말의 살균효과)

  • Lee, Mi-Kyung;Lee, Moo-Ha;Kwon, Joong-Ho
    • Korean Journal of Food Science and Technology
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    • v.30 no.6
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    • pp.1362-1366
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    • 1998
  • The sterilizing effect of electron beam was compared with that of gamma irradiation for commercial ginseng powders. White and red ginseng powders were contaminated by about $10^5\;CFU/g$ of total bacteria and by $10^3\;CFU$ of coliforms only in white ginseng powder. Data of microbial population for the sterilizing effect of electron beam irradiation showed that no microorganisms were detected in the samples irradiated up to 7.5 kGy for total aerobic bacteria and 2.5 kGy for molds and coliforms. Such doses were effective for controlling the microbial growth in the samples during 4 months of storage at room temperature. Decimal reduction doses $(D_{10}$ value) on the initial bacterial populations were $2.85{\sim}3.75\;kGy$ in electron beam and $2.33{\sim}2.44\;kGy$ in gamma irradiation, which were influenced by the initial microbial loads and the energy applied. Compared with gamma irradiation, electron beam showed a similar result in its sterilizing effect on ginseng powders, suggesting its potential utilization in due time.

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A Study on the Lead(Pb) Shield Thickness per Electron Beam Energy in Radiotherapy (방사선 치료용 전자선의 에너지별 납(Pb) 차폐체 두께 측정)

  • Gha-Jung, Kim
    • Journal of the Korean Society of Radiology
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    • v.16 no.6
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    • pp.719-725
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    • 2022
  • This study aimed to measure, quantitatively evaluate, and set the criteria for the minimum lead(Pb) shield thickness per level of clinically applied electron beam energy. The lead shield thickness per electron beam energy was measured using the primary field 95% reduction based on the open field at the depth of maximum dose (dmax) and depth from the surface as the reference depth of tissue dose(10 mm). The measured values were 1.906 mmPb and 1.992 mmPb at the dmax and 10 mm, respectively, regarding the lead shield thickness for 6 MeV electron beam; 2.746 mmPb and 3.743 mmPb for 9 MeV electron beam, 3.718 mmPb and 6.093 mmPb for 12 MeV electron beam, 7.300 mmPb and 15.270 mmPb for 16 MeV electron beam, and 16.825 mmPb and 25.090 mmPb for 20 MeV electron beam. Consequently, a thicker lead shield was required if the measurement was at 10 mm. The required lead shield thickness was also higher than that of the theoretical formula for electron beams of ≥ 16 MeV.

Influence of surface geometrical structures on the secondary electron emission coefficient $({\gamma})$ of MgO protective layer

  • Park, W.B.;Lim, J.Y.;Oh, J.S.;Jeong, H.S.;Jeong, J.C.;Kim, S.B.;Cho, I.R.;Cho, J.W.;Kang, S.O.;Choi, E.H.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.806-809
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    • 2003
  • Ion-induced secondary electron emission coefficient $({\gamma})$. of the patterned MgO thin film with geometrical structures has been measured by ${\gamma}$ - FIB(focused ion beam) system. The patterned MgO thin film with geometrical structures has been formed by the mask (mesh of ${\sim}$ $10{\mu}m^{2})$ under electron beam evaporation method. It is found that the higher ${\gamma}$. has been achieved by the patterned MgO thin film than the normal ones without patterning.

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Nutritional Quality of Restructured Pork Jerky with Electron Beam and Gamma Ray Irradiation (방사선 조사된 재구성 돈육포의 단백질 품질)

  • Oh, Jong-Suk;Han, In-Jun;Lee, Ju-Woon;Chun, Soon-Sil;Kim, Yoon-Hee;Ryu, Hong-Soo
    • Journal of the East Asian Society of Dietary Life
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    • v.18 no.6
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    • pp.1056-1062
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    • 2008
  • To evaluate the effect of irradiation on restructured pork jerky containing paprika and Japanese apricot extracts, the quality of protein was determined in vitro based on the formation of trypsin indigestible substrate inhibitor (TIS) and the computed protein efficiency ratio (C-PER) as determined based on the protein digestibility and amino acid analysis. In addition, we compared the effects of electron beam irradiation to those of gamma irradiation. Approximately 3% of the moisture content of pork jerky was reduced in response to irradiation with 3kGy administered using an electron beam however, no additional reduction was observed in samples that were subjected to higher doses of irradiation. In addition, there were no notable differences in the crude protein and fat content of pork jerky samples that were subjected to irradiation, regardless of dose. Furthermore, the total amino acids profiles did not change in response to electron beam irradiation. However, the in vitro protein digestibility increased by 7% in response to 3kGy of electron beam irradiation and 5kGy of gamma irradiation, but no significant changes in digestibility were not observed in response to treatment with higher doses. TIS quantified as trypsin inhibitors were formed in response to irradiation using the electron beam (3kGy) and gamma rays (5kGy), although there was a slight reduction in the production of TIS inhibitors in samples irradiated with higher doses. Moreover, only samples irradiated with 10kGy (electron beam and gamma ray) showed higher TBA values than those of the control samples. Finally, the C-PERs $(2.50{\sim}2.60)$ were greater in all of the irradiated pork jerky samples than in the control samples (2.22). Taken together, these results suggest that electron beam irradiation and the incorporation of extracts (paprika and Japanese apricot) may be useful methods of improving the nutritional quality of pork jerky.

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Damage of Minerals in the Preparation of Thin Slice Using Focused Ion Beam for Transmission Electron Microscopy (투과전자현미경분석용 박편 제작 시 집속이온빔에 의한 광물 손상)

  • Jeong, Gi Young
    • Journal of the Mineralogical Society of Korea
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    • v.28 no.4
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    • pp.293-297
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    • 2015
  • Focused ion beam (FIB) technique is widely used in the precise preparation of thin slices for the transmission electron microscopic (TEM) observation of target area of the minerals and geological materials. However, structural damages and artifacts by the Ga ion beam as well as electron beam damage are major difficulties in the TEM analyses. TEM analyses of the mineral samples showed the amorphization of quartz and feldspar, curtain effect, and Ga contamination, particularly near the grain edges and relatively thin regions. Although the ion beam damage could be much reduced by the improved procedures including the adjustment of the acceleration voltage and current, the ion beam damage and contamination are likely inevitable, thus requiring careful interpretation of the micro-structural and micro-chemical features observed by TEM analyses.