• Title/Summary/Keyword: Electron edge

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Monte Carlo-based identification of electron and proton edges for calibration of miniaturized tissue equivalent proportional counter

  • Mingi Eom;Sukwon Youn;Sung-Joon Ye
    • Nuclear Engineering and Technology
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    • v.55 no.11
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    • pp.4167-4172
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    • 2023
  • Miniaturized tissue equivalent proportional counters (mini-TEPCs) are proper for radiation dosimetry in medical application because the small size of the dosimeter could prevent pile-up effect under the high intensity of therapeutic beam. However, traditional methods of calibrating mini-TEPCs using internal alpha sources are not feasible due to their small size. In this study, we investigated the use of electron and proton edges on Monte Carlo-generated lineal energy spectra as markers for calibrating a 0.9 mm diameter and length mini-TEPC. Three possible markers for each spectrum were calculated and compared using different simulation tools. Our simulations showed that the electron edge markers were more consistent across different simulation tools than the proton edge markers, which showed greater variation due to differences in the microdosimetric spectra. In most cases, the second marker, yδδ, had the smallest uncertainty. Our findings suggest that the lineal energy spectra from mini-TEPCs can be calibrated using Monte Carlo simulations that closely resemble real-world detector and source geometries.

Performance Experiment of Electron Beam Convergence Instrument (Finishing 용 전자빔 집속 장치의 성능 실험)

  • Lim, Sun Jong
    • Laser Solutions
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    • v.18 no.3
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    • pp.6-8
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    • 2015
  • Finishing process includes deburring, polishing and edge radiusing. It improves the surface profile of specimen and eliminates the alien substance on surface. Deburring is the elimination process for debris of edges. Polishing lubricates surfaces by rubbing or chemical treatment. There are two types for electron finishing. The one is using pulse beam. The other is using the convergent and scanning electron beam. Pulse type device appropriates the large area process. But it does not control the beam dosage. Scanning type device has advantages for dosage control and edge deburring. We design the convergence and scan type. It has magnetic lenses for convergence and scan device for scanning beam. Magnetic lenses consist of convergent and objective lens. The lenses are designed by the specification(beam size and working distance). In this paper, we evaluate the convergence performance by pattern process. Also, we analysis the results and important factors for process. The important factors for process are beam size, pressure, stage speed and vacuum. These results will be utilized into systematizing pattern shape and the factors.

Detail relation of negative ion density with positive ion mass and sheath parameters

  • Kim, Hye-Ran;Woo, Hyun-Jong;Sun, Jong-Ho;Chung, Kyu-Sun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.470-470
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    • 2010
  • Negative ions are generated in fusion edge plasmas, material processing plasmas, ionospheric plasmas. Analytic formulas for the deduction of the absolute density of negative ions was given by using the current-voltage(IV) characteristics of two electric probes at two different pressures [1], and negative ion density has been measured by one electric probe using the current-voltage characteristics of three different pressures [2]. Ratios of ion and electron saturation currents and electron temperatures and sheath areas of different pressures are usually incorporated into two equations with two unknowns for the negative ion density. In the previous publications, the sheath factor(sheath area, sheath density, sheath velocity) and effective masses of background ions with different pressures are qualitatively incorporated for the deduction of negative density. In this presentation, the quantitative and detailed relation of negative ion density with sheath factor and effective masses are going to be given. The effect of these parameters on the change of IV characteristics will be addressed.

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Pulse electric field-excited electron emission from Pb$(Zr_xTi_{1-x})O_3$ ceramics prepared by conventional solid state reaction (고상 반응법에 의해 제조된 Pb$(Zr_xTi_{1-x})O_3$ 세라믹스에서 펄스 전계에 의한 전자 방출)

  • Kwak, Sang-Hee;Kim, Tae-Heui;Park, Kyung-Bong;Kim, Chang-Soo
    • Proceedings of the KIEE Conference
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    • 1999.07d
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    • pp.1867-1869
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    • 1999
  • Pulse electric field induced electron emission from ferroelectrics has been studied with Pb$(Zr_xTi_{1-x})O_3$ ceramics with varying Zr/Ti ratio from 35/65 to 65/35, Electron emission was proved to be concentrated on the electrode edge by emission profile test and emission capture photographs. The 65/35 composition showed largest emission charge in lowest field and lowest emission threshold field. The emission characteristics are closely dependent on their ferroelectric properties in hysteresis curve. Electron emission charge increases with the polarization charge and emission threshold voltage is dependent on coercive field regardless of their composition. But dielectric constant has little relation with emission property. Electron emission charge increases exponentially with pulse electric field irrespective of composition. On the assumption that the surface potential is linear with the pulse electric field, electron emission can be regarded as a field emission at the electrode edge using Fowler-Nordheim plot of ln$(Q_e/E_{fe})$ to $1/E_{fe}$.

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A Study on the Electron Transfer at the Alq3/Ba and Alq3/Au Interfaces by NEXAFS Spectroscopy (NEXAFS 분광법에 의한 Alq3/Ba과 Alq3/Au의 계면에서의 전자 천이에 관한 연구)

  • Lim, Su-Yong;Ju, Sung-Hoo;Yang, Jae-Woong
    • Journal of Surface Science and Engineering
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    • v.45 no.1
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    • pp.15-19
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    • 2012
  • Tris(8-quinolinolato)aluminum(III); $Alq_3$ has been frequently used as an electron transporting layer in organic light-emitting diodes. Either Ba with a low work function or Au with a high work function was deposited on $Alq_3$ layer in vacuum. And then, the behaviors of electron transition at the $Alq_3$/Ba and $Alq_3$/Au interfaces were investigated by using the near edge x-ray absorption fine structure (NEXAFS) spectroscopy. In the each interface, the energy levels of unoccupied obitals were assigned as ${\pi}^*$(LUMO, LUMO+1, LUMO+2 and LUMO+3) and ${\sigma}^*$. And the relative intensities of these peaks were investigated. In an oxygen atom composing $Alq_3$ molecule, the relative intensities for a transition from K-edge to LUMO+2 were largely increased as Ba coverage (${\Theta}_{Ba}$, 2.7 eV) with a low work function was in-situ sequentially increased on $Alq_3$ layer. In contrast, the relative intensities for the LUMO+2 peak were reduced as Au coverage (${\Theta}_{Au}$, 5.1 eV) with a high work function were increased on $Alq_3$ layer. This means that the electron transition by photon in oxygen atom which consists in the unoccupied orbitals in $Alq_3$ molecule, largely depends on work function of a metal. Meanwhile, in the case of electron transition in a carbon atom, as ${\Theta}_{Ba}$ was increased on $Alq_3$, the relative intensity from K-edge to ${\pi}_1{^*}$ (LUMO and LUMO+1) was slightly decreased, and from K-edge to ${\pi}_2{^*}$ (LUMO+2 and LUMO+3) was somewhat increased. This rising of the energy state from ${\pi}_1{^*}$ to ${\pi}_2{^*}$ exhibits that electrons provided by Ba would contribute to the process of electron transition in the $Alq_3$/Ba interfaces. As shown in above observation, the analyses of NEXAFS spectra in each interface could be important as a basic data to understand the process of electron transition by photon in pure organic materials.

Cyclic fatigue, bending resistance, and surface roughness of ProTaper Gold and EdgeEvolve files in canals with single- and double-curvature

  • Khalil, Wafaa A.;Natto, Zuhair S.
    • Restorative Dentistry and Endodontics
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    • v.44 no.2
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    • pp.19.1-19.9
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    • 2019
  • Objectives: The purpose of this study was to evaluate the cyclic fatigue, bending resistance, and surface roughness of EdgeEvolve (EdgeEndo) and ProTaper Gold (Dentsply Tulsa Dental Specialties) nickel-titanium (NiTi) rotary files. Materials and Methods: The instruments (n = 15/each) were tested for cyclic fatigue in single- ($60^{\circ}$ curvature, 5-mm radius) and double-curved (coronal curvature $60^{\circ}$, 5-mm radius, and apical curvature of $30^{\circ}$ and 2-mm radius) artificial canals. The number of cycles to fracture was calculated. The bending resistance of both files were tested using a universal testing machine where the files were bent until reach $45^{\circ}$. Scanning electron microscopy and x-ray energy-dispersive spectrometric analysis were used for imaging the fractured segments, while the atomic force microscope was used to quantify the surface roughness average (Ra). Results: EdgeEvolve files exhibited higher cyclic fatigue resistance than ProTaper Gold files in single- and double-curved canals (p < 0.05) and both files were more resistant to cyclic fatigue in single-curved canals than double-curved canals (p < 0.05). EdgeEvolve files exhibited significantly more flexibility than did ProTaper Gold files (p < 0.05). Both files had approximately similar Ni and Ti contents (p > 0.05). EdgeEvolve files showed significantly lower Ra values than ProTaper Gold files (p < 0.05). Conclusions: Within the limitation of this study, EdgeEvolve files exhibited significantly higher cyclic fatigue resistance than ProTaper Gold files in both single- and double-curved canals.

No-reference Sharpness Index for Scanning Electron Microscopy Images Based on Dark Channel Prior

  • Li, Qiaoyue;Li, Leida;Lu, Zhaolin;Zhou, Yu;Zhu, Hancheng
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.13 no.5
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    • pp.2529-2543
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    • 2019
  • Scanning electron microscopy (SEM) image can link with the microscopic world through reflecting interaction between electrons and materials. The SEM images are easily subject to blurring distortions during the imaging process. Inspired by the fact that dark channel prior captures the changes to blurred SEM images caused by the blur process, we propose a method to evaluate the SEM images sharpness based on the dark channel prior. A SEM image database is first established with mean opinion score collected as ground truth. For the quality assessment of the SEM image, the dark channel map is generated. Since blurring is typically characterized by the spread of edge, edge of dark channel map is extracted. Then noise is removed by an edge-preserving filter. Finally, the maximum gradient and the average gradient of image are combined to generate the final sharpness score. The experimental results on the SEM blurred image database show that the proposed algorithm outperforms both the existing state-of-the-art image sharpness metrics and the general-purpose no-reference quality metrics.

Automatic Inspection of Assembly Tolerances of Cathod Ray Electron Guns by Vision Probe (비젼프로브를 이용한 CRT 전자총의 자동치수 검사)

  • Park, H.G.;Park, M.C.;Kim, S.W.
    • Journal of the Korean Society for Precision Engineering
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    • v.14 no.10
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    • pp.28-34
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    • 1997
  • This paper describes an automatic measurement method for the in-line inspection of assembly tolerances of cathod ray electron guns. The method uses an optical microscope with a CCD camera as a probe. An automatic gap recognition algorthm with digital image processing and a new software autofocus algorithm based on using an optimal edge detector have been developed to improve the measuring accuracy. An inspection system has been proposed and practically implemented for in-line inspection to a real factory automation line. The inspection system consists of a gap inspection part and an eyelet. Total time consumed for inspecting all measuring items is about 10 seconds and the repeatability is below .+-. 5 .mu. m

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