• 제목/요약/키워드: ESPI(electronic speckle pattern interferometry)

검색결과 114건 처리시간 0.025초

3D-ESPI 시스템을 이용하여 결정된 응력집중계수가 피로수명에 미치는 영향에 관한 연구

  • 김성찬
    • 선박안전
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    • 제12권
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    • pp.36-43
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    • 2003
  • Fatigue life estimation by the theoretical stress concentration factors are, in general, considerably different from test results. And in calculating stress concentration factor, it is very difficult to consider actual geometry and material property which are the notch shapes, imperfections or defects of materials such as porosities inclusions and casting defects, etc. Therefore, the paper deals with the experimental method to find out the more exact stress concentration factors by measuring the strain distributions on each specimen by 3D-ESPI(Electronic Speckle Pattern Interferometry) System. Then the fatigue lives are compared between theoretical calculations using stress concentration factors determined by 3D-ESPI system and fatigue test results

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전자 스체클 패턴 간섭법을 이용한 반경방향 대칭 유체의 정량적 가시화 및 물성치 측정에 관한 연구 (A Study on Quantitative Visualization and Measurement of Physical Properties of Radial Symmetric Fluids Using Electronic Speckle Pattern Interferometry)

  • 강영준;채희창;김경석
    • 대한기계학회논문집A
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    • 제26권2호
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    • pp.217-224
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    • 2002
  • It is very important to measure and visualize the changes in the physical properties of fluid flow because this is the foundation of measurement techniques used in aerodynamics, heat transfer, plasma diagnostics, and stress analysis of transparent models. The optical methods are advantageous over probe-based techniques in the optical methods are of high speed, non-contact and are capable of providing full-field results with high spatial resolution. Therefore we propose the electronic speckle pattern interferometry(ESPI) that gives us a solution to overcome those limitations. In this paper the experimental results show qualitative and quantitative visualization of changes in the physical properties of the candle and alcohol lamp with 3D plotting. And we obtained the refractive index, mass density and temperature distribution of fluids. The results clearly show the process of flow phenomena and give the feasibility of quantitative interpretation of gasdynamics.

레이저 스페클 간섭법을 이용한 반도체 패키지의 비파괴검사 (Non-destructive Inspection of Semiconductor Package by Laser Speckle Interferometry)

  • 김경석;양광영;강기수;최정구;이항서
    • 비파괴검사학회지
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    • 제25권2호
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    • pp.81-86
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    • 2005
  • 본 논문에서는 반도체 패키지 내부결함의 비파괴 정량평가를 위한 ESPI 기법을 이용한 시스템 및 검사기 법을 제안하고 있으며, 검사시스템은 ESPI 검사장치, 열변형유도장치, 단열챔버로 구성되어있다. 기존 초음파, X-ray 기반의 검사기법에 비하여 측정시간 및 검사방법이 용이하며, 결함의 정량검출이 가능하다는 장점이 있다. 검사결과에서 대부분의 결함이 열 방출이 많은 칩 주위에서 박리결함으로 나타났으며, 원인은 층간 접착강도의 약화와 열분배 설계에서 문제점인 것으로 사료된다.

무잔류 응력상태 결정을 통한 표면 잔류응력장 평가에의 레이저 간섭계 적용 (Application of Laser Interferometry for Assessment of Surface Residual Stress by Determination of Stress-free State)

  • 김동원;이낙규;나경환;권동일
    • 반도체디스플레이기술학회지
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    • 제3권2호
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    • pp.35-40
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    • 2004
  • The total relaxed stress in annealing and the thermal strain/stress were obtained from the identification of the residual stress-free state using electronic speckle pattern interferometry (ESPI). The residual stress fields in case of both single and film / substrate systems were modeled using the thermo-elastic theory and the relationship between relaxed stresses and displacements. We mapped the surface residual stress fields on the indented bulk Cu and the 0.5 $\mu\textrm{m}$ Au film by ESPI. In indented Cu, the normal and shear residual stress are distributed over -1.7 GPa to 700 MPa and -800 GPa to 600 MPa respectively around the indented point and in deposited Au film on Si wafer, the tensile residual stress is uniformly distributed on the Au film from 500 MPa to 800 MPa. Also we measured the residual stress by the x-ray diffractometer (XRD) for the verification of above residual stress results by ESPI...

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직조 CFRP 복합재료 내부결함의 정량적 평가를 위한 Shearography 영상처리 기법 연구 (Study of Shearography Imaging for Quantity Evaluation Defects in Woven CFRP Composite Materials)

  • 최상우;이준현;이정호;변준형
    • 한국복합재료학회:학술대회논문집
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    • 한국복합재료학회 2001년도 춘계학술발표대회 논문집
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    • pp.211-214
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    • 2001
  • Electronic Speckle Pattern Interferometry(ESPI) is one of optical technique to measure displacement precisely, uses CCD camera to show result image in real time. General ESPI system measures in-plane or out-of-plane displacement. Shearography is one of electronic speckle pattern interferometric methods which allow full-field observation of surface displacement derivatives and it is robust in vibration. The shearography provides non-contacting technique of evaluating defects nondestructively. In this study, the shearography was used to evaluate defects in Carbon Fiber Reinforced Plastic(CFRP). Various sizes of artificial defects were embedded in various depths of woven CFRP plate. Effects due to the variation of size and depth of defects were evaluated in this study.

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ESPI를 이용한 충격손상을 받은 복합재료 내부결함의 정량평가 (Quantitative Evaluation of Impact Defects inside of Composite Material Plate by ESPI)

  • 김경석;양광영;장호섭;지창준;윤홍석
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 2003년도 추계학술대회
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    • pp.254-258
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    • 2003
  • Electronic Speckle Pattern for quantitative evaluation of a impact defect inside of composite material plate are described. The impact on composite material makes inside delamination which is difficult to detect visual inspection and ultrasonic testing due to non-homeogenous structure. This paper proposes the quantitative evaluation technique of defects under real impact. Artificial defects are designed inside of composite plate for development of inspection technique and real defects under impact are inspected and compared with results of visual inspection.

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CFRP에 내재된 결함의 비파괴 평가를 위한 Shearography기법 적용 (Application of Shearography for Nondestructive Evaluation of Internal Defects in CFRP)

  • 최상우;이준현
    • 한국신뢰성학회:학술대회논문집
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    • 한국신뢰성학회 2002년도 정기학술대회
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    • pp.245-251
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    • 2002
  • Electronic Speckle Pattern Interferometry(ESPI) is one of optical technique to measure displacement precisely, uses CCD camera to show result image in real time. General ESPI system measures in-plane or out-of-plane displacement. Shearography is one of electronic speckle pattern interferometric methods which allow full-field observation of surface displacement derivatives and it is robust in vibration. The shearography provides non-contacting technique of evaluating defects nondestructively In this study, the shearography was used to evaluate defects in Carbon Fiber Reinforced Plastic(CFRP). Various sizes of artificial defects were embedded in various depths of woven CFRP plate. Effects due to the variation of size and depth of defects were evaluated in this study.

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전자처리스페클패턴간섭법에 의한 평판의 Strain 해석에 관한 연구 (A Study on the Strain Analysis of Plane by Electronic Speckle Pattern Interferometry(ESPI))

  • 김경석;최형철;양승필;김형수;정재강;김동현
    • 비파괴검사학회지
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    • 제14권2호
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    • pp.101-111
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    • 1994
  • 전자처리스페클패턴간섭법을 CW 레이저에 비디오 시스템과 화상 처리 장치를 조합하여 평판의 변위를 측정하는데 이용하였다. 과거의 스트레인 게이지나 모아레법과는 달리 전자처리스페클패턴간섭법(ESPI)은 측정물에 아무런 처리를 할 필요가 없고, 완전한 비접촉 측정이 가능하며, 또한 감도가 높은 이점이 있다. 본 연구에서 사용한 시험편은 로드셀과 같은 방향으로 하중이 걸리도록 하였다. 시험편은 평판이고 스트레인 게이지를 부착하였다. 이 연구는 전자처리스페클패턴간섭법에 의해 변위와 응력 분포를 구하여 스트레인 게이지와의 비교함으로써 전자처리스페클패턴간섭법의 측정 정밀도에 대해 검토하고자 한다.

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In-plane ESPI를 이용한 고온에서 STS430의 열팽창계수 측정 (Thermal Expansion Coefficient Measurement of STS430 at High Temperature by In-plane ESPI)

  • 김경석;강기수;장호섭
    • 한국정밀공학회지
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    • 제21권11호
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    • pp.69-74
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    • 2004
  • This paper presents ESPI system for the measurement of thermal expansion coefficient of STS430 up to 1,00$0^{\circ}C$ . Existing methods, strain gauge and moire have the limitation of contact to object and do not supply the coefficient up to 80$0^{\circ}C$ . There needs to measure the data up to 80$0^{\circ}C$, because heat resistant materials have high melting temperature up to 1,000'E In previous studies related to thermal strain analysis, the quantitative results have not reported by ESPI at high temperature, yet. In-plane ESPI and vacuum chamber for the reduction of air turbulence and oxidation are designed for the measurement of the coefficient up to 1,00$0^{\circ}C$ and speckle correlation fringe pattern images are processed by commercial image filtering tool-smoothing, thinning and enhancement- to obtain quantitative results, which is compared with references data. The comparison shows two data are agreed within 4.1% blow $600^{\circ}C$ however, there is some difference up to $600^{\circ}C$. Also, the incremental ratio of the coefficient is changed up to 80$0^{\circ}C$ . The reason is the phase transformation of STS430 probably begins at 80$0^{\circ}C$