• 제목/요약/키워드: Differential Circuit

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Analytical Analysis of PT Ferroresonance in the Transient-State (과도상태에서 PT 철공진의 해석적 분석)

  • Kang, Yong-Cheol;Lee, Byung-Eun;Zheng, Tai-Ying;Kim, Yeon-Hee
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.59 no.5
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    • pp.860-865
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    • 2010
  • When a circuit breaker is opened, a large capacitance around the buses, the circuit breaker and the potential transformer (PT) might cause PT ferroresonance. During PT ferroresonance, the iron core repeats saturation and unsaturation even though the supplied voltage is a rated voltage. This paper describes an analytical analysis of PT ferroresonance in the transient-state. To analyze ferroresonance analytically, the iron core is modelled by a simplified two-segment core model in this paper. Thus, a nonlinear ordinary differential equation (ODE) for the flux linkage is changed into a linear ODE with constant coefficients, which enables an analytical analysis. In this simplified model, each state, which is either saturated or unsaturated state, corresponds to one of the three modes, i.e. overdamping, critical damping and underdamping. The flux linkage and the voltage in each state are obtained analytically by solving the linear ODE with constant coefficients. The proposed transient analysis is effective in the more understanding of ferroresonance and thus can be used to design a ferroresonance prevention or suppression circuit of a PT.

Analysis of Conducted Differential Mode EMI in Flyback Converter (플라이백 컨버터의 Differential Mode 전도전자파장해 분석)

  • Min, S.H.;Lee, D.Y.;Cho, B.H.;Lee, B.H.
    • Proceedings of the KIEE Conference
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    • 1998.07f
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    • pp.1879-1881
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    • 1998
  • The conducted differential mode (DM) EMI in a flyback converter are analyzed. Circuit modeling of passive components and PCB pattern for the EMI simulation are presented. Using the model, high frequency noise path is analyzed. The analyses are verified with simulations by identifying the peakings of the EMI pattern.

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Dual-Level LVDS Technique for Reducing the Data Transmission Lines (전송선 감소를 위한 듀얼레벨 저전압 차동신호 전송(DLVDS) 기법)

  • Kim Doo-Hwan;Yang Sung-Hyun;Cho Kyoung-Rok
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.42 no.8 s.338
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    • pp.1-6
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    • 2005
  • A dual-level low voltage differential signalling (DLVDS) circuit is proposed aiming at reducing transmission lines for LCD driver IC. In the proposed circuit, we apply a couple of primitive data to DLVDS circuit as inputs. The transmitter converts two inputs to two kinds of fully differential level signals. In this circuit, two transmission lines are sufficient to transfer two primitive inputs while keeping the LVDS feature. The receiver recovers The original input data through a level decoding circuit. We fabricated the proposed circuit using $0.25\mu m$ CMOS technology. The resultant circuit shows 1-Gbps/2-line data rate and 35-mW power consumption at 2.5V supply voltage, respectively.

A Signal Process Circuit for ISFET Biosensor and A Desitgn for Their One-Chip Integration (ISFET 바이오센서에의 적용을 위한 신호처리회로의 개발과 그들의 단일칩 집적설계)

  • Hwa Il Seo;Won Hyeong Lee;Soo Won Kim
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.28A no.1
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    • pp.46-51
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    • 1991
  • The new signal process circuit using ISFETs as two input devices of a MOS differential amplifier stage for application to a ISFET biosensor was developed and its operational characteristics simulated. For a single chip integration of ISFETs, developed signal process circuit and metal reference electrode, serial studies including process development and chip layout was carried out.

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A Study on the Effect of Device Degradation Induced by Hot-Carrier to Analog Circuits (Hot-Carrier에 의한 소자 외쇠화가 아날로그 회로에 미치는 영향)

  • 류동렬;박종태;김봉렬
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.31A no.12
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    • pp.91-99
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    • 1994
  • We used CMOS current mirror and differenial amplifier to find out how the degradation of each devices in circuit affect total circuit performance. The devices in circuit wer degraded by hot-carrier generated during circuit operation and total circuit performance were changed according to the change of each device parameters. To examine the circuit performance phenomena of current mirror, we analyzed three diffent kinds of current mirrors and made correlation model between circuit performance and stressed device parameters, and compare hot-carrier immunity of these circuits. Also we analyzed how the performance of differential amplifier degraded from the initial value after hot-carrier stress incircuit operations.

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Analysis and Design Optimization of Interconnects for High-Speed LVDS Applications (고속 LVDS 응용을 위한 전송 접속 경로의 분석 및 설계 최적화)

  • Ryu, Jee-Youl;Noh, Seok-Ho
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2007.10a
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    • pp.761-764
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    • 2007
  • This paper addresses the analysis and the design optimization of differential interconnects for Low-Voltage Differential Signaling (LVDS) applications. Thanks to the differential transmission and the low voltage swing, LVDS offers high data rates and improved noise immunity with significantly reduced power consumption in data communications, high-resolution display, and flat panel display. We present an improved model and new equations to reduce impedance mismatch and signal degradation in cascaded interconnects using optimization of interconnect design parameters such as trace width, trace height and πace space in differential flexible printed circuit board (FPCB) transmission lines. We have carried out frequency-domain full-wave electromagnetic simulations, time-domain transient simulations, and S-parameter simulations to evaluate the high-frequency characteristics of the differential FPCB interconnects.

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A New Via Structure for Differential Signaling (차동 신호용 비아 구조)

  • Kim, Moon-Jung
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.48 no.2
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    • pp.61-66
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    • 2011
  • A new via structure on printed circuit board has been proposed for differential signaling in applications of high-speed interconnection. In new structure, the via is physically separated and then divided into two electrically-isolated sections using mechanical drill routing process. These cutted vias are connected respectively to the traces of the differential pair. New via structure makes possible to rout the differential pair using only one via, while conventional via structure needs two vias for interconnection. Because the spacing even in via region keeps almost constant, new via structure can alleviate an impedance discontinuity and then enhance its signal transmission characteristics such as reflection loss and insertion loss. It is expected that new via structure is effective in differential signaling for high-speed interconnection.

A study of SMOS line driver with large output swing (넓은 출력 범위를 갖는 CMOS line driver에 관한 연구)

  • 임태수;최태섭;사공석진
    • Journal of the Korean Institute of Telematics and Electronics S
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    • v.34S no.5
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    • pp.94-103
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    • 1997
  • It is necesary that analog buffer circuit should drive an external load in the VLSI design such as switched capacitor efilter (SCF), D/A converter, A/d converter, telecommunicatin circuit, etc. The conventional CMOS buffer circuit have many probvlems according as CMOS technique. Firstly, Capacity of large load ar enot able to opeate well. The problem can be solve to use class AB stages. But large load are operated a difficult, because an element of existing CMOS has a quadratic functional relation with inptu and outut voltage versus output current. Secondly, whole circuit of dynamic rang edecrease, because a range of inpt and output voltages go down according as increasing of intergration rate drop supply voltage. In this paper suggests that new differential CMOS line driver make out of operating an external of large load. In telecommunication's chip case transmission line could be a load. It is necessary that a load operate line driver. The proposal circuit is planned to hav ea high generation power rnage of voltage with preservin linearity. And circuit of capability is inspected through simulation program (HSPICE).

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Measurement of Compression Temperature in Cylinder by using the Compensation Circuit of Thermocouple (열전대 보상회로에 의한 실린더 내에서의 압축온도 측정)

  • Kwon, Soon-Ik
    • Journal of the Korean Society of Industry Convergence
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    • v.3 no.2
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    • pp.149-154
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    • 2000
  • The purpose of this study is to measure the compression temperature in cylinder by using the fine thermocouple. As for using the thermocouple, it's response time delay should be regarded, even if it is a fine one. So, the output of thermocouple needs some compensation. The compensation circuit, which consists of a differential and an adding circuit is used for the compensate the time lag. And the time constant of the compensation circuit is determined the time between the TDC and the maximum point of the thermocouple output. Using this compensation circuit, the compression temperature is investigated of the cylinder in the diesel engine.

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