• Title/Summary/Keyword: Device Profile

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A Self-Tuning PI Control System Design for the Flatness of Hot Strip in Finishing Mill Processes

  • Park, Jeong-Ju;Hong, Wan-Kee;Kim, Jong-Shik
    • Journal of Mechanical Science and Technology
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    • v.18 no.3
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    • pp.379-387
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    • 2004
  • A novel flatness sensing system which is called the Flatness Sensing Inter-stand Looper(FlatSIL) system is suggested and a self-tuning PI control system using the FlatSIL is designed for improving the flatness of hot strip in finishing mill processes. The FlatSIL system measures the tension along the direction of the strip width by using segmented rolls, and the tension profile is approximated through the tension of each segmented roll. The flatness control system is operated by using the tension profile. The proposed flatness control system as far as the tension profile-measuring device works for the full strip length during the strip rolling in finishing mills. The generalized minimum variance self-tuning (GMV S-T) PI control method is applied to control the flatness of hot strip which has a design parameter as weighting factor for updating the PI gains. Optimizing the design parameter in the GMV S-T PI controller, the Robbins-Monro algorithm is used. It is shown by the computer simulation and experiment that the proposed GMV S-T PI flatness control system has better performance than the fixed PI flatness control system.

3D TCAD Analysis of Hot-Carrier Degradation Mechanisms in 10 nm Node Input/Output Bulk FinFETs

  • Son, Dokyun;Jeon, Sangbin;Kang, Myounggon;Shin, Hyungcheol
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.16 no.2
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    • pp.191-197
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    • 2016
  • In this paper, we investigated the hotcarrier injection (HCI) mechanism, one of the most important reliability issues, in 10 nm node Input/Output (I/O) bulk FinFET. The FinFET has much intensive HCI damage in Fin-bottom region, while the HCI damage for planar device has relatively uniform behavior. The local damage behavior in the FinFET is due to the geometrical characteristics. Also, the HCI is significantly affected by doping profile, which could change the worst HCI bias condition. This work suggested comprehensive understanding of HCI mechanisms and the guideline of doping profile in 10 nm node I/O bulk FinFET.

Surface Profile Measuring System for Axial Fan of Cooling Towers (냉각탑용 축류팬 형상 정밀도 측정 시스템)

  • Kang Jae-Gwan;Lee Kwang-Il
    • Journal of the Korean Society for Precision Engineering
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    • v.22 no.4
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    • pp.151-158
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    • 2005
  • An important component of a cooling tower is an axial fan, and there happens distortion in its shape which brings significant loss of efficiency. In this paper, a surface profile measuring system for large size axial fan of cooling towers is developed. A laser sensor is used as a measuring device and aluminum profiles and stepping motors are engaged into the system as frame structure and driving devices respectively. The measuring data are compared to the design data to compute the distortion of the axial fans. Two types of errors, axial and twist errors, are used to represent the precision of axial fan distortion. Genetic algorithm is used to solve the optimization problem during computing the precision. Results are displayed three dimensionally in a solid-modeler as well as 2-D drawings to help users find it with ease.

Voltage Stability Enhancement by Optimal Placement of UPFC

  • Kowsalya, M.;Ray, K.K.;Shipurkar, Udai;Saranathan
    • Journal of Electrical Engineering and Technology
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    • v.4 no.3
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    • pp.310-314
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    • 2009
  • This paper presents the improvement of the voltage profiles of power system networks by the inclusion of Unified Power Flow Controller (UPFC). The mathematical model of the UPFC is incorporated in the load flow algorithm and the L-index is calculated for the different values of the control parameter r $and{\gamma}$. The positioning of the UPFC device is changed to minimize the sum of the squares of the L-indices at all load buses. The test cases considered for the improvement of voltage profile with the WSCC 9-bus and IEEE 30 bus system. With the best position of UPFC along with the control parameters the improvement in voltage profile of the power system networks are obtained. The results obtained are quite encouraging compared with other techniques used to identify the best location of UPFC.

A New Contactless Battery Charger Using Coupled Printed Circuit Board Windings (자기적으로 결합된 PCB권선을 이용한 무접점 배터리 충전기)

  • No, Jae-Hyeon;Cha, Heon-Nyeong;Choe, Byeong-Jo;An, Tae-Yeong
    • The Transactions of the Korean Institute of Electrical Engineers B
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    • v.51 no.1
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    • pp.16-22
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    • 2002
  • The Proposed contactless charger employs a Pair of neighboring Printed circuit board (PCB) windings as a contactless energy transfer device, thereby making it amenable to low-Profile designs and suitable for applications to the portable telecommunication/computing electroncis in which stringent requirements for height, space, and reliability have to be met. The performance of the proposed charger is confirmed with experiments on a prototype charger developed for cellular phones

A Proposal on Analyzing Operational Mission Summary/Mission Profile and RAM Goal Setting from Operational Concepts on the Next-MILSATCOM (차기 군 위성통신체계 OMS/MP 분석 및 운용개념으로부터의 RAM 목표값 산출 제안)

  • Park, Heung-Soon;Kwon, Tae-Wook;Lee, Chul-Hwa;Park, Dae-Hyun
    • Journal of the Korea Institute of Military Science and Technology
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    • v.16 no.3
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    • pp.295-303
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    • 2013
  • The Operational Mode Summary/Mission Profile(OMS/MP) is a document which describes how a system or training device will be used in wartime and/or peacetime at the time it is field with focus on the future. OMS/MP is also typically used for the RAM goal setting in an early phase of weapon system development. This paper provides OMS/MP and RAM goal of the Next-MILSATCOM which is following military satellite system after ANASIS. We propose operational concepts, user-side OMS/MP model and RAM goal.

Evaluation of Thin-Film Photodevices and Development of Artificial Retina

  • Kimura, Mutsumi;Shima, Takehiro;Yamashita, Takehiko;Nishizaki, Yoshitaka;Hara, Hiroyuki
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08b
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    • pp.1745-1748
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    • 2007
  • First, thin-film photodevices are evaluated, and a p/i/n thin-film phototransistor (TFPT) is recommended because the photo-induced current is relatively high and independent of the applied voltage. Next, an artificial retina is developed using the p/i/n TFPTs, and it is found that it can detect photo illuminance profile with sensitivity control.

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A Study on the On-machine Profile Measurement of Large Aspheric Form using Capasitive Sensor (정전용량센서를 이용한 대구경 비구면 형상의 기상측정에 관한 연구)

  • Kim, Geon-Hee;Won, Jonh-Ho
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.2 no.3
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    • pp.56-61
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    • 2003
  • This paper described about on-machine profile measurement of aspheric surfaces using contact probing technique in ultra precision machine. A contact probe has been designed as a sensing device to obtain measuring resolutions in nanometer regime using a circle leaf spring mechanism and a capacitive-type sensor. The contact probe which is installed on the z-axis is In touch with the aspheric objects which is fixed on the spindle of the diamond turning machine(DTM) during the measuring procedure. The x, z-axis motions of the machine are monitored by a set of two orthogonal plane mirror type laser interferometers. As a results, the developed contact probe on-machine measurement system showed 10 nanometers repeatability with a ${\pm}2{\sigma}$ and uncertainty of 200 nmPv.

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Design of Optical Disk Profile for Minimizing the Focusing Error (포커싱 에러를 최소화하기 위한 광디스크 형상설계)

  • Hong, Seok-Joon;Jee, Jung-Guen;Park, No-Cheol;Lee, Jongsoo;Park, Young-Pil
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 2002.11a
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    • pp.398.2-398
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    • 2002
  • Optical disk is the media which is used generally in data storage device, but it has a disadvantage in the vibration by the spinning and the shock. For overcoming these disadvantage, we must control the optical disk to minimize the focusing and tracking error. The present study investigates the disk profile fur minimizing the focusing error subjected to environmental shock and weight of the disk. (omitted)

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Contact Probing Technique for Profile Measurement of Aspheric Lenses (비구면 렌즈의 형상 측정을 위한 접촉식 프로브 기술 개발)

  • 유승봉;장인철;김승우
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2000.05a
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    • pp.603-606
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    • 2000
  • This dissertation is concerned with ultra-precision profile measurement of aspheric surfaces using contact probing technique. A contact probe has been designed as a sensing device to obtain measuring resolutions in nanometer regime utilizing a leaf spring mechanism and a capacitive-type sensor. The contact probe is attached on the z-axis during measurement while aspheric objects are supported on an precision xy-stage whose lateral motions are monitored by a set of two orthogonal plane mirror type laser interferometers. Experimental results show that the contact probing technique developed in this investigation is capable of providing a repeatability of 50 nanometers with a $\pm$3$\sigma$ uncertainty of 300 nanometers. Thermal disturbance is found the most significant factor that should be precisely controlled for accurate measurement.

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