• International Journal of Highway Engineering
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• v.19 no.2
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• pp.1-6
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• 2017

PURPOSES : Pavement textures can be categorized into four according to wavelength: microtexture, macrotexture, megatexture (roads), and roughness. Pavement surface texture influences a number of aspects of tire-pavement interaction such as wet-weather friction, tire-pavement noise, splash, spray, tire-wear, and rolling resistance. In particular, macrotexture is the pavement surface characteristic that considerably impacts tire-pavement noise. In general, it can be demonstrated that tire-pavement noise increases with the increase of texture depth and wavelength. Recently, mean profile depth (MPD) and wavelength have been used to evaluate tire-pavement noise. This study aimed to identify the relationship between mean profile depth and average wavelength for asphalt pavement based on the information obtained on a number of asphalt pavement sections. METHODS : Profile data were collected from a number of expressway sections in Korea. In addition, mean profile depth and average wavelength were calculated by using this profile data. Statistical analysis was performed to determine the correlationship between mean profile depth and average wavelength. RESULTS:This study demonstrates a linear relationship between mean profile depth and average wavelength for asphalt concrete pavement. CONCLUSIONS :The strong relationship between mean profile depth and average wavelength of asphalt pavement was determined in this study.

• Journal of the Korean Vacuum Society
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• v.10 no.2
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• pp.225-233
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• 2001

Distortion of Secondary Ion Mass Spectrometry(SIMS) depth profile, which is usually observed when the analysis is made using oxygen flooding on the surface of Si with oxide on it, has been corrected. The origin of distortion has been attributed to depth calibration error due to sputter rate difference and concentration calibration error due to relative sensitivity factor(RSF) difference between $SiO_2$ and Si layers, In order to correct depth calibration error, artifact in analysis of sodium ion on oxide was used to define the interface in SIMS depth profile and oxide thickness was measured with SEM and XPS. The differences of sputter rate and RSF between two layers have been attributed to volume swelling of Si substrate occurred by oxygen flooding induced oxidation. The corrected SIMS depth profiles showed almost the same results with those obtained without oxygen flooding.

• Journal of the Korean Institute of Telematics and Electronics T
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• v.35T no.3
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• pp.120-127
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• 1998

In this paper, ultrasonic images of 25MHz bandwidth were acquired by applying peak value variation, time average and depth profile algorithm to acoustic microscopy and its performance was compared and analysed with each other. In the time average algorithm, total reflecting pulse wave from a spot on the coin was converted to digital data in time domain and average value of the converted 512 data was calculated in computer. Time average image was displayed by gray levels colour of acquired N x N matrix average data in the scanning area on the sample. This technique having smoothing effects in time domain make developed an ultrasonic image on a highly scattering area. In depth profile technique, time difference between the reference and the reflected signal was detected with minimum resolution performance of 2ns, thus we can acquired real 3 dimensional shape of the scanning area in accordance with relative magnitude. Through these experiments, peak value, time average and depth profile images were analysed and advantages of each algorithm were proposed.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.08a
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• pp.188-188
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• 2010

동일한 에너지와 일정한 dose량을 유지하고 dose rate만을 변화시켜가며 이온을 Si(100) 표면에 주입하였다. 이러한 조건하에서 이온의 dose rate가 커지게 되면 시료 내에서 relaxation되는 시간이 짧아져서 damage의 양이 증가하게 되고 depth profile의 꼬리부분이 표면 쪽으로 올라오게 된다. 이와 같은 damage profile의 변화가 sheet resistance에 영향을 준다는 실험결과가 있다. 본 연구에서는 Crystal-TRIM computer simulation을 통해서 depth profile과 damage profile의 결과를 얻고, dose rate가 커질수록 시료표면 근방에 잔류 damage의 양이 높게 나타나는 것을 확인할 수 있다. 또한, 잔류 damage의 표면근방에서의 분포가 annealing 이후 sheet resistance를 변화시키는데 이에 대한 mechanism을 규명하고자 한다.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2007.04a
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• pp.61-62
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• 2007

low angle forward reflected neutral beam etching system으로 식각한 후 SIMS depth profile을 이용하여 에너지 침투 깊이에 따른 중성빔 에너지를 분석하여 중성화 과정에서 에너지와 flux의 손실이 있었다. 기존의 two-grid 대신에 three-grid를 사용하여 에너지의 변화없이 이온 flux 및 중성빔 flux가 향상됨을 알 수 있었다.

• Journal of The Geomorphological Association of Korea
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• v.26 no.4
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• pp.21-31
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• 2019

Timing of terrace formation is a key information for understanding the evolution of fluvial systems. In particular, dating strath terrace (i.e. timing of terrace abandonment) is more difficult than depositional terrace that is conventionally constrained by radiocarbon, OSL and other dating methods targeting samples within terrace deposit. Surface exposure dating utilizing cosmogenic ¹⁰Be provides more reliability because it can be applied directly to the surface of a fluvial terrace. Thus, this method has been increasingly used for alluvial deposits. As well as other geomorphic surfaces over the last decades. Some inherent conditions, however, such as post-depositional ¹⁰Be concentration (i.e. inheritance), surface erosion rate, and density change challenge the application of cosmogenic ¹⁰Be to depositional terrace surface against simple bedrock surface. Here we present the first application of ¹⁰Be depth profile dating to a thin-gravel covered strath terrace in Korea. Monte Carlo simulation (MCS) helped us in better constraining the timing of abandonment of the strath terrace, since which its surface stochastically denuded with time, causing unexpected change of ¹⁰Be production with depth. The age of the strath terrace estimated by MCS was 109 ka, ~4% older than the one (104 ka) calculated by simple depth profile dating, which yielded the best-fit surface erosion rate of 2.1 mm/ka. Our study demonstrates that the application of ¹⁰Be depth profile dating of strath terrace using MCS is more robust and reliable because it considers post-depositional change of initial conditions such as erosion rate.

• Journal of Korean Society of Water and Wastewater
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• v.21 no.3
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• pp.287-294
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• 2007

When we use the circular pipes for wastewater and storm water, we should be known the characteristics of the flow for accurate design. To elevate the design accuracy, we want to know the profile of flow. The roughness coefficient in the Manning equation is constant, but in actuality changed with the relative depth in circular pipe. This study was conducted to calculate the relative normal depth in changing the roughness coefficient (named relative roughness coefficient) with the relative depth in the analysis of gradually varied flow in the circular pipe by Newton-Raphson method. We performed the analysis of gradually varied flow using the relative normal depth and the relative roughness coefficient. We presented the 12 flow profiles with the relative depth and the relative roughness coefficient in circular pipe. The flow classification considering relative depth in circular pipe is available to analyse gradually varied flow profiles.

• Economic and Environmental Geology
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• v.26 no.1
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• pp.29-40
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• 1993

Several vermiculite deposits occur as the alteration product from phlogopite in ultramafic rock, in the Hongseong and Cheongyang area, South Korea. Some quarries show well-defined weathering profile. Samples collected from those quarries were examined by XRD and chemistry to define a vertical variations in mineralogy and chemistry of the weathering profile developed on ultramafic rocks. The analysis by X-ray diffractometry showed that mineral compositions changed continuously as depth of profile increasing, the vermiculite-the phlogopite/vermiculite interstratified-the phlogopite. Chemical analysis of bulk samples in altered zone revealed that regardless of composition and kinds of mineral in the rock, there are significant increase of MgO, CaO and $H_2O$, and decrease of K as depth of profile decrease reflecting the characteristics in vermiculitization. Also, there was a tendency that weathering indicies of each sample horizon change gradually with increasing depth. This tendency can be explained as variations of degree of vermiculitization. The regular changes of mineralogical and chemical composition in vertical profile suggest that weathering is the most important process in vermiculitization in this area.

• 한국태양에너지학회:학술대회논문집
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• 2011.11a
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• pp.149-153
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• 2011

The PC1D is widely used for modeling the properties of crystalline silicon solar cell. Optimized doping profile in crystalline silicon solar cell fabrication is necessary to obtain high conversion efficiency. Doping profile in the forms of a uniform, gaussian, exponential and erfc function can be simulated using the PC1D program. In this paper, the doping profiles including junction depth, dopant concentration on surface and the form of doping profile (gaussian, gaussian+erfc function) were changed to study its effect on electrical properties of solar cell. As decreasing junction depth and doping concentration on surface, electrical properties of solar cell were improved. The characteristics for the solar cells with doping profile using the combination of gaussian and erfc function showed better open-circuit voltage, short-circuit current and conversion efficiency.

• Journal of Welding and Joining
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• v.20 no.1
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• pp.62-68
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• 2002

This study investigated the feasibility of penetration depth measurement using infrared temperature sensing on the weld surface. The detection point was optimized by FEM analysis in the laser keyhole welding. The profile of the weld surface temperature was measured using infrared detector array. Surface temperature behind the weld pool is proportional or exponentially proportional to penetration depth and bead width. From the results, the monitoring device of surface temperature using infrared detector array was applicable fur real time penetration depth control.