• 대한기계학회:학술대회논문집
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• 대한기계학회 2001년도 추계학술대회논문집A
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• pp.471-476
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• 2001

The main object of this study is to develop a reliable FEM simulation technique for stability test using ABAQUS software and to clarify the effect of base profile of a steel D&I(drawn and ironed) can on the dome reversal pressure. For the can after body making simulation, two kind of stability test, dome buckle test and axial crush test are performed. The factors studied in the base profile on the dome reversal pressure are the base diameter, the rim radius, the dome shoulder radius, the dome radius and the dome depth. Within the limits before the occurrence of normal snap-through buckling of dome, the dome reversal pressure is improved by decreasing the base diameter, increasing the dome depth or increasing the dome shoulder depth.

• E2M - 전기 전자와 첨단 소재
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• 제10권9호
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• pp.881-888
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• 1997

This study demonstrats the profiles of phosphorus ions in silicon by MeV implantation(1∼3 MeV). Implanted profiles could be measured by SIMS(Cameca 4f) and compared with simulation results(TRIM program and analytical description method only using on Pearson function). The experimental result in the peak concentration region has a little bit deviation from simulation data. By RBS and Channeling measurements the defect distribution of implanted samples could be measured and spectrum are calibrated depth with RUMP simulation By XTEM measurement the thickness of defect zone also could be measured. Finally thermal annealing for the electrical activation of implanted ions carried out by RTA(rapid thermal annealing). The concentration-depth profiles after heat treatment was measured by SR(spreading resistance)-method.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1994년도 하계학술대회 논문집 A
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• pp.72-75
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• 1994

In this paper, a novel method to figure out the relative residual stress distribution along the depth of silicon diaphragms is presented Cantilevers with various thickness are fabricated by the time controlled etching method using EPW as an etchant. The boron concentration along the depth of the cantilevers is obtained by the TSUPREM IV simulation, and the etching time to get the proper thickness is calculated. By measuring deflections of the p+ silicon cantilevers the stress profile along the depth of diaphragm is calculated. The obtained stress profile is reasonable and useful to expect the deflection of cantilevers and the buckling of diaphragms.

• Journal of Welding and Joining
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• 제20권1호
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• pp.69-75
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• 2002

This study investigated the effect of the system parameters on penetration depth measurement using infrared temperature sensing system. The distance from focusing lens to detector was varied to diminish the error in measuring weld bead width. The effect of bead surface shape on measured surface temperature profile was evaluated using specimen heated by electric resistance. The measuring distance from laser beam was changed to optimize the measuring point. The results indicated that the monitoring device of surface temperature using infrared detector array was applicable to real time penetration depth control.

• 한국기계가공학회지
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• 제3권2호
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• pp.53-59
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• 2004

In this paper, we propose a new multi-purpose Scanning Force Microscope (SFM) system. The system can be used for nano/micro-scratching, in-process profile measurement, and observation of potential surface defects which occur during the scratching in air or liquid. Experimental results of nano/micro-scratching show that the smallest scratching depth can be controlled to be 10nm, which corresponds to the stability of the SFM system. Profile measurements of nano/micro-scratching surfaces have also been performed by the method of on-machine measurement and in-process measurement. Two measurement results were in good agreement with each other. The maximum difference was approximately 10 nm, which was mainly caused by the sampling repeatability error that influences the measurement accuracy Also, micro-defects on the micro-scratching surface were successfully detected by the SFM system. It was confirmed that the number of micro-defects increases when the surface is subjected to a cyclic bending load. The maximum depth was less than 100nm.

• 한국멀티미디어학회논문지
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• 제7권4호
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• pp.474-483
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• 2004

본 논문에서는 3차원 정면 얼굴 영상으로부터 추출된 프로파일(profile) 영상을 깊이 정보가 반영된 가중치 하우스도르프 거리(weighted hausdorff distance-WHD)를 이용하여 두 영상을 비교하는 인식 알고리즘을 제안한다. 3차원 얼굴 영상은 2차원과 달리, 깊이 정보를 가지고 있으므로 사람 얼굴의 프로파일 영상을 보다 정확하게 그리고 다양한 얼굴 위치에서 추출되어 질 수 있다. 코는 얼굴에서 가장 돌출된 형상을 가지고 있으므로, 3차원 데이터의 깊이 값을 평균을 이용한 반복 선택 방법을 사용하여 코의 정점 위치를 찾는다. 이를 기준점으로 수직성분들의 깊이 값을 2차원 평면으로 나타내면 프로파일 영상이 추출된다. 입력 영상과 데이터베이스 영상과의 유사도 비교를 위해, 깊이정보를 가중치로 사용한 WHD방법으로서 두 프로파일 영상의 거리비교는 Ll을 이용하여 비교하였다. 제안된 방법으로, 인식률은 5위 이내가 94.3%의 인식률을 나타내었다.

• 한국도로학회논문집
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• 제17권1호
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• pp.1-6
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• 2015

PURPOSES : Recently, attempts have been made to evaluate tire-pavement noise based on a measure of Mean Profile Depth (MPD). However, equivalent values of MPD appear to correspond to different levels of tire-pavement noise, which indicates that other factors such as texture wavelength need to be included to improve the accuracy of noise prediction. A single index to represent texture wavelength is proposed in this study. A consistent relationship between tire-pavement noise and texture wavelength on asphalt concrete pavement is observed. METHODS : Profile data and tire-pavement noise data were collected from a number of expressway sections in Korea. In addition, texture wavelength was defined by a Peak Number (PN), which was calculated using profile data. Statistical analysis was performed to find the relationship between the PN and tire-pavement noise. RESULTS : As a result of this study, a linear relationship between PN and tire-pavement noise is observed on asphalt concrete pavement. CONCLUSIONS : Tire-pavement noise on asphalt concrete pavement can be predicted from PN information.

• Tribology and Lubricants
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• 제16권5호
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• pp.357-364
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• 2000

In this study, the sliding wear in spur gears, using Archard's wear model, is analyzed. Formulas of tooth sliding wear depth along the line of action are derived. The tooth profile is modified Id make a smooth transmission of the normal loads and the cylinder profile for reducing the pressure spike is suggested. The sliding wear rate is calculated with these profiling results. We expect these modification methods to contribute to the reduction of sliding wear not only in the root, but the tip of tooth and tooth edge.

• KSTLE International Journal
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• 제6권1호
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• pp.1-7
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• 2005

Wear model for predicting the vehaviour of a depth is considered in this paper. It is deduced from the energy and volume based wear models such as the Archard equation and the workrate model. A new parameter of the equivalent depth ($D_e$= wear volume /worn area) is considered for the wear model of a depth prediction. A concenpt of a dissipated shear energy density is accommodated for in the suggested models. It is found that $D_e$ can distinguish the worn area shape. A cubic of $D_e$($D_e^3$) gives a better linear regression with the volume than that of the maximmum depth $D_{max}e$($D_{max}^3$) does. Both $D_{max}$ and $D_e$ are used for the presently suggested depth-based wear model. As a result, a wear depth profile can be simulated by a model using $D_{max}$. Wear resistance from the concern of an overall depth can be identified by the wear coefficient of the model using $D_e$.

• 대한전자공학회논문지
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• 제21권4호
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• pp.58-64
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• 1984

이온주입형 E-IGFET에서 이온주입층내 불순물 profile을 임의의 형태로 가정하였으며, 가정한 불순물 profile을 이용하여 threshold 전압에 대한 간단한 model을 유도하였다. 유도한 model을 이용하여 Gaus-sian-profile일 때의 threshold 전압치를 구하였고, 실제의 측정 data와 비교하였을 때 일치함을 확인할 수 있었다. 더불어, box-profile일 때의 threshold 전압치의 오차를 계산해 보았다. 또한, substrate-bias에 의한 threshold 전압의 변화를 simulation하였으며. 계산과정에서 이온주입층의 깊이 D를 구하는 새로운 방법을 제시하였다.