• Title/Summary/Keyword: Degradation Measurement

Search Result 561, Processing Time 0.026 seconds

Application of UV-Vis Spectroscopic Analysis for Transformer Insulating Paper Degradation (UV-Vis 분광분석에 의한 전기변압기 내 절연지 열화도 측정)

  • Kong, Hosung;Han, Hung-Gu
    • Tribology and Lubricants
    • /
    • v.35 no.3
    • /
    • pp.151-157
    • /
    • 2019
  • Insulated oil degradation produces charged by-products, such as acids and hydro-peroxides, which tend to reduce the insulating properties of the oil. In this study, UV-vis spectroscopy measurement technology is developed and experimentally compared with other measurement methods, such as the titration method and IR spectroscopy, to validate its ability to monitor the degradation of electrical insulating paper. The degradation characteristics of the insulating paper are appropriately represented through various types of measurement methods, such as the Tan (delta) method, $CO_2$ gas production measurement, the titration method, and IR spectroscopy. The results are demonstrated to be well comparable to a change in the fluorescence emission ratio (FER), which is defined as the shift in fluorescence intensity in the measured wavelength range, and also to the chromatic ratio, which is defined as a color shift to longer wavelength ranges. The results also show that, by using UV-vis spectroscopy, it is possible to detect the degradation of the insulating paper. This study suggests that UV-vis spectroscopy can be applied as an alternative to high-performance liquid chromatography, which is the internationally recognized measurement technology for cellulose paper degradation. The FER detector is also verified to be useful as an effective condition-monitoring device for power transformers.

Experimental Analysis of GDL Degradation in PEM Fuel Cell (고분자전해질형 연료전지 가스확산층의 내구 성능 저하에 관한 실험적 분석)

  • Ha, Tae-Hun;Park, Jae-Man;Cho, Jun-Hyun;Min, Kyoung-Doug;Lee, Eun-Suk;Jung, Ji-Young;Kim, Do-Hun;Jin, Yong-Won;Lee, Dae-Han
    • 한국신재생에너지학회:학술대회논문집
    • /
    • 2009.11a
    • /
    • pp.132-132
    • /
    • 2009
  • To achieve the commercialization of PEM fuel cell, the durability problem must be solved. Recently, many researchers have focused on this durability problem and degradation studies about membrane and electrode have been reported. But durability characteristics of gas diffusion layer is not much reported yet. Durability of GDL is very important to maintain the performance of PEM fuel cell because the main function of GDL is a path of fuel and water and the GDL degradation causes the loss of the GDL function. In this study, the degradation of GDL, especially, the mechanical degradation process was investigated with the leaching test. The effect of water dissolution was observed through the test and the amount of GDL degradation was measured with various measurement methods such as weight measurement, static contact angle measurement, scanning electron microscope. After 2,000 hours test, the GDL showed structural damage and loss of hydrophobicity.

  • PDF

Study on the Degradation Behavior of Berberine Dye and Berberine Dyed Silk using Hydrogen Peroxide/UV/Oxygen Treatment (과산화수소/자외선/산소 처리를 이용한 베르베린 염료 및 염직물의 퇴화거동 연구)

  • Ahn, Cheun-Soon
    • The Research Journal of the Costume Culture
    • /
    • v.20 no.2
    • /
    • pp.238-250
    • /
    • 2012
  • This study examined the degradation behavior of SB(standard berberine) dye and SB dyed silk using HPLC-MS instrument after degradation in the hydrogen peroxide/ultraviolet ray radiation/oxygen system up to 9 days and 40 hours respectively. In the degraded samples, berberine was detected at 5.2 min in the SB dye and 5.3 min in the SB dyed silk with its molecular ion=336 and the UV spectra of quaternary alkaloid. Degradation product 3(m/z=102) newly appeared after 5 day degradation treatment with continued increase till the end of degradation treatment. The amount of berberine in the degraded dye decreased with degradation progression. In the silk dyeings, berberine was detected only up to 21 hour degradation sample. The amount of berberine decreased dramatically during the first 6 hours of degradation treatment. The CIELAB color measurement of the silk dyeings showed dramatic change in the b* value, near zero in the 40 hour degraded silk. CIELAB and Munsell color measurements were in agreement with the HPLC-MS results of the dyed silk in the change of berberine content that the degraded silk became white and lost yellow color.

Development of experiment technology for assessment of shotcrete lining long-term degradation in tunnels (터널 숏크리트 라이닝의 장기 내구성 평가를 위한 실험기법 개발)

  • Lim, Jong-Jin;Shin, Hyu-Soung;Bae, Gyu-Jin
    • Proceedings of the Korean Geotechical Society Conference
    • /
    • 2005.03a
    • /
    • pp.439-444
    • /
    • 2005
  • Shotcrete lining is likely to be deteriorated due to the ground water which the lining is exposed to. Some tunnel collapses seemed to be affected by shotcrete degradation were reported. But there isn't any assessment method of shotcret long-term degradation. So, Experimental technology for shotcrete long-term degradation modeling was developed in this study. The shotcrete long-term degradation modeling, developed in other study in Korea Institute of Construction Technology, require the time-history of volume change. Digital strain observation system was used to acquire the time-history of volume change. To verify the Strain Observation Digital System, the measurement using the system was compared to the one using a micrometer. Through this process, The experiment for shotcrete long-term degradation modeling was set up.

  • PDF

Hot Electron Induced Device Degradation in Gate-All-Around SOI MOSFETs (Gate-All-Around SOI MOSFET의 소자열화)

  • 최낙종;유종근;박종태
    • Journal of the Institute of Electronics Engineers of Korea SD
    • /
    • v.40 no.10
    • /
    • pp.32-38
    • /
    • 2003
  • This works reports the measurement and analysis results on the hot electron induced device degradation in Gate-All-Around SOI MOSFET's, which were fabricated using commercially available SIMOX material. It is observed that the worst-case condition of the device degradation in nMOSFETs is $V_{GS}$ = $V_{TH}$ due to the higher impact ionization rate when the parasitic bipolar transistor action is activated. It is confirmed that the device degradation is caused by the interface state generation from the extracted degradation rate and the dynamic transconductance measurement. The drain current degradation with the stress gate voltages shows that the device degradation of pMOSFETs is dominantly governed by the trapping of hot electrons, which are generated in drain avalanche hot carrier phenomena.r phenomena.

A Study on Dielectric Properties of Polycarbonate Film Due to Variation of Degradation Time (열화 시간 변화에 따른 폴리카보네이트 필름의 유전 특성에 관한 연구)

  • Lee, Sung Ill
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.31 no.7
    • /
    • pp.469-474
    • /
    • 2018
  • In this study, the capacity and FTIR of polycarbonate film that was degraded for 2, 4, and 8 h in a thermostat at $180^{\circ}C$ was measured. The results of this study are as follows. It was found that the capacity decreased with increasing degradation time and frequency. This findings suggest that the attraction between molecules and amorphous polycarbonate increased because it contains the ketone group (-C=O-) and the chain of dioxides group (-O-R-O-). Measurement by FTIR found that the time of thermal degradation has a smaller impact because the transmutation or variation of the material does not occur. Measurement by SEM magnified 1,000 times found that a longer thermal degradation time results in thermal decomposition of the specimen's particles.

Development of Camera-Based Measurement System for Crane Spreader Position using Foggy-degraded Image Restoration Technique

  • Kim, Young-Bok
    • Journal of Navigation and Port Research
    • /
    • v.35 no.4
    • /
    • pp.317-321
    • /
    • 2011
  • In this paper, a foggy-degraded image restoration technique with a physics-based degradation model is proposed for the measurement system. When the degradation model is used for the image restoration, its parameters and a distance from the spreader to the camera have to be previously known. In the proposed image restoration technique, the parameters are estimated from variances and averages of intensities on two foggy-degraded landmark images taken at different distances. Foggy-degraded images can be restored with the estimated parameters and the distance measured by the measurement system. On the basis of the experimental results, the performance of the proposed foggy-degraded image restoration technique was verified.

The Development of HFPD System for Mibile-loading Vehicles (차량탑재형 HFPD의 개발)

  • Kim, Deok-Geun;Im, Jang-Seop;Yeo, In-Seon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2001.05c
    • /
    • pp.33-37
    • /
    • 2001
  • Recently, the HFPD measurement testing is widely used in partial discharge measurement of HV machines because HFPD measurement testing receives less influence of external noise and has a merit of good sensitivity. Also HFPD testing is able to offer the judgement standard of degradation level of HV machine and can detect discharge signals in live-line. Therefore it is very useful method compare to previous conventional PD testing method and effective diagnosis method in power transformer that requires live-line diagnosis. But partial discharges have very complex characteristics of discharge pattern so it is required continuous research to development of precise analysis method. In recent, the study of partial discharge is carrying out discover of initial defect of power equipment through condition diagnosis and system development of degradation diagnosis using HFPD(High Frequency Partial Discharge) detection. In this study, simulated transformer is manufactured and HFPD occurred from transformer is measured with broad band antenna in real time, the degradation grade of transformer is analyzed through produced patterns in simulated transformer according to applied voltages.

  • PDF

Measurement of Electrical Treeing Length and Area by Use of Image Processing (영상 처리 방법을 이용한 트리 길이와 열화면적 계측)

  • 백관현;김재환
    • The Proceedings of the Korean Institute of Illuminating and Electrical Installation Engineers
    • /
    • v.8 no.1
    • /
    • pp.57-62
    • /
    • 1994
  • In this paper, a system for measuring of treeing degradation in organic dielectric material by using image processing technics, is discussed. Traditionally, treeing is measured by visual method. It made difficulty to understanding for features and changes in the configlEation of the tree growth. Using image processing system, it is made to describe the characters of the tree growth, specially length of tree and area of treeing degradation. From this image processing and visual measurement, the similar results were made, an automatic measurement system was made for configuration of the tree growth.

  • PDF

The Performance Degradation of Static Type Input Buffers due to Device Degradation (소자열화로 인한 Static 형 입력버퍼의 성능저하)

  • 김한기;윤병오
    • Proceedings of the IEEK Conference
    • /
    • 1998.10a
    • /
    • pp.561-564
    • /
    • 1998
  • This paper describes a performance degradation of static type input buffer due to the device degradation in menory devices using $0.8\mu\textrm{m}$ CMOS process. experimental results shows that the degradation of MOS device affects the Trip Point shift in static type input buffer. We have performed the spice simulation and calculated the Trip Point with model parameter and measurement data so that how much the Trip Point(VLT) variate.

  • PDF