• Title/Summary/Keyword: Degradation

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Application of Accelerated Degradation Testing for VFD (Vacuum Fluorescent Display) (VFD(Vacuum Fluorescent Display) 가속열화시험 응용사례)

  • Bae, Suk-Joo
    • Journal of Applied Reliability
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    • v.5 no.4
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    • pp.413-425
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    • 2005
  • As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article presents an accelerated degradation testing for vacuum fluorescent displays (VFDs). The accelerated degradation model is based on Arrhenius-lifetime relationship for cathode temperatures. We compare the results between accelerated degradation test and test at normal use condition. Accelerated degradation test for display devices is observed as an efficient method to warrantee product reliability to customers, as well as a tool to save time and costs.

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Service Life Prediction of Components or Materials Based on Accelerated Degradation Tests (가속열화시험에 의한 부품·소재 사용수명 예측에 관한 연구)

  • Kwon, Young Il
    • Journal of Applied Reliability
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    • v.17 no.2
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    • pp.103-111
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    • 2017
  • Purpose: Accelerated degradation tests can speed time to market and reduce the test time and costs associated with long term reliability tests to verify the required service life of a product or material. This paper proposes a service life prediction method for components or materials using an accelerated degradation tests based on the relationships between temperature and the rate of failure-causing chemical reaction. Methods: The relationship between performance degradation and the rate of a failure-causing chemical reaction is assumed and least square estimation is used to estimate model parameters from the degradation model. Results: Methods of obtaining acceleration factors and predicting service life using the degradation model are presented and a numerical example is provided. Conclusion: Service life prediction of a component or material is possible at an early stage of the degradation test by using the proposed method.

A Case Study of Degradation Analysis for the Passenger Vehicles Shock Absorber (승용차량용 쇽업소버의 열화분석 사례연구)

  • Song, Hyun-Seok;Seo, Young-Kyu;Jung, Do-Hyun;Jang, Joong-Soon;Kim, Eunkyu;Park, Boo-Hee
    • Journal of Applied Reliability
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    • v.17 no.3
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    • pp.181-187
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    • 2017
  • Purpose: The purpose of this study is to estimate the lifetime of commercial passenger vehicles shock absorber using degradation test and data. Method: The degradation factor of shock absorber was determined to be a damping force using FMEA. Degradation test was performed on damping force under real world usage condition and analysed the degradation data. Results: To estimate the lifetime of shock absorber, a degradation model was developed and a numerical example was provided. Conclusion: Evaluation of the lifetime of commercial and military vehicles shock absorber will be possible by using the proposed degradation analysis method.

Analysis of Luminance Degradation characteristics of OLED using the Hotplate (핫플레이트를 이용한 OLED의 휘도열화특성 분석)

  • Kim, Yun-Cheol;Lee, Duek-Jung;Jang, Joong-Soon
    • Journal of Applied Reliability
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    • v.16 no.4
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    • pp.356-363
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    • 2016
  • Purpose: The purpose of this study is to propose efficiency of equipment testing the luminance degradation of OLED. Methods: The degradation model of Exponential model and Stretched exponential model is analyzed by goodness of fit test using calculated R-square. The degradation model having the higher R-square is finally selected. Scale parameter and Shape parameter using the selected degradation model is estimated. The activation energy and current density n using peck model among the accelerated model is estimated. the estimated parameters are analyzed by t-test. Results: The results of t-test show that the estimated parameters on chamber and hotplate are equal statistically. we can know the similarity of the luminance degradation rate and degradation pattern on chamber and hotplate. Conclusion: The result of the degradation test on chamber and hotplate is similar. when the accelerated degradation test on the panel of the OLED TV is performed, hotplate is requiring less samples, time and cost than chamber. so the accelerated degradation test on the panel of the OLED TV using the hoplate is efficient of time and cost.

Sequential microbial-photocatalytic degradation of imidacloprid

  • Sharma, Teena;Kaur, Manpreet;Sobti, Amit;Rajor, Anita;Toor, Amrit Pal
    • Environmental Engineering Research
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    • v.25 no.4
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    • pp.597-604
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    • 2020
  • In the present study, the application of sequential biological and photocatalytic process was evaluated as a feasible process for the degradation of imidacloprid (IMI) in soil. Photocatalysis was carried out as a post and pre-treatment to the biological process as Microbial Photocatalytic (MP) and Photocatalytic Microbial (PM), respectively, to enhance the degradation and mineralization of IMI in soil. By both the processes, there was an enhancement in the percentage degradation of IMI i.e 86.2% for PM and 94.6% for MP process. The obtained results indicate that MP process is apparently more efficient in degradation of IMI which was observed with 15 days of biological treatment followed by 18 h of photocatalytic degradation (15 d + 18 h). The present work also reveals that though the difference in terms of the degradation of IMI after 5 d + 18 h, 10 d + 18 h & 15 d+ 18 h of MP process is not drastic, yet significant variation has been observed in terms of mineralization that truly signifies the removal of IMI from the soil. The LC analysis has shown that the intermediates formed during MP process are more and smaller in comparison to PM process, which further provides evidence that MP process is better than PM process for effective degradation of IMI in soil.

A Review on Degradation of Silicon Photovoltaic Modules

  • Yousuf, Hasnain;Khokhar, Muhammad Quddamah;Zahid, Muhammad Aleem;Kim, Jaeun;Kim, Youngkuk;Cho, Sung Bae;Cho, Young Hyun;Cho, Eun-Chel;Yi, Junsin
    • New & Renewable Energy
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    • v.17 no.1
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    • pp.19-32
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    • 2021
  • Photovoltaic (PV) panels are generally treated as the most dependable components of PV systems; therefore, investigations are necessary to understand and emphasize the degradation of PV cells. In almost all specific deprivation models, humidity and temperature are the two major factors that are responsible for PV module degradation. However, even if the degradation mode of a PV module is determined, it is challenging to research them in practice. Long-term response experiments should thus be conducted to investigate the influences of the incidence, rates of change, and different degradation methods of PV modules on energy production; such models can help avoid lengthy experiments to investigate the degradation of PV panels under actual working conditions. From the review, it was found that the degradation rate of PV modules in climates where the annual average ambient temperature remained low was -1.05% to -1.16% per year, and the degree of deterioration of PV modules in climates with high average annual ambient temperatures was -1.35% to -1.46% per year; however, PV manufacturers currently claim degradation rates of up to -0.5% per year.

Quality of Service Parameters Estimation Model for Adaptive Bandwidth Service in Mobile Cellular Networks (적응형 서비스를 제공하는 이동통신망에서의 서비스 품질 척도 추정 모델)

  • Jung, Sung Hwan;Hong, Jung Wan;Lie, Chang Hoon
    • Journal of Korean Institute of Industrial Engineers
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    • v.33 no.1
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    • pp.153-163
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    • 2007
  • An adaptive framework paradigm where the bandwidth values of the ongoing calls vary according to the trafficsituations is one of the promising concepts for overcoming poor resource conditions due to handoffs in mobilecellular networks. However, quantifying the level of bandwidth degradation of the ongoing calls in an adaptiveframework is important in view of Quality of Service (QoS) Provisioning. Therefore we introduce new QoSparameters, the Degradation Degree Ratio (DDR), which represents the average portion of the degradationdegree during degradation pehod of a call, and the Degradation Area Ratio (DAR), which represents the averageratio of a call's degradation level considering both the period and the degree of degradation jointly in multi-levelbandwidth service. We also develop a new analytical model for estimating the QoS measures such as theDegradation Pehod Ratio (DPR), DDR and DAR. We show how to calculate the QoS measures and illustrate themethod by numerical examples. The proposed model can be used to determine the optimal parameter of theCAC scheme and analyze the sensitivity ofthe QoS parameters in adaptive networks.

Hot electron induced degradation model of the DC and RF characteristics of RF-nMOSFET (Hot electron에 의한 RF-nMOSFET의 DC및 RF 특성 열화 모델)

  • 이병진;홍성희;유종근;전석희;박종태
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.35D no.11
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    • pp.62-69
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    • 1998
  • The general degradation model has been applied to analyze the hot carrier induced degradation of the DC and RF characteristics of RF-nMOSFET. The degradation of cut-off frequency has been severer than the degradation of bulk MOSFET drain current. The value of the degradation rate n and the degradation parameter m for RF-nMOSFET has been equal to those for bulk MOSFET. The decrease of device degradation with the increase of fingers could be explained by the large source/drain parasitic resistance and drain saturation voltage. It has been also found that the RF performance degradation could be explained by the decrease of $g_{m}$ and $C_{gd}$ and the increase of $g_{ds}$ after stress. The degradation of the DC and RF characteristics of RF-nMOSFET could be predicted by the measurement of the substrate current.t.

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The Degradation of Phenolic Compounds by Lignolytic Streptomyces strains (Lignin을 분해하는 Streptomyces strainsdop 의한 페놀화합물의 분해)

  • 김태전
    • Journal of Environmental Health Sciences
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    • v.26 no.3
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    • pp.86-91
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    • 2000
  • The purpose of this was to investigate the degradation efficiency of phenol compounds(catechol, ferulic acid, protocatechuic acid, syringic acid, vanillic acid) by Streptomyces halstedii scabies SAI-36, Streptomyces avendulas SA2-14, and Strptomyces badius(ATCC 39117, control group). The results were as follows: Catechol showed the degradation efficiency that is lower than 50% in three strains. Ferulic acid and vanillic acid showed high degradation efficiency of 98.8% and 94.5% respectively by Streptomyces lavendulas SA2-14. protocatechuic acid and syringicacid showed high degradation efficiency of 89.6% and 77.9%. The degradation efficiency of catechol by Streptomyces halstedii scabies SAI-36, Streptomyces lavendulas SA2-14 and Streptomyces badius(ATCC 39117) was low as 49.2%, 40.2% and 20.2% respectively. But the degradation of other phenolic compoumds except catechol by Streptomyces laven-dulas SA2-36 and Streptomyces badius(ATCC 39117). The results demonstrated that two experimental strains are superior ability to control group in degradation of phenol compounds and Streptomyces lavendulas SA2-14 was superior of two experimental strain. This results were consistent with previous research results that Streptomyces lavendulas SA2-14 was the best strain in degradation ability for lignin, decoloration abilities for variousdyes, and various enzyme production abilities. Therefore, it is suggested that lignin can be used as a indicator when selecting Actinomycetes for degradation of non-degradable materials such as phenol compounds.

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Modeling and Analysis of Accelerated Degradation Testing Data for a Solid State Drive (SSD) (Solid State Drive(SSD)에 대한 가속열화시험 데이터 모델링 및 분석)

  • Mun, Byeong Min;Choi, Young Jin;Ji, You Min;Lee, Yong Jung;Lee, Keun Woo;Na, Han Joo;Yang, Joong Seob;Bae, Suk Joo
    • Journal of Applied Reliability
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    • v.18 no.1
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    • pp.33-39
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    • 2018
  • Purpose: Accelerated degradation tests can be effective in assessing product reliability when degradation leading to failure can be observed. This article proposes an accelerated degradation test model for highly reliable solid state drives (SSDs). Methods: We suggest a nonlinear mixed-effects (NLME) model to degradation data for SSDs. A Monte Carlo simulation is used to estimate lifetime distribution in accelerated degradation testing data. This simulation is performed by generating random samples from the assumed NLME model. Conclusion: We apply the proposed method to degradation data collected from SSDs. The derived power model is shown to be much better at fitting the degradation data than other existing models. Finally, the Monte Carlo simulation based on the NLME model provides reasonable results in lifetime estimation.