• 제목/요약/키워드: Defects inspection

검색결과 641건 처리시간 0.026초

공동주택 하자예방 및 관리를 위한 품질점검제도의 실효성 제고방안 연구 (Validity Elevation Scheme of Quality Inspection System for Defect Prevention & Management in Apartment Housing Construction)

  • 박근수
    • 한국건축시공학회:학술대회논문집
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    • 한국건축시공학회 2020년도 봄 학술논문 발표대회
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    • pp.220-221
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    • 2020
  • Strarting with Buyeong Apartment in Dongtan-2 disrict in 2017, collective complaints of residents are frequently occurring due to low quality problem such as improper construction and defects of apartment houses. Because of this, the Ministry of Land and Transport is preparing a comprehensive improvement scheme to improve the quality of Apartment Housing(AH), taking into account the continuing complaints from the residents of AH and the problem raised by the National Assembly. The basic profile of the improvement scheme is induce the tenants and experts to discover and point out defects that are repaired until the date of use inspection or due date. For this purpose, we suggested this defects management system linkaged by the preliminary inspection and quality inspection system for prospective occupants. In this context, this paper aims to suggest an effective likage method between the preliminary inspection of prospective residents and the quality inspection system implemented by local governments as an ordinance.

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A New Inspection Method of PDP Electrode Pattern Defects

  • Kim, Taehong;Sunkyu Yang;Tak Eun;Park, Sehwa;Ilhong Suh
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 2000년도 제15차 학술회의논문집
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    • pp.457-457
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    • 2000
  • The display module of PDP consists of a pair of fine electrode patterned panels. For example, in case of 42" PDP, thousands of electrode patterns should be placed on panel, where length, width, and height of each pattern m one meter, 50${\mu}{\textrm}{m}$, and 30${\mu}{\textrm}{m}$ respectively. And pitch between patterns is around 200${\mu}{\textrm}{m}$. Electrode patterns are frequently damaged during the production process, and thus might be broken. These breakage will result in open-circuited electrical characteristic of a pattern and/or open-circuited electrical characteristic between patterns. Therefore, inspection of pattern defects is the inevitable process to improve production yield rate of the panel. In this paper, we first review several types of PDP pattern defects which affects yield-rate of PDP. And, problems of inspecting such pattern defects by a typical inspection method is addressed. Then, a novel inspection method is proposed to overcome the difficulties, where some new components and the algorithm to detect the electrode defects are explored.ored.

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광선추적을 사용한 나사산 표면결함 검사용 환형 광학계 개발 (Development of Annular Optics for the Inspection of Surface Defects on Screw Threads Using Ray Tracing Simulation)

  • 이지원;임영은;박근;나승우
    • 한국정밀공학회지
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    • 제33권6호
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    • pp.491-497
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    • 2016
  • This study aims to develop a vision inspection system for screw threads. To inspect external defects in screw threads, the vision inspection system was developed using front light illumination from which bright images can be obtained. The front light system, however, requires multiple side images for inspection of the entire thread surface, which can be performed by omnidirectional optics. In this study, an omnidirectional optical system was designed to obtain annular images of screw threads using an image sensor and two reflection mirrors; one large concave mirror and one small convex mirror. Optical simulations using backward and forward ray tracing were performed to determine the dimensional parameters of the proposed optical system, so that an annular image of the screw threads could be obtained with high quality and resolution. Microscale surface defects on the screw threads could be successfully detected using the developed annular inspection system.

PDP ITO 패턴유리의 결함 검사시스템 개발 (Development of Defect Inspection System for PDP ITO Patterned Glass)

  • 송준엽;박화영;김현종;정연욱
    • 한국정밀공학회지
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    • 제21권12호
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    • pp.92-99
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    • 2004
  • The formation degree of sustain (ITO pattern) decides quality of PDP (Plasma Display Panel). For this reason, it makes efforts in searching defects more than 30 un as 100%. Now, the existing inspection is dependent upon naked eye or microscope in off-line PDP manufacturing process. In this study developed prototype inspection system of PDP 170 glass is based on line-scan mechanism. Developed system creates information that detects and sorts kinds of defect automatically. Designed inspection technology adopts multi-vision method by slip-beam formation for the minimum of inspection time and detection algorithm is embodied in detection ability of developed system. Designed algorithm had to make good use of kernel matrix that draws up an approach to geometry. A characteristic of defects, as pin hole, substance, protrusion, are extracted from blob analysis method. Defects, as open, short, spots and et al, are distinguished by line type inspection algorithm. In experiment, we could have ensured ability of inspection that can be detected with reliability of up to 95% in about 60 seconds.

신경 회로망을 이용한 J-리드 납땜 상태 분류 (A classification techiniques of J-lead solder joint using neural network)

  • 유창목;이중호;차영엽
    • 제어로봇시스템학회논문지
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    • 제5권8호
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    • pp.995-1000
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    • 1999
  • This paper presents a optic system and a visual inspection algorithm looking for solder joint defects of J-lead chip which are more integrate and smaller than ones with Gull-wing on PCBs(Printed Circuit Boards). The visual inspection system is composed of three sections : host PC, imaging and driving parts. The host PC part controls the inspection devices and executes the inspection algorithm. The imaging part acquires and processes image data. And the driving part controls XY-table for automatic inspection. In this paper, the most important five features are extracted from input images to categorize four classes of solder joint defects in the case of J-lead chip and utilized to a back-propagation network for classification. Consequently, good accuracy of classification performance and effectiveness of chosen five features are examined by experiment using proposed inspection algorithm.

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ESPI를 이용한 충격손상을 받은 복합재료 내부결함의 정량평가 (Quantitative Evaluation of Impact Defects inside of Composite Material Plate by ESPI)

  • 김경석;양광영;장호섭;지창준;윤홍석
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 2003년도 추계학술대회
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    • pp.254-258
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    • 2003
  • Electronic Speckle Pattern for quantitative evaluation of a impact defect inside of composite material plate are described. The impact on composite material makes inside delamination which is difficult to detect visual inspection and ultrasonic testing due to non-homeogenous structure. This paper proposes the quantitative evaluation technique of defects under real impact. Artificial defects are designed inside of composite plate for development of inspection technique and real defects under impact are inspected and compared with results of visual inspection.

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AFVI를 위한 PCB PAD의 자동 광학 검사 (Automatic Optical Inspection of PCB PADs for AFVI)

  • 문순환
    • 한국광학회:학술대회논문집
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    • 한국광학회 2006년도 하계학술발표회 논문집
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    • pp.469-471
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    • 2006
  • This paper describes a efficient insepction method of PCB PADs for AFVI. The methods for PCB inspection have been tried to detect the defects in PCB PADs, but their low detection rate results from pattern variations that are originating from etching, printing and handling processes. The adaptive inspection method has been newly proposed to extract minute defects based on dynamic segments and filters. The vertexes are extracted from CAM master images of PCB and then a lot of segments are constructed in master data. The proposed method moves these segments to optimal directions of a PAD contour and so adaptively matches segments to PAD contours of inspected images, irrespectively of various pattern variations. It makes a fast, accurate and reliable inspection of PCB patterns. Experimental results show that proposed methods are found to be effective for flexible defects detection.

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VISUALIZATION OF INTERNAL DEFECTS IN PLATE-TYPE NUCLEAR FUEL BY USING NONCONTACT OPTICAL INTERFEROMETRY

  • Park, Seung-Kyu;Park, Nak-Gyu;Baik, Sung-Hoon;Kang, Young-June
    • Nuclear Engineering and Technology
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    • 제45권3호
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    • pp.361-366
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    • 2013
  • An imaging technique to visualize the internal defects in a plate-type nuclear fuel specimen was developed by using an active optical interferometer for a nondestructive quality inspection. A periodic thermal wave having a sinusoidal intensity pattern induced a periodical strain variation for the specimen. The varying strain image was acquired using an optical laser interferometer. The strain distribution over the internal defects will be distorted in an acquired strain image because a part of the thermal wave will be reflected from these defects during propagation. In this paper, internal defects were efficiently visualized by sequentially accumulating the extracted defect components. The experimental results confirmed that the developed visualization system can be a valuable tool to detect the internal defects in plate-type nuclear fuel.

볼트 결함 판별을 위한 고속 정밀 검사 장치 개발 (A High-speed Automatic Precision Inspection System for Bolts Defects)

  • 오춘석;이현민
    • 정보처리학회논문지B
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    • 제10B권3호
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    • pp.305-310
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    • 2003
  • 본 논문은 자동으로 볼트를 고속 정밀 검사할 수 있는 장치에 대한 시스템 설계 및 제품 개발에 관해 다룬다. 볼트를 연속적으로 고속 검사하기 위해 컨베이어를 이용하고 이를 동작시키기 위한 서보모터와 엔코더를 부착하여 정확한 이송량를 유지하게 된다. 엔코더 신호를 수신한 라인스캔 카메라의 동작에 따라 프레임 그래버로 볼트 영상을 전송하며 한 프레임을 구성한 후 영상 검사 알고리즘에 의해 파라메터를 측정하고 검사하게 된다. 제작된 결과물을 이용하여 실험을 통해 본 장치의 효용성을 입증하고자 한다.

휴대폰 카메라용 렌즈단품 이물 자동검사장비 (Auto detect inspection system for single lens product of mobile phone camera)

  • 송청호;정연욱;배상신;송준엽;김영규
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2005년도 추계학술대회 논문집
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    • pp.432-435
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    • 2005
  • The Mega-pixel camera phones become main trends in mobile phone market. The lens modules used in mesa-pixel camera phones need high resolution. One of the main factors of resolution drop is the defects of bare lens. Though there are many advantages in auto-inspection of defects of bare lens, high technical problems take the defect inspections to be done with manual process. In this paper, the type and the source of defects were described and bare lens defect auto-inspection system design was explained. The designed auto-inspection system is composed of illumination optics part, focusing optics part and auto-moving system. With the proposed auto-inspection system, fast and uniform inspection of bare lens can be achieved.

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