• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.4
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• pp.55-62
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• 2007

This paper proposes a defective pixel detection algorithm and its hardware structure for CCD/CMOS image sensor. In previous algorithms, the characteristics of image have not been considered. Also, some algorithms need quite a time to detect defective pixels. In order to make up for those disadvantages, the proposed defective pixel detection method detects defective pixels efficiently by considering the edges in the image and verifies them using several frames while checking scene-changes. Whenever scene-change is occurred, potentially defective pixels are checked and confirmed whether it is defective or not. Test results showed that the correct detection rate in a frame was increased 6% and the defective pixel verification time was decreased 60%. The proposed algorithm was implemented with verilog HDL. The edge indicator in color interpolation block was reused. Total logic gate count was 5.4k using 0.25um CMOS standard cell library.

• Korean Journal of Digital Imaging in Medicine
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• v.10 no.1
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• pp.41-44
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• 2008

This paper will improve the quality of medical imaging to restore defective pixels on how to present the information you want to increase the efficiency, Using the filter is damaged pixel approximation of the same value to get value, but it is difficult to obtaion. How to get value for the restoration of the original imaged as a way to fill a sweater pattern of missing and how to restore the delta using the filter, compared to the extsting method of excellence.

• Smart Media Journal
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• v.12 no.9
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• pp.45-59
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• 2023

Weakly supervised object localization (WSOL) is a task of localizing an object in an image using only image-level labels. Previous studies have followed the conventional class activation mapping (CAM) pipeline. However, we reveal the current CAM approach suffers from problems which cause original CAM could not capture the complete defects features. This work utilizes a convolutional neural network (CNN) pretrained on image-level labels to generate class activation maps in a multi-scale manner to highlight discriminative regions. Additionally, a vision transformer (ViT) pretrained was treated to produce multi-head attention maps as an auxiliary detector. By integrating the CNN-based CAMs and attention maps, our approach localizes defective regions without requiring bounding box or pixel-level supervision during training. We evaluate our approach on a dataset of apple images with only image-level labels of defect categories. Experiments demonstrate our proposed method aligns with several Object Detection models performance, hold a promise for improving localization.

• Journal of the Semiconductor & Display Technology
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• v.19 no.3
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• pp.68-72
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• 2020

A new method for array testing of TFT-CD panel with the integrated gate driver circuits is presented. As larger size/high resolution TFT-LCD with the peripheral driver circuits has emerged, one of the important problems for manufacturing is array testing on the panel. This paper describes the technology of detecting defective arrays and optimizing the array testing process. For the effective characterization of pixel array, the pixel storage capability is simulated and measured with voltage imaging system. This technology permits full functional testing during the manufacturing process, enabling fabrication of large TFT-LCD panels with the integrated driver circuits.

• Electronics and Telecommunications Trends
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• v.37 no.2
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• pp.53-61
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• 2022

MicroLEDs have various advantages and application areas and are in the spotlight as next-generation displays. Nevertheless, the commercialization of microLEDs is slow because of high cost as well as difficulties in the transfer, bonding, and bad pixel repairing process. In this study, we review the development trends of transfer, bonding, and defective pixel repair technologies, which are critical for microLED commercialization, focusing on materials that determine these technologies. In addition, we focus on the simultaneous transfer bonding technology developed by the Electronics and Telecommunications Research Institute, which has been attracting enormous research attention recently.

• Journal of IKEEE
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• v.27 no.3
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• pp.345-349
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• 2023

In this paper, we propose a study on the development of deep learning structure for defective pixel detection of next-generation smart LED display board using imaging device. In this research, a technique utilizing imaging devices and deep learning is introduced to automatically detect defects in outdoor LED billboards. Through this approach, the effective management of LED billboards and the resolution of various errors and issues are aimed. The research process consists of three stages. Firstly, the planarized image data of the billboard is processed through calibration to completely remove the background and undergo necessary preprocessing to generate a training dataset. Secondly, the generated dataset is employed to train an object recognition network. This network is composed of a Backbone and a Head. The Backbone employs CSP-Darknet to extract feature maps, while the Head utilizes extracted feature maps as the basis for object detection. Throughout this process, the network is adjusted to align the Confidence score and Intersection over Union (IoU) error, sustaining continuous learning. In the third stage, the created model is employed to automatically detect defective pixels on actual outdoor LED billboards. The proposed method, applied in this paper, yielded results from accredited measurement experiments that achieved 100% detection of defective pixels on real LED billboards. This confirms the improved efficiency in managing and maintaining LED billboards. Such research findings are anticipated to bring about a revolutionary advancement in the management of LED billboards.

• Journal of Biomedical Engineering Research
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• v.30 no.6
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• pp.476-481
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• 2009

The most troublesome artifacts in micro computed tomography (micro-CT) are ring artifacts. The ring artifacts are caused by non-uniform sensitivity and defective pixels of the x-ray detector. These ring artifacts seriously degrade the quality of CT images. In flat-panel detector based micro-CT systems, the ring artifacts are hardly removed by conventional correction methods of digital radiography, because very small difference of detector pixel signals may make severe ring artifacts. This paper presents a novel method to remove ring artifacts in flat-panel detector based micro-CT systems. First, the bad lines of a sinogram which are caused by defective pixels of the detector are identified, and then, they are corrected using a cubic spline interpolation technique. Finally, a ring artifacts free image is reconstructed from the corrected projections. We applied the method to various kinds of objects and found that the image qualities were much improved.

• Transactions of the Society of Information Storage Systems
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• v.5 no.2
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• pp.89-95
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• 2009

We setup the system to measure the noise characteristics of the 5M complementary metal-oxide semiconductor (CMOS) image sensor by generic measurement indicator of Standard mobile imaging architecture (SMIA) which is one of internal standard of mobile imaging architecture. To evaluate the effect of environment and setting parameters, such as temperature and integration time, we measure the variation of the dark signal, dynamic range and fixed pattern noise of image sensor. We also detect the number of defective pixels and cluster defects defined as adjacent single defect pixels at 5M CMOS image sensor. Then, we find the existence of some cluster defects in experiment, which are not expected in calculation.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.25 no.12
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• pp.1853-1858
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• 2021

O-rings fill the gaps between mechanical parts. Until now, the sorting of defective products has been performed visually and manually, so classification errors often occur. Therefore, a camera-based defect classification system without human intervention is required. However, a binarization process is required to separate the required region from the background in the camera input image. In this paper, an adaptive binarization technique that considers the surrounding pixel values is applied to solve the problem that single-threshold binarization is difficult to apply due to factors such as changes in ambient lighting or reflections. In addition, the convex hull technique is also applied to compensate for the missing pixel part. And the learning model to be applied to the separated region applies the residual error-based deep learning neural network model, which is advantageous when the defective characteristic is non-linear. It is suggested that the proposed system through experiments can be applied to the automation of O-ring defect detection.

• Journal of Korea Multimedia Society
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• v.18 no.12
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• pp.1519-1527
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• 2015

TFT-LCD automatic defect inspection system for detecting defects in place of the visual tester does pre-processing, candidate defect pixel detection, and recognition and classification through a blob analysis. An over-detection result of defects acts as an undue burden of blob analysis for recognition and classification. In this paper, we propose defect detection method based on the histogram distribution modeling of TFT-LCD image to minimize over-detection of candidate defective pixels. Primary defect candidate pixels are detected estimating the skewness of the luminance distribution histogram of the background pixels. Based on the detected defect pixels, the defective pixels other than noise pixels are detected using the distribution histogram model of the local area. Experimental results confirm that the proposed method shows an excellent defect detection result on the image containing the various types of defects and the reduction of the degree of over-detection as well.