• Title/Summary/Keyword: Defect length

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Chondrogenic Effect of Transplanted Type I Collagen Scaffold within Subperichondrial Cartilage Defect (연골막하 연골 결손부에 삽입한 제 1형 아교질 지지체의 연골 재생 효과)

  • Lee, Hyuk Gu;Son, Dae Gu;Han, Ki Hwan;Kim, Jun Hyung;Lee, So Young
    • Archives of Plastic Surgery
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    • v.32 no.4
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    • pp.521-528
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    • 2005
  • The purpose of this research is to find out the degree of cartilage regeneration by inserting the atelo-collagen scaffold obtained from dermis of a calf on cartilage defect site. Dissection underneath the perichondrium by the periosteal elevator on both side of ears of six New Zealand white rabbits were made to expose the cartilage, leaving pairs of circular holes 3, 6, 9 mm width with punches. One hole was left for a control, and on the other hole atelo-collagen scaffold of the same size was transplanted. In postoperative 1, 2, 4 weeks, the tissues were dyed. The length of long axis of neocartilage was measured through an optical microscope with a 0.1 mm graduation at original magnification, ${\times}40$. In the first and second week, both group showed no sign of cartilage regeneration. In the fourth week, regeneration on marginal portions was observed on all groups and the average values of length of long axis of neocartilage according to defect size were as follows: In the cases with 3mm defect, it was $0.85{\pm}0.30mm$ in the control group, and $1.85{\pm}0.38mm$ in the graft group; in the cases with 6 mm defect, $1.33{\pm}0.58mm$ in the control group, and $2.25{\pm}0.46mm$ in the graft group; and in the cases with 9 mm defect, $2.33{\pm}0.77mm$ in the control group, and $4.47{\pm}1.39mm$ in the graft group. This means that the collagen scaffold has an influence on the regeneration of neocartilage. But the relative ratio of the length of neocartilage to cartilage defect size was not significant in the statistics.

Hump Characteristics of 64M DRAM STI(Shallow Trench Isolated) NMOSFETs Due to Defect (64M DRAM의 Defect 관련 STI(Shallow Trench Isolated) NMOSFET Hump 특성)

  • Lee, Hyung-J.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.05b
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    • pp.291-293
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    • 2000
  • In 64M DRAM, sub-1/4m NMOSFETs with STI(Shallow Trench Isolation), anomalous hump phenomenon of subthreshold region, due to capped p-TEOS/SiN interlayer induced defect, is reported. The hump effect was significantly observed as channel length is reduced, which is completely different from previous reports. Channel Boron dopant redistribution due to the defect should be considered to improve hump characteristics besides consideration of STI comer shape and recess.

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A study of electrical stress on short channel poly-Si thin film transistors (짧은 채널 길이의 다결정 실리콘 박막 트랜지스터의 전기적 스트레스에 대한 연구)

  • 최권영;김용상;한민구
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.32A no.8
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    • pp.126-132
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    • 1995
  • The electrical stress of short channel polycrystalline silicon (poly-Si) thin film transistor (TFT) has been investigated. The device characteristics of short channel poly-Si TFT with 5$\mu$m channel length has been observed to be significantly degraded such as a large shift in threshold voltage and asymmetric phenomena after the electrical stress. The dominant degradation mechanism in long channel poly-Si TFT's with 10$\mu$m and 20$\mu$m channel length respectively is charage trappling in gate oxide while that in short channel device with 5.mu.m channel length is defect creation in active poly-Si layer. We propose that the increased defect density within depletion region near drain junction due to high electric field which could be evidenced by kink effect, constitutes the important reason for this significant degradation in short channel poly-Si TFT. The proposed model is verified by comparing the amounts of the defect creation and the charge trapping from the strechout voltage.

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Dipole Model to Predict the Rectangular Defect on Ferromagnetic Pipe

  • Suresh, V.;Abudhair, A.
    • Journal of Magnetics
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    • v.21 no.3
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    • pp.437-441
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    • 2016
  • Dipole model based analytical expression is proposed to estimate the length and depth of the rectangular defect on ferromagnetic pipe. Among the three leakage profiles of Magnetic Flux Leakage (MFL), radial and axial leakage profiles are considered in this work. Permeability variation of the specimen is ignored by considering the flux density as close to saturation level of the inspected specimen. Comparing the profile of both the components, radial leakage profile furnishes the better estimation of defect parameter. This is evident from the results of error percentage of length and depth of the defect. Normalized pattern of the proposed analytical model radial leakage profile is good agreement with the experimentally obtained profile support the performance of proposed expression.

Development of Corrosion Defect Assessment Method for City Gas Pipeline (도시가스배관 부식결함 평가방안 개발)

  • Kim, Cheol-Man;Kim, Woo-Sik;Han, Sang-In;Choi, Song-Chun
    • Proceedings of the KSME Conference
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    • 2004.04a
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    • pp.228-233
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    • 2004
  • The length of city gas pipeline is increasing with expansion of natural gas transmission rapidly. A lot of the expense was paid for repair and maintenance with increasing of pipeline length and the cost of repair and maintenance by the corrosion was the highest. It is necessary to evaluate integrity in case of thickness reduction by corrosion. There are a lot of assessment criteria for corrosion defect in foreign countries but they are not suitable for application in the country directly. In this work, we performed the burst test and the finite element analysis for city gas pipeline, KS D3507 and KS D3631 for city gas transmission, and developed the assessment method of corrosion defect, which is suitable for domestic condition.

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Defects Length Measurement using an Estimation Algorithm of the Camera Orientation and an Inclination Angle of a Laser Slit Beam

  • Kim, Young-Hwan;Yoon, Ji-Sup;Kang, E-Sok
    • 제어로봇시스템학회:학술대회논문집
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    • 2004.08a
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    • pp.1452-1457
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    • 2004
  • In this paper, a method of measuring the length of defects on the wall and restructuring the defect image is proposed based on the estimation algorithm of a camera orientation which uses the declination angle of a laser slit beam. The estimation algorithm of the horizontally inclined angle of CCD camera adopts a 3-dimensional coordinate transformation of the image plane where both the laser beam and the original image of the defects exist. The estimation equation is obtained by using the information of the beam projected on the wall and the parameters of this equation are experimentally obtained. With this algorithm, the original image of the defect can be reconstructed to an image normal to the wall. From the result of a series of experiments, the measuring accuracy of the defect is measured within 0.5% error bound of real defect size under 30 degree of the horizontally inclined angle. The proposed algorithm provides the method of reconstructing the image taken at any arbitrary horizontally inclined angle to the image normal to the wall and thus, it enables the accurate measurement of the defect lengths only by using a single camera and a laser slit beam.

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Defects Length Measurement Using an Estimation Agorithm of the Camera Orientation and an Inclination Angle of a Laser Slit Beam (레이저 슬릿 빔의 경사각과 카메라 자세 추정 알고리듬을 이용한 벽면결함 길이측정)

  • Kim, Young-Hwang;Yoon, Ji-Sup;Kang, E-Sok
    • Journal of Institute of Control, Robotics and Systems
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    • v.8 no.1
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    • pp.37-45
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    • 2002
  • A method of measuring the length of defects on the wall and restructuring the defect image is proposed based on the estimation algorithm of a camera orientation, which uses the declination angle of a laser slit beam. The estimation algorithm of the horizontally inclined angle of CCD camera adopts a 3-dimensional coordinate transformation of the image plane where both the laser beam and the original image of the defects exist. The estimation equation is obtained by using the information of the beam projected on the wall and the parameters of this equation are experimentally obtained. With this algorithm, the original image of the defect can be reconstructed as an image normal to the wall. From the result of a series of experiments, the measuring accuracy of the defect is measured within 0.5% error bound of real defect size under 30 degree of the horizontally inclined angle. The proposed algorithm provides the method of reconstructing the image taken at any arbitrary horizontally inclined angle as the image normal as the wall and thus, it enables the accurate measurement of the defect lengths by using a single camera and a laser slit beam.

Optical-fiber Electronic Speckle Pattern Interferometry for Quantitative Measurement of Defects on Aluminum Liners in Composite Pressure Vessels

  • Kim, Seong Jong;Kang, Young June;Choi, Nak-Jung
    • Journal of the Optical Society of Korea
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    • v.17 no.1
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    • pp.50-56
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    • 2013
  • Optical-fiber electronic speckle pattern interferometry (ESPI) is a non-contact, non-destructive examination technique with the advantages of rapid measurement, high accuracy, and full-field measurement. The optical-fiber ESPI system used in this study was compact and portable with the advantages of easy set-up and signal acquisition. By suitably configuring the optical-fiber ESPI system, producing an image signal in a charge-coupled device camera, and periodically modulating beam phases, we obtained phase information from the speckle pattern using a four-step phase shifting algorithm. Moreover, we compared the actual defect size with that of interference fringes which appeared on a screen after calculating the pixel value according to the distance between the object and the CCD camera. Conventional methods of measuring defects are time-consuming and resource-intensive because the estimated values are relative. However, our simple method could quantitatively estimate the defect length by carrying out numerical analysis for obtaining values on the X-axis in a line profile. The results showed reliable values for average error rates and a decrease in the error rate with increasing defect length or pressure.

Defect evaluation of Fe metallic contamination in silicon wafers (Si 웨이퍼의 내부 금속 불순물 Fe의 결함분석)

  • 오민환;남효덕;김흥락;김동수;김영덕;김광일
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.07a
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    • pp.578-581
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    • 2001
  • Silicon wafers using DRAM devices required for high cleaning technology and this cleaning technology was evaluated by defect level or electron life time. This paper examined the correlation of SPV(Surface Photo Voltaic Analyzer) which analyzes diffusion length of minority carriers and DLTS(Deep level Transient Spectroscope) which analyzes defect level.

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Investigation of Turbulence Characteristics of Defect Law Region over Flat plate (평판 위 흐름 Defect Law 영역의 난류 특성 연구)

  • Suh, Sung-Bu;Park, Il-Ryong;Jung, Kwang-Hyo;Lim, Jung-Gwan;Kim, Kwang-Soo;Kim, Jin
    • Journal of Ocean Engineering and Technology
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    • v.28 no.4
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    • pp.268-273
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    • 2014
  • To investigate the turbulence characteristics within the boundary layer over a flat plate, an experimental study was performed using a PIV technique in a circular water channel. For two water velocities, 0.92 and 1.99 m/s, the water velocity profiles were taken and analyzed to determine turbulent characteristics such as the Reynolds stress, Taylor micro-length scale, and Kolmogorov length scale within the defect law region of the boundary layer. These analysis methods may be applied to research on the friction drag reduction technology using micro-bubbles or an air sheet over the surface of a ship's hull, because the physical reason for the friction drag reduction could be found by understanding the variation of the turbulence characteristics and structures in the boundary layer.