• Title/Summary/Keyword: Defect detection system

Search Result 286, Processing Time 0.034 seconds

FPGA based System for Pinhole Detection in Cold Rolled Steel (FPGA 기반의 냉연강판 핀홀 검출 시스템)

  • Ha, Sung-Kil;Lee, Jung Eun;Moon, Woo Sung;Baek, Kwang Ryul
    • Journal of Institute of Control, Robotics and Systems
    • /
    • v.21 no.8
    • /
    • pp.742-747
    • /
    • 2015
  • The quality of steel plate products is determined by the number of defects and the process problems are estimated by shapes of defects. Therefore pinholes defects of cold rolled steel have to be controlled. In order to improve productivity and quality of products, within each production process, the product is inspected by an adequate inspection system individually in the lines of steelworks. Among a number of inspection systems, we focus on the pinholes detection system. In this paper, we propose an embedded system using FPGA which can detect pinholes defects. The proposed system is smaller and more flexible than a traditional system based on expensive frame grabbers and PC. In order to detect consecutive defects, FPGAs acquire two dimensional image and process the image in real time by using correlation of lines. The proposed pinholes detection algorithm decreases arithmetic operations of image processing and also we designed the hardware to shorten the data path between logics due to decreasing propagation delay. The experimental results show that the proposed embedded system detects the reliable number of pinholes in real time.

A Method of Detecting Short and Protrusion-type FAB Defects Based on Local Binary Pattern Analysis (국부지역 이진 패턴 분석법에 기초한 단락 및 돌기형 FAB불량 검출기법)

  • Kim, Jin-soo
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
    • /
    • 2013.10a
    • /
    • pp.1018-1020
    • /
    • 2013
  • Conventionally, PCB fabrication processes detects simply electrical characteristics of TCP and COF by automatic manufacturing system and additionally, by introducing human visual detection, those are very ineffective in view of low cost implementation. So, this paper presents an efficient detection algorithm for short and protrusion-type defects based on reference images by using local binary pattern analysis. The proposed methods include several preprocessing techniques such as histogram equalizing, the compensation of spatial position and maximum distortion coordination Through several experiments, it is shown that the proposed method can improve the defect detection performance compared to the conventional schemes.

  • PDF

A Study on Image Annotation Automation Process using SHAP for Defect Detection (SHAP를 이용한 이미지 어노테이션 자동화 프로세스 연구)

  • Jin Hyeong Jung;Hyun Su Sim;Yong Soo Kim
    • Journal of Korean Society of Industrial and Systems Engineering
    • /
    • v.46 no.1
    • /
    • pp.76-83
    • /
    • 2023
  • Recently, the development of computer vision with deep learning has made object detection using images applicable to diverse fields, such as medical care, manufacturing, and transportation. The manufacturing industry is saving time and money by applying computer vision technology to detect defects or issues that may occur during the manufacturing and inspection process. Annotations of collected images and their location information are required for computer vision technology. However, manually labeling large amounts of images is time-consuming, expensive, and can vary among workers, which may affect annotation quality and cause inaccurate performance. This paper proposes a process that can automatically collect annotations and location information for images using eXplainable AI, without manual annotation. If applied to the manufacturing industry, this process is thought to save the time and cost required for image annotation collection and collect relatively high-quality annotation information.

Weld Quality Monitoring System Development Applying A design Optimization Approach Collaborating QFD and Risk Management Methods (품질 기능 전개법과 위험 부담 관리법을 조합한 설계 최적화 기법의 용접 품질 감시 시스템 개발 응용)

  • Son, Joong-Soo;Park, Young-Won
    • Journal of Institute of Control, Robotics and Systems
    • /
    • v.6 no.2
    • /
    • pp.207-216
    • /
    • 2000
  • This paper introduces an effective system design method to develop a customer oriented product using a design optimization process and to select a set of critical design paramenters,. The process results in the development of a successful product satisfying customer needs and reducing development risk. The proposed scheme adopted a five step QFD(Quality Function Deployment) in order to extract design parameters from customer needs and evaluated their priority using risk factors for extracted design parameters. In this process we determine critical design parameters and allocate them to subsystem designers. Subsequently design engineers develop and test the product based on these parameters. These design parameters capture the characteristics of customer needs in terms of performance cost and schedule in the process of QFD, The subsequent risk management task ensures the minimum risk approach in the presence of design parameter uncertainty. An application of this approach was demonstrated in the development of weld quality monitoring system. Dominant design parameters affect linearity characteristics of weld defect feature vectors. Therefore it simplifies the algorithm for adopting pattern classification of feature vectors and improves the accuracy of recognition rate of weld defect and the real time response of the defect detection in the performance. Additionally the development cost decreases by using DSP board for low speed because of reducing CPU's load adopting algorithm in classifying weld defects. It also reduces the cost by using the single sensor to measure weld defects. Furthermore the synergy effect derived from the critical design parameters improves the detection rate of weld defects by 15% when compared with the implementation using the non-critical design parameters. It also result in 30% saving in development cost./ The overall results are close to 95% customer level showing the effectiveness of the proposed development approach.

  • PDF

A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform (웨이블릿 다해상도 분석에 의한 디지털 이미지 결점 검출 알고리즘)

  • Kim, Kyung-Joon;Lee, Chang-Hwan;Kim, Joo-Yong
    • Textile Coloration and Finishing
    • /
    • v.21 no.1
    • /
    • pp.53-58
    • /
    • 2009
  • A real-time inspection system has been developed by combining CCD based image processing algorithm and a standard lighting equipment. The system was tested for defective fabrics showing nozzle contact scratch marks, which were one of the frequently occurring defects. Multi-resolution analysis(MRA) algorithm were used and evaluated according to both their processing time and detection rate. Standard value for defective inspection was the mean of the non-defect image feature. Similarity was decided via comparing standard value with sample image feature value. Totally, we achieved defective inspection accuracy above 95%.

Study on Machine Vision Algorithms for LCD Defects Detection (LCD 결함 검출을 위한 머신 비전 알고리즘 연구)

  • Jung, Min-Chul
    • Journal of the Semiconductor & Display Technology
    • /
    • v.9 no.3
    • /
    • pp.59-63
    • /
    • 2010
  • This paper proposes computer visual inspection algorithms for various LCD defects which are found in a manufacturing process. Modular vision processing steps are required in order to detect different types of LCD defects. Those key modules include RGB filtering for pixel defects, gray-scale morphological processing and Hough transform for line defects, and adaptive threshold for spot defects. The proposed algorithms can give users detailed information on the type of defects in the LCD panel, the size of defect, and its location. The machine vision inspection system is implemented using C language in an embedded Linux system for a high-speed real-time image processing. Experiment results show that the proposed algorithms are quite successful.

Detection System for Sub-micrometer Defects of a Photo-mask Using On-axis Interference between Reflected and Scattered Lights

  • Lee, Sangon;Jo, Jae Heung;Kim, Jong Soo;Moon, Il Kweon
    • Journal of the Optical Society of Korea
    • /
    • v.17 no.1
    • /
    • pp.73-80
    • /
    • 2013
  • In the process of lithography using ultra violet light sources for semiconductor devices, most of defects are made by sub-micrometer pollutants generated at photochemical reactions. We proposed and developed a novel vibration-insensitive on-axis interferometer with a sub-micrometer lateral resolution by using the interference between two beams: one scattered from defects and the other reflected from a reference area without defects. The proposed system was successfully demonstrated to detect a small Al defect of 0.5 ${\mu}m$ diameter within the inspection time of less than 30 minutes over the area of the photo-mask which is 6 inch by 6 inch square.

Vision Based Tire Mold Defect Inspection and Printing System (비전기반 타이어 몰드 불량 검사 및 검사서 출력 시스템)

  • Lee, Si-Woong;Kang, Hyun-Soo
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.25 no.6
    • /
    • pp.849-852
    • /
    • 2021
  • This paper presents a vision based tire mold inspection system where mold defects are inspected and the sizes of specific parts of the mold are measured. There are a lot of challenging issues as letters and pictures of intaglio are engraved on a bright surface of the tire mold. To solve the issues, we carefully selected a line-scan camera and a line light. In addition, we used PLC to control the mechanical parts. The developed system provides inspection of misspelled and deformed letters as well as a variety of the functions such as size measurement of engraved regions and inspection report file creation.