• The KIPS Transactions:PartD
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• v.15D no.3
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• pp.313-320
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• 2008

A typical software development life cycle consists of a series of phases, each of which has some ability to insert and detect defects. To achieve desired quality, we should progress the defect removal with the all phases of the software development. The well-known model of phase-based defect profile is Gaffney model. This model assumes that the defect removal profile follows Rayleigh curve and uses the parameters as the phase index number. However, these is a problem that the location parameter cannot present the peak point of removed defects when you apply Gaffney model to the actual situation. Therefore, Gaffney model failed to represent the actual defect profile. This paper suggests two different models: One is modified Gaffney model that introduce the parameter of Putnam's SLIM model to replace of the location parameter, the other is the growth function model because the cumulative defect profile shows S-shaped. Suggested model is analyzed and verified by the defect profile sets that are obtained from 5 different software projects. We could see from the experiment, the suggested model performed better result than Gaffney model.

• Journal of Magnetics
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• v.21 no.3
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• pp.437-441
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• 2016

Dipole model based analytical expression is proposed to estimate the length and depth of the rectangular defect on ferromagnetic pipe. Among the three leakage profiles of Magnetic Flux Leakage (MFL), radial and axial leakage profiles are considered in this work. Permeability variation of the specimen is ignored by considering the flux density as close to saturation level of the inspected specimen. Comparing the profile of both the components, radial leakage profile furnishes the better estimation of defect parameter. This is evident from the results of error percentage of length and depth of the defect. Normalized pattern of the proposed analytical model radial leakage profile is good agreement with the experimentally obtained profile support the performance of proposed expression.

• Journal of Korean Society for Quality Management
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• v.43 no.3
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• pp.273-288
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• 2015

Purpose: In this study, we apply environmental stress screening (ESS) to battle management system (BMS) of a tank and use the ESS profile based on production process data, guided by MIL-HDBK-781/344/2164. Methods: To optimize ESS Profile of the BMS of a tank, we estimate ESS model parameters (e.g., defect density, screening strength) using primary production failure reporting and corrective action system (FRACAS) data of military supply contract firm. Results: First, we collect the Primary production FRACAS data of military supply contract firm. Second, we compute curve fitting approach to find patent defect density and latent defect density using FRACAS data. Third, we solve the equation of Defect Density(patent defect density + latent defect density)($D_{IN}$) and Screening Strength(SS) Using second step data. As a result of analysis according to the order, we calculate $D_{IN}$(Temperature stress case : 74.02, Vibration stress : 10.252) and : SS(Temperature stress case : 0.4632, Vibration stress : 0.4142) and confirm the Condition II-D based on MIL-HDBK-344. According to Condition II-D, it is necessary to modify existing ESS profile through decreasing the $D_{IN}$ and increasing the SS. Conclusion: Identification of defect causes through ESS approach reduce defect densities for production. It provides feedback to a lessons-learned data base to avoid similar problems on next generation tank BMS.

• Electrical & Electronic Materials
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• v.10 no.9
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• pp.881-888
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• 1997

This study demonstrats the profiles of phosphorus ions in silicon by MeV implantation(1∼3 MeV). Implanted profiles could be measured by SIMS(Cameca 4f) and compared with simulation results(TRIM program and analytical description method only using on Pearson function). The experimental result in the peak concentration region has a little bit deviation from simulation data. By RBS and Channeling measurements the defect distribution of implanted samples could be measured and spectrum are calibrated depth with RUMP simulation By XTEM measurement the thickness of defect zone also could be measured. Finally thermal annealing for the electrical activation of implanted ions carried out by RTA(rapid thermal annealing). The concentration-depth profiles after heat treatment was measured by SR(spreading resistance)-method.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.17 no.8
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• pp.379-388
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• 2016

There are various system defects from weapons manufacturing due to the numerous production processes and various production environments. The first kind of defect is patent defects, which can be detected by visual inspection, functional testing, and existing quality control procedures during the manufacturing process. The second kind is latent defects, which cannot be detected though existing quality management approaches because of the complexity of the system and manufacturing process. To minimize the initial defect problems, environmental stress screening (ESS) is needed to detect the defects, remove them, and improve the product conditions based on the environmental stress conditions of temperature and vibration. We implemented a tool for quantitative ESS effectiveness analysis and profile design automation based on MIL-HDBK-344 and verified it using six scenarios with different temperature stress, vibration stress, and test designs.

• Journal of the Korean Vacuum Society
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• v.5 no.3
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• pp.218-222
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• 1996

STrained layers and strain depth profile of high dose As ion implanted (100) si wafer annealed at various temperatures have been investigated by means of X-ray double crystal diffractometry (X-ray DCD). The results obtained by x-ray rocking curve analysis showed a defect layer at the original amorphous /crystalline interface of 1400$\AA$ depth. In addition arsenic ion concentrtion profiles and defect distributions in depth were obtained by the SIMS and TRIM -code simulation . the positive strain depth profile determined from the rocking curve analysis were only presented under 0.14 $\mu$m from the surface for samples ananelaed at $600^{\circ}C$. The results was shown that the thickness of amprphous layer is 0.14 $\mu$m indirectry, and it was good agreement with the TRIM -Code simulation. Additionally, it could be thought that the positive strain have been affected residual intersitial atoms under the amorphous/crystalline interface formed by ion implantation.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.374-374
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• 2012

반도체 소자의 크기가 100 nm 이하로 감소되면 통상적인 이온 주입 조건인 이온 에너지, 조사량 및 이온 주입 각도뿐만 아니라 Dose Rate 및 모재 온도가 Dopant Profile을 조절하는 데에 있어서 매우 중요한 인자로 작용한다. 본 연구에서는 Ribbon-beam 및 Spot-beam을 사용하여 활성화 열처리 후 Dopant Profile을 분석하였다. 이온 주입은 모든 시편에서 $BF_2$를 가속 에너지 10 keV 및 조사량 $2{\times}10^{15}/cm^2$로 고정하였다. 이온 주입 후 도펀트 활성화는 100% 질소 분위기 하에서 $850^{\circ}C$-30s 조건으로 RTA 열처리를 수행하였다. Boron 및 Fluorine의 Profile은 SIMS 분석을 통하여 구하였다. Spot-beam은 Ribbon-Beam에 비하여 Dose Rate 및 Cooling Efficiency가 높기 때문에 이온 주입 후 더욱 많은 양의 Primary-defect를 발생시키고 이에 따라 두꺼운 비정질 충을 형성한다. $BF_2$ 이온 주입 된 시편에서 B 및 F의 농도 Peak-height는 a/c 계면에 위치하는 것을 관찰하였다. 또한 B 및 F의 농도 Peak-height는 Silicon 모재의 온도가 증가할수록 증가하는 것을 관찰하였다. Silicon 모재의 온도가 증가함에 따라 Active-area의 면저항이 변화하지 않는 상태에서 Vt (Threshold Voltage)가 급격히 감소함을 관찰 하였다. 비정칠 층의 두께가 증가할수록 a/c 계면 하단에 잔존하는 Residual-defect의 양이 감소하고 이는 측면확산을 감소시키는 역할을 한다는 것이 관찰되었다.

• Proceedings of the Korean Society for Technology of Plasticity Conference
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• 2004.08a
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• pp.307-316
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• 2004

This study examined the cause of the wrinkle defect which is frequently encountered in wire rod rolling of low carbon steel$(C0.08\~0.13wt.\%)$. Even a small defect on the surface of rolled bars can easily develop into fatal cracks during cold heading process of low carbon steel, and it is therefore necessary to minimize inherent defects on the surface of hot rolled bars. Hot rolling process of low carbon steel was analyzed to identify the cause of the wrinkle defect in conjunction with FE analysis. The integrated analysis revealed that the wrinkle defect initiated in the first stage of rolling, and it was at the billet edge where severe deformation and drastic temperature drop were present. To elucidate the micro-mechanical mechanism of the wrinkle defect, hot compression tests were carried out at various temperatures and strain rates using Gleeble-3800. The surface profile of the each other compressed specimens was compared, and rough surface lines were observed at relatively low temperatures. Those surface defects can develop into wrinkles during multi-pass rolling. To control the wrinkle defect in rolling, it is necessary to design an adequate caliber which can minimize the loss of ductility, and thereby prevent flow localization. To use the result of this study fur other steels, the quantitative measure of the wrinkle defect and flow localization parameter should be proposed.

• Transactions of Materials Processing
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• v.23 no.6
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• pp.369-375
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• 2014

Flexible roll forming allows profiles to have variable cross-sections. However, the profile may have some shape errors, such as, warping which is a major defect. The shape error is induced by geometrical deviations in both the concave zone and the convex zone. In the current study, flexible roll forming was modeled with FE simulations to analyze the shape error and the longitudinal strain distribution along the flange section over the profile. A distribution of analytically calculated longitudinal strains was used to develop relationships between the shape error and the longitudinal strain distribution as a function of the defined shape parameters for the profile. The FE simulations showed that the shape error is primarily affected by the deviations between the distribution of analytically calculated longitudinal strain and the longitudinal strain distribution of the profile. The results show that the shape error can be controlled by designing the shape parameters to control the geometrical deviations at the flange section in the transition zones.

• Journal of the Korean Society for Nondestructive Testing
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• v.6 no.1
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• pp.23-30
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• 1986

The optimumultrasonic test conditions for the thin carbon fiber reinforced plastic (CFRP) sheet were determined for the immersed reflector plate method. The effects of the water distance, the surface conditions of the specimen and transducer characteristics were studied. For a reliable test the water distance between the transducer and the front surface of the specimen should be determined when the beam profile of the transducer appears in the bell-shape. The detectability of the defect was improved as the effective beam width of the ultrasonic transducer became narrow. The transducer should be properly chosen considering to the surface condition of the test material as well as the size and type of the defect to be detected. It was possible to detect the flat bottom hole whose diameter is as small as about 500 micrometer.