• 한국정보디스플레이학회:학술대회논문집
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• 2009.10a
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• pp.590-593
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• 2009

In the 2D local dimmable LED backlight system, each LED segment can be controlled separately. This can enhance the contrast ratio and reduce overall power consumption of LCDs. However, an artifact such as 'halo mura' can be observed around the bright object in the dark background. This is caused by the light leakage from the bright area into the dark one. Therefore, the 'halo mura' can be more easily observed in the oblique viewing direction. Thus, in this study, the perceivable degree of the halo mura is evaluated according to the level of the off-axis light leakage of LCDs. It is found that an acceptable degree of halo mura can be obtained in 2.0 cd/$m^2$ of the diagonal light leakage. In addition, the halo mura is unperceivable under 0.7 cd/$m^2$ of the diagonal light leakage which can be achieved with optimally compensated polarizers.

• Journal of computational fluids engineering
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• v.16 no.3
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• pp.47-51
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• 2011

Dark Mura phenomena which can happen at the region with high temperature gradient in a Notebook LCD Monitor using LED light source has numerically been studied. The calculation was conducted under the nearly realistic conditions by considering the anisotropic thermal properties of materials and the real dimensions of each component. The two performance indices of LED monitor, i.e., the maximum temperature and the spacial gradient of temperature were examined for the various shapes, lengths and thickness of heat sink plate. Calculated results give more reasonable temperature distribution comparing with experimental results.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.8
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• pp.871-874
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• 2004

In recent, it is said that the trend of LCD is direction to pursue high qualities like as high transmittance, high contrast ratio, wide viewing angle, fast response time, and so on. Especially, it is known that these qualities are essential to large size LCD like as LCD TV and we can realize them through to uniform cell gap and deep black state. Until now, the ball spacer has been used to control of uniform cell gap. However, the existence of ball spacer inside the cell causes the deformation of the liquid crystal molecules and damage to alignment layer. Such a deformation of the liquid crystal causes light-leakage in the dark state, which lowers contrast ratio of the display. Nowadays, this problem has been solved by using Patterned Spacer on Color Filter. but Side Effect just as gravity mura has been induced. In this paper, we studied the mechanism on gravity mura in case of using patterned spacer on color filter.

• Journal of Institute of Control, Robotics and Systems
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• v.14 no.5
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• pp.415-419
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• 2008

Detecting and correcting defects on LCD glasses early in the manufacturing process becomes important for panel makers to reduce the manufacturing costs and to improve productivity. Many attempts have been made and were successfully applied to detect and identify simple defects such as scratches, dents, and foreign objects on glasses. However, it is still difficult to robustly detect low-contrast defect region, called Mura or blemish area on glasses. Typically, these defect areas are roughly defined as relatively large, several millimeters of diameter, and relatively dark and/or bright region of low Signal-to-Noise Ratio (SNR) against background of low-frequency signal. The aim of this article is to present a robust algorithm to segment these blemish defects. Early 90's, a highly robust estimator, known as the Model-Fitting (MF) estimator was developed by X. Zhuang et. al. and have been successfully used in many computer vision application. Compared to the conventional Least-Square (LS) estimator the MF estimator can successfully estimate model parameters from a dataset of contaminated Gaussian mixture. Such a noise model is defined as a regular white Gaussian noise model with probability $1-\varepsilon$ plus an outlier process with probability $varepsilon$. In the sense of robust estimation, the blemish defect in images can be considered as being a group of outliers in the process of estimating image background model parameters. The algorithm developed in this paper uses a modified MF estimator to robustly estimate the background model and as a by-product to segment the blemish defects, the outliers.