• Journal of the Korean Statistical Society
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• 제30권1호
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• pp.89-98
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• 2001

Brown and Proschan(1983) introduced a model for imperfect repair. At each failure of a device, with probability p, it is repaired completely or replaced with a new device(perfect repair), and with probability 1-p, it is returned to the functioning state, but it is only recovered to its condition just prior to failure(imperfect repair or minimal repair). In this paper, we limit the number of consecutive minimal repairs by n. We find some useful properties about $\mu$$_{k}$, the expected time between the k-th and the (k+1)-st repair under he assumption that only minimal repairs are performed. Then, we assign cost to each repair and find the value of n which minimized the long-run average cost for a fixed p under the condition that the life distribution F os the device is DMRL.L.

• Journal of the Korean Statistical Society
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• 제28권4호
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• pp.515-522
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• 1999

A repair process of a system consisting of both perfect repairs and minimal repairs is introduced. The type of repair, when the system fails, is determined by an embedded two state Markov chain. We study several stochastic properties of the process including the preservation of ageing properties and the monotonicities of the time between successive repairs. After assigning repair costs to the process, we also show that an optimal repair policy uniquely exists, if the underlying life distribution of the system has DMRL.

• 품질경영학회지
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• 제22권1호
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• pp.152-161
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• 1994

In this paper we develop a test for alternatives representing decreasing mean residual life. The test statistic for decreasing mean residual life, $K_{1n}$, is a modified version of Hollander and Proschan's test $V^*$ and critical constants and large sample approximation are shown to make the test readily applicable. Consistency is also shown for the tests based on $K_{1n}$. And small sample powers for four alernatives are obtained.

• International Journal of Reliability and Applications
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• 제7권1호
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• pp.1-11
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• 2006

The better mean residual life at $t_0\;(BMRL-t_0)$ class of life distribution is introduced by Kulasekara and Park (1987). They proved that the $BMRL-t_0$ class contains the DMRL class, but it is a proper subclass of the NBUE class. In this paper we develop a new family of tests for testing exponentiality against the $BMRL-t_0\;(WMRL-t_0)$ alternatives based on the goodness of fit approach. It is shown that the suggested test is better than the one introduced by Kulasekara and Park (1987) in the sense of Pitman asymptotic efficiency values.

• 한국신뢰성학회지:신뢰성응용연구
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• 제18권3호
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• pp.220-228
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• 2018

Purpose: The purpose of this study is to investigate the tail behavior of the life distribution which exhibits an increasing failure rate or other positive aging effects after a certain time point. Methods: We characterize the tail behavior of the life distribution with regard to certain reliability measures such as failure rate, mean residual life and reliability function and derive several stochastic properties regarding such life distributions. Also, utilizing an L-statistic and its asymptotic normality, we propose new nonparametric testing procedures which verify if the life distribution has an increasing tail failure rate. Results: We propose the IFR-Tail (Increasing Failure Rate in Tail), DMRL-Tail (Decreasing Mean Residual Life in Tail) and NBU-Tail (New Better than Used in Tail) classes, all of which represent the tail behavior of the life distribution. And we discuss some stochastic properties of these proposed classes. Also, we develop a new nonparametric test procedure for detecting the IFR-Tail class and discuss its relative efficiency to explore the power of the test. Conclusion: The results of our research could be utilized in the study of wide range of applications including the maintenance and warranty policy of the second-hand system.

• Communications for Statistical Applications and Methods
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• 제2권2호
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• pp.20-32
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• 1995

The concept of positive ageing describes the adverse effects of age on the lifetime of units. Various aspects of this concept are described in terms of conditional probability distribution of residual life times, failure rates, equilibrium distributions, etc. In this paper, we will consider some partial ordering relations of life distributions under residual life functions and equilibrium distributions. Under residual life distributions, we study the relationships of IFR, NBU and NBUFR classes and that of DMRL and NBUE classes, By using WLR ordering comparison between F and its equilibrium $H_F$, we can decide if F belongs to NBUFR class.

• 한국신뢰성학회:학술대회논문집
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• 한국신뢰성학회 2000년도 춘계학술대회 발표논문집
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• pp.63-70
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• 2000

Brown and Proschan(1983) introduced a model for imperfect repair. At each feilure of a device, with probability p, it is repaired completely or replaced with a new device(perfect repair), and with probability 1 - p, it is returned to the functioning state, but it is only recovered to its condition just prior to failure(imperfect repair or minimal repair). In this paper, we limit the number of consecutive minimal repairs by n. We find some useful properties about ${\mu}$$\_$k/, the expected time between the k-th and the (k + 1)-st repair under the assumption that only minimal repairs are performed. Then, we assign cost to each repair and find the value of n which minimizes the long-run average cost for a fixed p under the condition that distribution F of the device is DMRL.