• Title/Summary/Keyword: DEA-ANP

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A Study of CPC-based Technology Classification Analysis Model of Patents (CPC 기반 특허 기술 분류 분석 모델)

  • Chae, Soo-Hyeon;Gim, Jangwon
    • The Journal of the Korea Contents Association
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    • v.18 no.10
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    • pp.443-452
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    • 2018
  • With the explosively increasing intellectual property rights, securing technological competitiveness of companies is more and more important. In particular, since patents include core technologies and element technologies, patent analysis researches are actively conducted to measure the technological value of companies. Various patent analysis studies have been conducted by the International Patent Classification(IPC), which does not include the latest technical classification, and the technical classification accuracy is low. In order to overcome this problem, the Cooperative Patent Classification(CPC), which includes the latest technology classification and detailed technical classification, has been developed. In this paper, we propose a model to analyze the classification of the technologies included in the patent by using the detailed classification system of CPC. It is possible to analyze the inventor's patents in consideration of the relation, importance, and efficiency between the detailed classification schemes of the CPCs to extract the core technology fields and to analyze the details more accurately than the existing IPC-based methods. Also, we perform the comparative evaluation with the existing IPC based patent analysis method and confirm that the proposed model shows better performance in analyzing the inventor's core technology classification.