• Journal of IKEEE
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• v.27 no.3
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• pp.234-238
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• 2023

In this paper, we propose a time-to-digital converter (TDC) with compensation capability for PVT (process, voltage, and temperature) variations. A typical delay line-based TDC measures time based on the inverter's propagation delay, making it fundamentally sensitive to PVT variations. This paper presents a method to minimize the resolution change of TDC by compensating for the propagation delay caused by the PVT variations. Additionally, it dopts Cyclic Vernier TDC (CVTDC) structure to provide a wide input detection range. The proposed CVTDC with PVT compensation function is designed using a 45nm CMOS process, consumes 8mW of power, offers a TDC resolution of 5 ps, and has an input detection range of about 5.1 ns.