• The Korean Journal of Applied Statistics
• /
• v.30 no.3
• /
• pp.487-501
• /
• 2017

A machine vision system (MVS) is a computer system that utilizes one or more image-capturing devices to provide image data for analysis and interpretation. Recently there have been a number of industrial- and medical-device applications where control charts have been proposed for use with image data. The use of image-based control charting is somewhat different from traditional control charting applications, and these differences can be attributed to several factors, such as the type of data monitored and how the control charts are applied. In this paper, we investigate the adjustment effect of image size and region of interest (ROI) size, when we use control charts to monitor grayscale image data in industry.

• Journal of the Korean Society of Safety
• /
• v.31 no.4
• /
• pp.35-41
• /
• 2016

In order to guarantee the process safety and prevent accidents, the deviations from normal operating conditions should be monitored and their root causes have to be identified as soon as possible. The statistical theories-based method among various fault diagnosis methods has been gaining popularity, due to simplicity and quickness. However, according to fault magnitudes, the scalar value generated by statistical methods can be changed and this point can lead to produce wrong information. To solve this difficulty, this work employs PCA (Principal Component Analysis) based method with qualitative information. In the case study of our previous study, the number of assumed faults is much smaller than that of process variables. In the case study of this study, the number of predefined faults is 19, while that of process variables is 6. It means that a fault diagnosis becomes more difficult and it is really hard to isolate a single fault with a small number of variables. The PCA model is constructed under normal operation data in order to get a loading vector and the data set of assumed faulty conditions is applied with PCA model. The significant changes on PC (Principal Components) axes are monitored with CUSUM (Cumulative Sum Control Chart) and recorded to make the information, which can be used to identify the types of fault.

• Journal of Korean Society of Industrial and Systems Engineering
• /
• v.22 no.51
• /
• pp.1-10
• /
• 1999

In recent industry society, it is revealed that, as an increase in the use of automated manufacturing and process inspection technology, the data from mass production system exhibits some degrees of autocorrelation. The operation characteristics of traditional control charts developed under the independence assumption are adversely affected by the presence of serial correlation. Therefore, when autocorrelated construction contacted with time-series models explain, the time-series models are the Box-Jenkins forecast models which have been proposed as the best forecasting tool which allows for partitioning of variation into result from the autocorrelation structure and variation due to unusual but assignable causes. In this paper, for the AR(1) process of Box-Jenkins forecast models, when the constant term ξ are zero and different from zero, I want to analyze the sensitivity of (equation omitted), CUSUM and EWMA control chart for forecast residuals.

• Journal of Korean Society for Quality Management
• /
• v.23 no.3
• /
• pp.33-44
• /
• 1995

This paper presents an automated visual inspection system for the electronic parts manufacturing process. In this system, a statistical process control (SPC) method is integrated into the automated inspection method on a real time base. It shows how the collected data can be analyzed with the SPC to provide process information. Also presented are studies of subpixel image processing technology to improve the accuracy of parts measurements, and the cumulative-sum (CUSUM) control chart for fraction defectives. An application of the developed system to connector manufacturing process as a part of computer integrated manufacturing (CIM) is presented.

• The Korean Journal of Applied Statistics
• /
• v.28 no.5
• /
• pp.907-920
• /
• 2015

Charts based on geometric distribution are effective to monitor the proportion of nonconforming items in high-quality processes where the in-control proportion nonconforming is low. The implementation of this chart is often based on the assumption that in-control proportion nonconforming is known or accurately estimated. However, accurate parameter estimation is very difficult and may require a larger sample size than that available in practice for high-quality process where the proportion of nonconforming items is very small. An inaccurate estimate of the parameter can result in estimated control limits that cause unreliability in the monitoring process. The maximum likelihood estimator (MLE) is often used to estimate in-control proportion nonconforming. In this paper, we recommend a Bayes estimator for the in-control proportion nonconforming to incorporate practitioner knowledge and avoid estimation issues when no nonconforming items are observed in the Phase I sample. The effects of parameter estimation on the geometric chart and the geometric CUSUM chart are considered when the MLE and the Bayes estimator are used. The results show that chart performance with estimated control limits based on the Bayes estimator is generally better than that based on the MLE.

• Journal of radiological science and technology
• /
• v.39 no.4
• /
• pp.527-534
• /
• 2016

Dual-energy X-ray absorptiometry (DEXA) is the most widely used technical instrument for evaluating bone mineral content (BMC) and density (BMD) in patients of all ages. In 2016, DEXA devices operating is 5617 in Korea. In this study we investigated the quality of management practices survey for DEXA equipment and we analyzed it. We got a survey response rate of 12.6%. Accurate bone densitometry test is used data for estimation a patient's risk of fracture. However, improper bone densitometry will increase the possibility of causing a false positive. Therefore. it is essential to use the proper aids accurate bone densitomenty to be performed, and the quality control of the device to reduce the error factor of the tester through the training to reduce error for the device and the attitude.

• Journal of the Korea Society for Simulation
• /
• v.18 no.3
• /
• pp.103-112
• /
• 2009

In a nuclear power plant (NPP), periodic sensor calibrations are required to assure sensors are operating correctly. However, only a few faulty sensors are found to be calibrated. For the safe operation of an NPP and the reduction of unnecessary calibration, on-line calibration monitoring is needed. In this paper, principal component-based Auto-Associative support vector regression (PCSVR) was proposed for the sensor signal validation of the NPP. It utilizes the attractive merits of principal component analysis (PCA) for extracting predominant feature vectors and AASVR because it easily represents complicated processes that are difficult to model with analytical and mechanistic models. With the use of real plant startup data from the Kori Nuclear Power Plant Unit 3, SVR hyperparameters were optimized by the response surface methodology (RSM). Moreover the statistical techniques are integrated with PCSVR for the failure detection. The residuals between the estimated signals and the measured signals are tested by the Shewhart Control Chart, Exponentially Weighted Moving Average (EWMA), Cumulative Sum (CUSUM) and generalized likelihood ratio test (GLRT) to detect whether the sensors are failed or not. This study shows the GLRT can be a candidate for the detection of sensor drift.

• Journal of the Korean Society of Safety
• /
• v.34 no.4
• /
• pp.59-67
• /
• 2019

Since it is really hard to construct process models based on prior process knowledges, various statistical approaches have been employed to build fault diagnosis models. However, the crucial drawback of these approaches is that the solutions may vary according to the fault magnitude, even if the same fault occurs. In this study, the parameter monitoring approach is suggested. When a fault occurs in a chemical process, this leads to trigger the change of a process model and the monitoring parameters of process models is able to provide the efficient fault diagnosis model. A few important variables are selected and their predictive models are constructed by partial least square (PLS) method. The Euclidean norms of parameters of PLS models are estimated and a fault diagnosis can be performed as comparing with parameters of PLS models based on normal operational conditions. To improve the monitoring performance, cumulative summation (CUSUM) control chart is employed and the changes of model parameters are recorded to identify the type of an unknown fault. To verify the efficacy of the proposed model, Tennessee Eastman (TE) process is tested and this model can be easily applied to other complex processes.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2012.02a
• /
• pp.436-437
• /
• 2012

Double patterning technology (DPT) has been suggested as a promising candidates of the next generation lithography technology in FLASH and DRAM manufacturing in sub-40nm technology node. DPT enables to overcome the physical limitation of optical lithography, and it is expected to be continued as long as e-beam lithography takes place in manufacturing. Several different processes for DPT are currently available in practice, and they are litho-litho-etch (LLE), litho-etch-litho-etch (LELE), litho-freeze-litho-etch (LFLE), and self-aligned double patterning (SADP) [1]. The self-aligned approach is regarded as more suitable for mass production, but it requires precise control of sidewall space etch profile for the exact definition of hard mask layer. In this paper, we propose etch end point detection (EPD) in spacer etching to precisely control sidewall profile in SADP. Conventional etch EPD notify the end point after or on-set of a layer being etched is removed, but the EPD in spacer etch should land-off exactly after surface removal while the spacer is still remained. Precise control of real-time in-situ EPD may help to control the size of spacer to realize desired pattern geometry. To demonstrate the capability of spacer-etch EPD, we fabricated metal line structure on silicon dioxide layer and spacer deposition layer with silicon nitride. While blanket etch of the spacer layer takes place in inductively coupled plasma-reactive ion etching (ICP-RIE), in-situ monitoring of plasma chemistry is performed using optical emission spectroscopy (OES), and the acquired data is stored in a local computer. Through offline analysis of the acquired OES data with respect to etch gas and by-product chemistry, a representative EPD time traces signal is derived. We found that the SE-EPD is useful for precise control of spacer etching in DPT, and we are continuously developing real-time SE-EPD methodology employing cumulative sum (CUSUM) control chart [2].