• Title/Summary/Keyword: Crystallographic image processing (CIP)

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Three-dimensional Structure Analysis of $SmZn_{0.67}Sb_2$ by Transmission Electron Microscopy (투과전자현미경을 이용한 $SmZn_{0.67}Sb_2$의 3차원적 구조 분석)

  • Kim, Jin-Gyu;Kang, Sung-Kwon;Kim, Wan-Cheol;Kim, Youn-Joong
    • Applied Microscopy
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    • v.34 no.4
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    • pp.255-264
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    • 2004
  • The three-dimensional (3D) structure of an inorganic crystal, $SmZn_{0.67}Sb_2$ (space group P4/nmm, $a=4.26{\AA}\;and\;c=10.37{\AA}$) was solved by electron crystallography. High resolution electron microscopy (HREM) images from 3 different major zone axes and selected-area electron diffraction patterns from 16 different zone axes were combined to obtain a 3D information. A crystallographic image processing (CIP) of HREM images was used for more accurate determination of the crystal structure. As a result of this electron crystallography, average phase errors (${\Phi}_{res}$) of [001], [100] and [110] HREM images are $17.0^{\circ},\;8.3^{\circ}\;and\;21.9^{\circ}$, respectively. Xray crystallography of $SmZn_{0.67}Sb_2$ has attempted to compare accuracy of the structure determination by electron crystallography, which resulted in the cell parameters of $a=4.2976(6){\AA}\;and\;c=10.287(2){\AA}$, and the R-factor ($R_{sym}$) of 4.16%.