• Title/Summary/Keyword: Coverage Testing

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ALU Design & Test for 32-bit DSP RISC Processors (32비트 DSP RISC 프로세서를 위한 ALU 설계 및 테스트)

  • 최대봉;문병인
    • Proceedings of the IEEK Conference
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    • 1998.10a
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    • pp.1169-1172
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    • 1998
  • We designed an ALU(Airthmetic Logic Unit) with BIST(Built-In Self Test), which is suitable for 32-bit DSP RISC processors. We minimized the area of this ALU by allowing different operations to share several hardware blocks. Moreover, we applied DFT(Design for Testability) to ALU and offered Bist(Built-In Self-Test) function. BIST is composed of pattern generation and response analysis. We used the reseeding method and testability design for the high fault coverage. These techniques reduce the test length. Chip's reliability is improved by testing and the cost of testing system can be reduced.

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Analyses of Security Scanning and Security Threat in Web Application Network (웹에서의 보안 위협과 시큐리티 스캐닝에 대한 분석)

  • Kim, Jung-Tae
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2010.10a
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    • pp.603-604
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    • 2010
  • In this paper, we analyses a testing methodology that allows for harmless auditing, define three testing modes.heavy, relaxed, and safe modes, and report our results from two experiments. In the first, we compared the coverage and side effects of the three scanning modes using Web applications chosen from the different vulnerable in a previous static verification effort.

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Self-adaptive testing to determine sample size for flash memory solutions

  • Byun, Chul-Hoon;Jeon, Chang-Kyun;Lee, Taek;In, Hoh Peter
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.8 no.6
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    • pp.2139-2151
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    • 2014
  • Embedded system testing, especially long-term reliability testing, of flash memory solutions such as embedded multi-media card, secure digital card and solid-state drive involves strategic decision making related to test sample size to achieve high test coverage. The test sample size is the number of flash memory devices used in a test. Earlier, there were physical limitations on the testing period and the number of test devices that could be used. Hence, decisions regarding the sample size depended on the experience of human testers owing to the absence of well-defined standards. Moreover, a lack of understanding of the importance of the sample size resulted in field defects due to unexpected user scenarios. In worst cases, users finally detected these defects after several years. In this paper, we propose that a large number of potential field defects can be detected if an adequately large test sample size is used to target weak features during long-term reliability testing of flash memory solutions. In general, a larger test sample size yields better results. However, owing to the limited availability of physical resources, there is a limit on the test sample size that can be used. In this paper, we address this problem by proposing a self-adaptive reliability testing scheme to decide the sample size for effective long-term reliability testing.

The Study for ENHPP Software Reliability Growth Model Based on Kappa(2) Coverage Function (Kappa(2) 커버리지 함수를 이용한 ENHPP 소프트웨어 신뢰성장모형에 관한 연구)

  • Kim, Hee-Cheul
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.11 no.12
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    • pp.2311-2318
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    • 2007
  • Finite failure NHPP models presented in the literature exhibit either constant, monotonic increasing or monotonic decreasing failure occurrence rates per fault. Accurate predictions of software release times, and estimation of the reliability and availability of a software product require Release times of a critical element of the software testing process : test coverage. This model called Enhanced non-homogeneous Poission process(ENHPP). In this paper, exponential coverage and S-shaped model was reviewed, proposes the Kappa coverage model, which make out efficiency application for software reliability. Algorithm to estimate the parameters used to maximum likelihood estimator and bisection method, model selection based on SSE statistics and Kolmogorov distance, for the sake of efficient model, was employed. Numerical examples using real data set for the sake of proposing Kappa coverage model was employed. This analysis of failure data compared with the Kappaa coverage model and the existing model(using arithmetic and Laplace trend tests, bias tests) is presented.

Conformance Testing of Multi-protocol IUTs (다중계층 프로토콜의 적합성시험 방안)

  • Park, Yong-Beom;Kim, Myeong-Cheol;Kim, Jang-Gyeong
    • The Transactions of the Korea Information Processing Society
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    • v.6 no.11
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    • pp.3086-3096
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    • 1999
  • To declare conformance of multi-protocol Implementation Under Test(IUT), every layer of the multi-protocol IUT should be tested. According to ISO9646, single-layer test method is applied to testing the highest layer of multi-protocol IUT and single-layer embedded test method is used for the layers by layer all the protocols in a multi-protocol IUT. This paper proposes a new method for testing a multi-protocol IUT. The proposed test method assumes that a multi-protocol IUT is under test and that the interfaces between the layers cannot be controlled or observed by the tester. We apply the proposed test method to TCP/IP and compare the application results with those of the existing test turns out that the proposed test method significantly reduces the number of test cases as well as the number of test events while providing the same test coverage. In addition, the proposed test method shows the capability to locate the layer that is source of failure in testing multi-protocol IUTs.

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A Weighted Random Pattern Testing Technique for Path Delay Fault Detection in Combinational Logic Circuits (조합 논리 회로의 경로 지연 고장 검출을 위한 가중화 임의 패턴 테스트 기법)

  • 허용민;임인칠
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.32A no.12
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    • pp.229-240
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    • 1995
  • This paper proposes a new weighted random pattern testing technique to detect path delay faults in combinational logic circuits. When computing the probability of signal transition at primitive logic elements of CUT(Circuit Under Test) by the primary input, the proposed technique uses the information on the structure of CUT for initialization vectors and vectors generated by pseudo random pattern generator for test vectors. We can sensitize many paths by allocating a weight value on signal lines considering the difference of the levels of logic elements. We show that the proposed technique outperforms existing testing method in terms of test length and fault coverage using ISCAS '85 benchmark circuits. We also show that the proposed testing technique generates more robust test vectors for the longest and near-longest paths.

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The Comparative Study for ENHPP Software Reliability Growth Model based on Modified Coverage Function (변형 커버리지 함수를 고려한 ENHPP 소프트웨어 신뢰성장 모형에 관한 비교 연구)

  • Kim, Hee-Cheul;Kim, Pyong-Koo
    • Journal of the Korea Society of Computer and Information
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    • v.12 no.6
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    • pp.89-96
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    • 2007
  • Finite failure NHPP models presented in the literature exhibit either constant. monotonic increasing or monotonic decreasing failure occurrence rates per fault. Accurate predictions of software release times. and estimation of the reliability and availability of a software product require quality of a critical element of the software testing process : test coverage. This model called Enhanced non-homogeneous Poission process(ENHPP). In this paper, exponential coverage and S-type model was reviewed, proposes modified(the superosition and mixture) model, which make out efficiency application for software reliability. Algorithm to estimate the parameters used to maximum likelihood estimator and bisection method. model selection based on SSE statistics for the sake of efficient model, was employed.

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The Study for ENHPP Software Reliability Growth Model based on Superposition Coverage Function (중첩커버리지 함수를 고려한 ENHPP 소프트웨어 신뢰성장 모형에 관한 연구)

  • Kim, Hee-Cheul;Shin, Hyun-Cheul
    • Convergence Security Journal
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    • v.7 no.3
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    • pp.7-13
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    • 2007
  • Finite failure NHPP models presented in the literature exhibit either constant, monotonic increasing or monotonic decreasing failure occurrence rates per fault. Accurate predictions of software release times, and estimation of the reliability and availability of a software product require quantification of a critical element of the software testing process : test coverage. This model called Enhanced non-homogeneous poission process (ENHPP). In this paper, exponential coverage and S-shaped model was reviewed, proposes the superposition model, which maked out efficiency application for software reliability. Algorithm to estimate the parameters used to maximum likelihood estimator and bisection method, model selection based on SSE statistics for the sake of efficient model, was employed.

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A Method for Testing Web Applications by Using Black-box Tests based on User Screens and Web Interface Test Coverage (사용자 화면 중심의 블랙 박스 테스트와 웹 인터페이스 테스트 커버리지를 통한 웹 어플리케이션 테스트 방법)

  • Lim, Jeung-Hee;Lee, Si-Hyun;Jang, Jin-A;Choi, Byoung-Ju;Hwang, Sang-Cheol
    • Journal of KIISE:Software and Applications
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    • v.36 no.9
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    • pp.706-717
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    • 2009
  • A web application is implemented by reusing the library provided by framework and has hierarchical architecture. Also, to deal with the user request from a screen, the web application has an execution flow, called 'Business Logic', which starts with a screen, executes its composed component and comes back to the screen via database. To test web application effectively, it should reflect the characteristics of web application. In this paper we propose to test web applications via user screens with the black-box testing approach and verify its source codes with the web interface white-box test coverage that covers all the business logics of the test target and their corresponding interfaces. We analyze the proposing testing method through its tool: Testopiacov.

A Study on the Development of Soil-based PTMs for Analysis of BTEX (BTEX 분석용 토양 숙련도 표준시료(PTMs) 개발에 관한 연구)

  • Lee, Minhyo;Lee, Guntaek;Lee, Bupyoel;Lee, Wonseok;Kim, Gumhee;Hong, Sukyoung
    • Journal of Soil and Groundwater Environment
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    • v.18 no.5
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    • pp.15-25
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    • 2013
  • In this study, two kinds of soil-based proficiency testing materials (PTMs), NICE-012L and NICE-012R were prepared and certified for Benzen, Toluene, Etylbenzene and Xylene with evaluation of uncertainties. In order to analyse BTEX (Benzen Toluene Etylbenzene Xylene) for the candidate materials, GC/MS was used after pretreatment according to methods of soil analysis by Ministry of Environment. For the homogeneity test among bottles in terms of candidate materials, ISO 13528 and IUPAC Protocol were used and according to the result, both candidate materials showed sufficient homogeneity. Also, the stability test over the candidate materials was accessed according to the ISO Guide 35 by classifying short-term and long-term stability and the result showed that both candidate materials showed decent stability. The reference values of the two candidate materials depending on BTEX components were derived from the average of the 11 samples that were used for verification of the samples' homogeneity. Uncertainty of measurement was combined by uchar that was caused by a characteristic value, $u_{bb}$ that was caused by between-bottle homogeneity, and $u_{stab}$ that was caused by stability, and then combined uncertainty ($u_{PTM}$) was multiplied to the coverage factor (k) derived from the effective degree of freedom from each factor that leads to expanded uncertainty (U) in about 95% of confidence level. The proficiency testing materials developed through this study were supplied to National Institute of Environmental Research (NIER) and utilized as an external proficiency testing materials for evaluating analysis capacity of soil agencies with specialty in terms of soil analysis approved by Minister of Environment.