• International Journal of Reliability and Applications
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• v.6 no.2
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• pp.87-99
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• 2005

Coverage-based software reliability growth models (SRGMs) have been developed and successfully applied in practice. Performance of a coverage-based SRG M depends on the coverage function employed by the SRGM. When the coverage function represents the coverage growth behavior well irrespective of type of the testing profile the corresponding coverage-based SRGM is expected to be widely applicable. This paper first conducts a study of selecting the most representative coverage functions among the available coverage functions. Then their performances are empirically evaluated and compared. The result provides a foundation for developing widely applicable coverage-based SRGMs and monitoring the progress of a testing process.

• Communications for Statistical Applications and Methods
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• v.20 no.6
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• pp.467-474
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• 2013

It is common to measure multiple coverage metrics during software testing. Software reliability growth models and coverage growth functions have been applied to each coverage metric to evaluate software reliability; however, analysis results for the individual coverage metrics may conflict with each other. This paper proposes the virtual coverage metric of a normalized first principal component in order to avoid conflicting cases. The use of the virtual coverage metric causes a negligible loss of information.

• International Journal of Reliability and Applications
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• v.8 no.1
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• pp.53-66
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• 2007

This paper proposes a new non-homogeneous Poisson process software reliability growth model based on the coverage information. The new model incorporates the coverage information in the fault detection process by assuming that only the faults in the covered constructs are detectable. Since the coverage growth behavior depends on the testing strategy, the fault detection process is first modeled for the general testing strategy and then realized for the uniform testing. Finally the model for the uniform testing is empirically evaluated by applying it to real data sets.

• Journal of KIISE
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• v.43 no.9
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• pp.953-962
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• 2016

Model-based testing is a technique for performing the test by using a model that represents the behavior of the system as a system specification. Industrial domains such as automotive, military/aerospace, medical, railway and nuclear power generation require model-based testing and code coverage-based testing to improve the quality of software. Despite the fact that both model-based testing and code coverage-based testing are required, difficulty in achieving a high coverage using model-based testing caused by the abstraction level difference between the test model and the source code, results in the need for performing model-based testing separately. In this study, to overcome the limitations of the existing model-based testing, we proposed the state machine transformation method to effectively improve the code coverage using the protocol state machine, one of the typical modeling methods is used as the test model in model-based testing, as the test model. In addition, we performed a case study of both systems and analyzed the effectiveness of the proposed method.

• Communications for Statistical Applications and Methods
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• v.17 no.6
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• pp.909-916
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• 2010

A trend in software reliability engineering is to take into account the coverage growth behavior during testing. A coverage growth function that represents the coverage growth behavior is an essential factor in software reliability models. When multiple competitive coverage growth functions are available, there is a need for a criterion to select the best coverage growth functions. This paper proposes a selection criterion based on the prediction error. The conditional coverage growth function is introduced for predicting future coverage growth. Then the sum of the squares of the prediction error is defined and used for selecting the best coverage growth function.

• Communications for Statistical Applications and Methods
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• v.18 no.5
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• pp.667-674
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• 2011

A recent trend in software reliability engineering accounts for the coverage growth behavior during testing. The coverage growth function (representing the coverage growth behavior) has become an essential component of software reliability models. Application of a coverage growth function requires the estimation of the coverage growth function. This paper considers the problem of estimating the coverage growth function. The existing maximum likelihood method is reviewed and corrected. A method of minimizing the sum of squares of the standardized prediction error is proposed for situations where the maximum likelihood method is not applicable.

• KIPS Transactions on Software and Data Engineering
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• v.11 no.7
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• pp.273-282
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• 2022

Testing approaches for configurable software product lines differs significantly from a single software testing, as it requires consideration of common parts used by all member products of a product line and variable parts shared by some or a single product. Test coverage is a measure of the adequacy of testing performed. Test coverage measurements are important to evaluate the adequacy of testing at the software product line level, as there can be hundreds of member products produced from configurable software product lines. This paper proposes a method for measuring code coverage at the product line level in configurable software product lines. The proposed method tests the member products of a product line after hierarchizing member products based on the inclusion relationship of the selected features, and quantifies SPL(Software Product Line) test coverage by synthesizing the test coverage of each product. As a result of applying the proposed method to 11 configurable software product line cases, we confirmed that the proposed method could quantitatively visualize how thoroughly the SPL testing was performed to help verify the adequacy of the SPL testing. In addition, we could check whether the newly performed testing for a member product covers the newly added code parts of a feature.

• The Transactions of the Korea Information Processing Society
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• v.4 no.11
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• pp.2832-2839
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• 1997

In this paper, a testing architecture and procedure that an idle ATM virtual channel can be utilized for TCP channel is proposed. Four kinds or methodologies for protocol conformance testing have been standardized in ISO. Remote testing method used popularly have some disadvantages that developer must operate system manually in case of System Under Test (SUT) active testing and we cannot control and observe Implementation Under Test (IUT) often. It is proper to adopt distribute testing method than remote test in order to maximize test coverage and optimize fault coverage for conformance testing in ATM systems, and it is required that TCP channel is prepared for distribute testing method. The proposed architecture can adopt distributed testing method without extra physical channel for testing control. Also we can maximize the test coverage and implement the automation of testing without intervention of operator sustaining normal operation of ATM equipment.

• Communications for Statistical Applications and Methods
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• v.14 no.3
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• pp.497-506
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• 2007

Coverage-based NHPP SRGMs have been introduced in order to incorporate the coverage growth behavior into the NHPP SRGMs. The coverage growth function representing the coverage growth behavior during testing is thus an essential factor of the coverage-based NHPP SRGMs. This paper proposes a class of discrete time coverage growth functions and illustrates its application to real data sets.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.4
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• pp.266-276
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• 2001

Due to the rapid development of semiconductor technology, the complexity of VLSI circuits has heavily increased. With the increased densities of integrated circuits, several different types of faults can occur Thus, testing such circuits is becoming a sever problem. Delay testing can detect system timing failures caused by delay faults. However, the conventional delay fault coverage in terms of the number of detected faults may not be an effective measure of delay testing because, unlike a stuck-at-faults, the impact of a delay fault is dependent on its delay defect size rather than on its existence. Thus, the effectiveness of delay testing is dependent on the propagation delay of the path to be tested, the delay defect size, and the system clock interval. This paper proposes a new delay defect fault coverage that considers both propagation delay of the path to be tested and additional delay defect size. And the relationship between delay defect fault coverage and defect level is analyzed.