• KSTLE International Journal
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• v.5 no.1
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• pp.1-6
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• 2004

Nano-scale studies on adhesion and friction were conducted in Si-wafer (100) using Atomic Force Microscopy (AFM). Glass (Borosilicate) balls of radii 0.32$\mu\textrm{m}$, 1.25$\mu\textrm{m}$, and 2.5$\mu\textrm{m}$, mounted on cantilever (Contact Mode type NPS) were used as tips. Adhesion and friction between Si-wafer and glass tips were measured at ambient temperature (24${\pm}$1$^{\circ}C$) and humidity (45${\pm}$5%). Friction was measured as a function of applied normal load in the range of 0-160 nN. Results showed that, both adhesion and friction increased with the tip radii. Also, friction increased linearly as a function of applied normal load. The effect of tip size on adhesion and friction was explained as the influence of the capillary force exerted by meniscus and that of the contact area on these parameters respectively. The coefficient of friction was estimated in two different ways, as the slope from the plot of friction force against the applied normal load and as the ratio between the friction force and the applied normal load. Both these estimates showed that the coefficient of friction increased with the tip size. Further, the influence of the adhesion force on the coefficient of friction was also discussed.

• The Journal of the Acoustical Society of Korea
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• v.27 no.8
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• pp.395-402
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• 2008

In viol family string instruments vibration of string is transmitted to the front plate through bridge to cause resonance of the instrument body. Therefore, the vibration of string is the source of sound and the properties, the structure, and the boundary conditions of string are expected to have significant effect on the sound. In this study the vibration of strings in cello when one end is fixed and the other end is pressed with finger tip is studied and compared with the case of the fixed-fixed ends. The result of analysis and experiment shows that the vibration of the string that is fixed at one end and pressed with finger tip at the other end is significantly influenced by the contact condition of the string with the finger tip and also quite different from that of the fixed-fixed string, It also suggests that the sound of a cello can be significantly influenced by the contact condition between the string and the finger tip in the fingered string.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.11 no.4
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• pp.1210-1215
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• 2010

The probe card are test modules which are to classify the good semiconductor chips and thin film before the packaging process. In the rapid growth a technology of semiconductor, the number of pads per unit area is increasing and pad arrays are becoming irregular. Therefore, the technology of probe card needs narrow width and lots of probe tip. In this paper, the probe tip based on the MEMS(Micro Electro Mechanical System)technology was developed a new MEMS probe tip for vertical probe card applications. For the structural designs of probe tip were performed to mechanical characteristics and structural analysis using FEM(Finite Element Method). Also, the contact force of MEMS probe tip compared with FEM results and experimental results. Finally, the MEMS probe card was developed a fine pitch smaller than $50{\mu}m$.

• Journal of the Korean Society for Precision Engineering
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• v.16 no.12
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• pp.174-181
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• 1999

This paper describes the effect of the stylus tip size on the shape error in surface topography measurement. To analyze the distortional effect of an actual surface geometry origination from the finite stylus size, the surface is modeled as a sinusoid and the stylus tip as a circle. The magnitude of this distortion is defined as the ration of standard deviation, and this is expressed as an analytic function of the stylus tip radius and the geometrical parameter of a sinusoid. In this paper, the spectrum analysis of the profile is applied to investigate the distortional effect due to the mechanical filtering of the stylus in the frequency domain. and, the cumulative power spectrum is proposed to assess the shape error of measured data according to the various stylus tip sizes. From these results, a new method to select proper stylus tip radius is proposed.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.6
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• pp.145-152
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• 2004

Depth-sensing indentation is wifely used for evaluation of mechanical properties of thin films. It is generally accepted that the most significant source of uncertainty in nanoindentation measurement is the geometry of the indenter tip. Therefore the successful application of the technique requires accurate calibration of the indenter tip geometry. The direct measurement of geometry of a Berkovich indenter was determined using a atomic force microscope. The indentation geometrical calibration of contact area was performed by analyzing the indenter tip profile. The equations of area functions were proposed for nanoscale thin films..

• Journal of Welding and Joining
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• v.21 no.7
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• pp.9-17
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• 2003

• Proceedings of the KWS Conference
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• 2003.05a
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• pp.284-286
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• 2003

• Transactions of Materials Processing
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• v.28 no.5
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• pp.266-274
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• 2019

Metal sealing is used to connecting the parts between valves and fuel pipes for a FCEV which utilizes hydrogen gas of 700 bar. Instead of general carbon steel, stainless steel is the primary material used to manufacture fuel pipes due to hydrogen embrittlement. The shape of deformation between metals is an important factor on the air-tightness of the metal to metal contact. Since the stainless steel pipe is hardened using the plastic forming during the tip shaping stage, this work hardening could have an effect on the deformed shape and characteristics of contact surfaces in fastening of pipes. In this paper, the deformation history of the pipe model was considered in order to analyze the hydrogen-tightness on the metal sealing part. The contact distance and the forward displacement for fastening were compared using experimental results and the simulation results. The simulation of the effect of material change on the fitting body demonstrated that the hardness or the strength of the formed tip of the pipe was designed to a proper valued level since the characteristics of the contact surface was exhibited better when the strength of the pipe was lower than that of the fitting body.

• Journal of the Korean institute of surface engineering
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• v.45 no.2
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• pp.81-88
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• 2012

Probe tip, which should have not only superior electrical characteristics but also good abrasion resistance for numerous contacts with semiconductor pads to confirm their availability, is essential for MEMS probe card. To obtain good durability of probe tip, it needs thick and crack-free rhodium layer on the tip. However, when the rhodium thickness deposited by electroplating increased, unwanted cracks by high internal stress led to serious problem of MEMS probe tip. This article reported the method of thick Rh deposition with Au buffer layer on the probe tip to overcome the problem of high internal stress and studied mechanical and electrical properties of that. MEMS probe tip with double-Rh layer had good contact resistance and durability during long term touch downs.

• International Journal of Precision Engineering and Manufacturing
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• v.8 no.2
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• pp.26-31
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• 2007

A novel scanning probe measurement system was developed to enable precise profile measurements of microaspheric surfaces. An air-bearing stylus with a microprobe was used to perform the surface profile scanning. The new system worked in a contact mode and had the capability of measuring micro-aspheric surfaces with large tilt angles and complex profiles. Due to limitations resulting from the contact mode, such as possible damage caused by the contact force and lateral resolution restrictions from the curvature of the probe tip, several system improvements were implemented. An air bearing was used to suspend the shaft of the probe to reduce the contact force, enabling fine adjustments of the contact force by changing the air pressure. The movement of the shaft was measured by a linear encoder with a scale attached to the actual shaft to avoid Abbe errors. A $50-{\mu}m-diameter$ glass sphere was bonded to the tip of the probe to improve the lateral resolution of the system. The maximum contact force of the probe was 10 mN. The shaft was capable of holding the probe continuously if the contact force was less than 40 mN, and the resolution of the probe could be as high as 10 nm, The performance of the new scanning probe measurement system was verified by experimental data.