Obervation of Langmuir Films Using Displacement Current Method and BAM (Brewster-Angle Microscope) (변위전류법과 BAM(BREWSTER-ANGLE MICROSCOPE)를 이용한 LANGMUIR막의 관찰)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2001.05a
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- pp.38-42
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- 2001