• 제목/요약/키워드: Computer-Aided Inspection Planning (CAIP)

검색결과 6건 처리시간 0.023초

A Computer-Aided Inspection Planning System for On-Machine Measurement - Part I : Global Inspection Planning -

  • Lee, Hong-Hee;Cho, Myeong-Woo;Yoon, Gil-Sang;Choi, Jin-Hwa
    • Journal of Mechanical Science and Technology
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    • 제18권8호
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    • pp.1349-1357
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    • 2004
  • Computer-Aided Inspection Planning (CAIP) is the integration bridge between CAD/CAM and Computer Aided Inspection (CAI). A CAIP system for On-Machine Measurement (OMM) is proposed to inspect the complicated mechanical parts efficiently during machining or after machining. The inspection planning consists of Global Inspection Planning (GIP) and Local Inspection Planning (LIP). In the GIP, the system creates the optimal inspection sequence of the features in a part by analyzing the various feature information such as the relationship of the features, Probe Approach Directions (PAD), etc. Feature groups are formed for effective planning, and special feature groups are determined for sequencing. The integrated process and inspection plan is generated based on the sequences of the feature groups and the features in a feature group. A series of heuristic rules are developed to accomplish it. In the LIP of Part II, the system generates inspection parameters. The integrated inspection planning is able to determine optimum manufacturing sequence for inspection and machining processes. Finally, the results are simulated and analyzed to verify the effectiveness of the proposed CAIP.

금형가공 및 측정을 위한 통합 Rule-based CAPP 시스템 개발 (Development of integrated Rule-based CAPP system for Mold Manufacturing and Inspection)

  • 윤길상;최진화;조명우;이홍희;서태일
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2003년도 춘계학술대회 논문집
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    • pp.1235-1238
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    • 2003
  • A rule-based CAPP(computer aided process planning) system is proposed in this research to develop integrated manufacturing process of machining and inspection using OMM(On-Machine Measurement) device. Generally workpiece composed of many primitive form features. This features are determined optimum inspection sequence by analyzing the feature information such as features-relationship, probe approach direction and etc. Proposed paper is more efficient method of CAIP(computer aided inspection planning) considered machining process

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특징 형상기반의 CAIP에 관한 연구 (A Study of Feature-Based Computer-Aided Inspection Planning System)

  • 윤길상;조명우;이홍희
    • 한국공작기계학회논문집
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    • 제12권5호
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    • pp.15-23
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    • 2003
  • A feature-based inspection planning system is proposed in this research to develop more efficient measuring methodology for the OMM(On-Machine Measurement) or CMM(coordinate Measuring Machine) for complicated workpiece having many primitive form features. This paper is proposed solution that optimum inspection sequence of the objective features. The sequences are determined by analyzing the feature information such as the nearest relationship and the possible probe-approach direction(PAD) of the features, and forming feature groups. A series of heuristic rules are developed to accomplish it. Also, each feature is decomposed into its constituent geometric elements for inspection process, and then the number of sampling points, location of the measuring points, optimum probing path are determined.

형상기반의 CAIP 시스템 개발 (A feature based Computer Aided Inspection Planning system)

  • 윤길상;조명우;이홍희
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 2002년도 추계학술대회 논문집
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    • pp.353-358
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    • 2002
  • A feature-based inspection planning system is proposed in this research to develop more efficient measuring methodology for the OMM (On-machine measurement) for complicated workpiece having many primitive form features. This paper focuses on the development of the CAIP (computer-aided inspection system) methodologies. The optimum inspection sequences for the features are determined by analyzing the feature information such as the nested relations and the possible probe approaching directions of the features, and forming feature groups. A series of heuristic rules are developed to accomplish it. Also, each feature is decomposed into its constituent geometric elements, and then the number of sampling points, the locations of the measuring point, the optimum probing path are determined by applying the fuzzy logic, Hammersley's method, and the TSP algorithm. To verify the proposed methodologies, simulations are carried out and the results are analyzed.

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A Computer-Aided Inspection Planning System for On-Machine Measurement - Part II : Local Inspection Planning -

  • Cho, Myeong-Woo;Lee, Hong-Hee;Yoon, Gil-Sang;Choi, Jin-Hwa
    • Journal of Mechanical Science and Technology
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    • 제18권8호
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    • pp.1358-1367
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    • 2004
  • As a part II of theis research, new local inspection planning strategy is proposed in this paper based on the proposed inspection feature extraction method. In the local inspection planning stage, each feature is decomposed into its constituent geometric elements for more effective inspection planning. The local inspection planning for the decomposed features are performed to determine: (1) the suitable number of measuring points, (2) their locations, and (3) the optimum probing paths to minimize measuring errors and times. The fuzzy set theory, the Hammersley's algorithm and the TSP method are applied for the local inspection planning. Also, a new collision checking algorithm is proposed for the probe and/or probe holder based on the Z-map concept. Finally, the results are simulated and analyzed to verify the effectiveness of the proposed methods.

OMM 에서 Offset Surface 를 이용한 접촉식 Probe 의 충돌회피 알고리즘 개발 및 동적 에러 보정 (Development of Touch Probe Collision Avoidance Algorithm for OMM Using Offset Surface and Dynamic Error Compensation)

  • 정석현;김동우;조명우;서태일
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2004년도 추계학술대회 논문집
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    • pp.323-326
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    • 2004
  • In this study, the inspection path which is considered to free collision is generated by offset surface. When the inspection is executed, the consideration of machine dynamic error increases a precision. Dynamic error is measured on CNC machine bed changing of weight work price. Offset surface is safety space about collision. Because the danger of probe-collision is excluded in Offset surface, it is possible to rapid feed of probe and reduced inspection time. The Program which is possible to simulate using CAIP and is confirmed through actual experiment.

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