• Title/Summary/Keyword: Combined Electron Beam

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Effects of Combined Treatment of Aqueous Chlorine Dioxide and UV-C or Electron Beam Irradiation on Microbial Growth and Quality in Chicon during Storage (이산화염소수와 UV-C 또는 전자빔 병합처리가 치콘의 저장 중 미생물 성장과 품질에 미치는 영향)

  • Kang, Ji Hoon;Park, Jiyong;Oh, Deog Hwan;Song, Kyung Bin
    • Journal of the Korean Society of Food Science and Nutrition
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    • v.41 no.11
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    • pp.1632-1638
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    • 2012
  • The effects of combined treatment of aqueous $ClO_2$ and UV-C or electron beam irradiation on microbial growth and quality in chicon during storage at $4^{\circ}C$ were investigated. Samples were treated separately with 50 ppm of $ClO_2$, 5 kJ/$m^2$ of UV-C, 2, 5, 7, and 10 kGy of electron beam irradiation, as well as a combination of $ClO_2$ and UV-C or 2 kGy of electron beam irradiation. The populations of total aerobic bacteria as well as yeast and molds in the chicon samples were determined following each treatment. The populations of total aerobic bacteria in the chicon samples decreased by 1.49~2.92 log CFU/g following combined treatment of $ClO_2$ and UV-C irradiation compared to the control, whereas the populations of yeast and molds decreased by 1.63~1.78 log CFU/g. On the contrary, following combined treatment of $ClO_2$ and electron beam irradiation, the populations of total aerobic bacteria as well as yeast and molds in the chicon samples were undetectable during storage. Color measurements indicated that Hunter $L^*$, $a^*$, and $b^*$ values were not significantly different among the treatments during storage. These results suggest that combined treatment of $ClO_2$ and electron beam irradiation can be useful for improving microbiological safety in chicon during storage.

Cross-Sectional Transmission Electron Microscopy Specimen Preparation Technique by Backside Ar Ion Milling

  • Yoo, Jung Ho;Yang, Jun-Mo
    • Applied Microscopy
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    • v.45 no.4
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    • pp.189-194
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    • 2015
  • Backside Ar ion milling technique for the preparation of cross-sectional transmission electron microscopy (TEM) specimens, and backside-ion milling combined with focused ion beam (FIB) operation for electron holography were introduced in this paper. The backside Ar ion milling technique offers advantages in preparing cross-sectional specimens having thin, smooth and uniform surfaces with low surface damages. The back-side ion milling combined with the FIB technique could be used to observe the two-dimensional p-n junction profiles in semiconductors with the sample quality sufficient for an electron holography study. These techniques have useful applications for accurate TEM analysis of the microstructure of materials or electronic devices such as arrayed hole patterns, three-dimensional integrated circuits, and also relatively thick layers (> $1{\mu}m$).

Combined effects of electron beam irradiation and addition of onion peel extracts and flavoring on microbial and sensorial quality of pork jerky (전자선 조사와 양파껍질 추출물 및 향미물질 첨가가 돈육포의 미생물학적 및 관능적 품질에 미치는 영향)

  • Kim, Hyun-Joo;Kang, Mingu;Jo, Cheorun
    • Korean Journal of Agricultural Science
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    • v.39 no.3
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    • pp.341-347
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    • 2012
  • The objective of this study was to investigate the combined effect of electron beam irradiation (EB) and onion peel extracts and selected flavorings on microbiological and sensory quality of pork jerky. Total aerobic bacteria were detected in the range of $3.87{\pm}0.30{\sim}4.60{\pm}0.12$ log CFU/g in all samples. Addition of both onion peel extract and flavoring showed the decrease of total aerobic bacterial count in pork jerky. No viable cells were observed after EB at 4 kGy. Sensory evaluation indicated that the EB-treated pork jerky with 0.5% barbecue flavoring did not show any difference in overall acceptability compared with the control. Therefore, combined use of EB with onion peel extracts and barbecue flavoring may enhance the safety of pork jerky with proper sensory quality.

Atomic Layer-by-Layer Growth of $BaTiO_3/SrTiO_3$ Oxide Artificial Lattice in Laser Molecular Beam Epitaxy System Combined Reflection High Energy Electron Diffraction (Reflection High Energy Electron Diffraction이 결합된 Laser Molecular Beam Epitaxy System에서 $BaTiO_3/SrTiO_3$ 산화물 인공격자의 Layer-by-Layer 성장)

  • Lee, Chang-Hun;Kim, Lee-Jun;Jeon, Seong-Jin;Kim, Ju-Ho;Choe, Taek-Jip;Lee, Jae-Chan
    • Proceedings of the Korean Ceranic Society Conference
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    • 2003.10a
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    • pp.179.2-179
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    • 2003
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Sensitivity Analysis of Heat Source Parameter for Predicting Residual Stress Induced by Electron Beam Welding (스테인리스강에 대한 전자빔 용접 잔류응력 예측을 위한 열원 변수 민감도 해석)

  • Shin Je Park;Hune Tae Kim;Yun Jae Kim
    • Transactions of the Korean Society of Pressure Vessels and Piping
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    • v.18 no.2
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    • pp.61-68
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    • 2022
  • Accurate evaluation of residual stress is important for stress corrosion cracking assessment. In this paper, electron beam welding experiment is simulated via finite element analysis and the sensitivity of the parameters related to the combined heat source model is investigated. Predicted residual stresses arecompared with measured residual stresses. It is found that the welding efficiency affects the size of the tensile residual stress area and the magnitude of maximum longitudinal residual stress. It is also found that the parameter related to the ratio of energy distributed to the two-dimensional heat source has little effect on the size of tthe tensile residual stress area, but affects the size of the longitudinal residual stress in the center of the weld.

Effect of Low-Energy Electron Irradiation on DNA Damage by Cu2+ Ion

  • Noh, Hyung-Ah;Park, Yeunsoo;Cho, Hyuck
    • Journal of Radiation Protection and Research
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    • v.42 no.1
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    • pp.63-68
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    • 2017
  • Background: The combined effect of the low energy electron (LEE) irradiation and $Cu^{2+}$ ion on DNA damage was investigated. Materials and Methods: Lyophilized pBR322 plasmid DNA films with various concentrations (1-15 mM) of $Cu^{2+}$ ion were independently irradiated by monochromatic LEEs with 5 eV. The types of DNA damage, single strand break (SSB) and double strand break (DSB), were separated and quantified by gel electrophoresis. Results and Discussion: Without electron irradiation, DNA damage was slightly increased with increasing Cu ion concentration via Fenton reaction. LEE-induced DNA damage, with no Cu ion, was only 6.6% via dissociative electron attachment (DEA) process. However, DNA damage was significantly increased through the combined effect of LEE-irradiation and Cu ion, except around 9 mM Cu ion. The possible pathways of DNA damage for each of these different cases were suggested. Conclusion: The combined effect of LEE-irradiation and Cu ion is likely to cause increasing dissociation after elevated transient negative ion state, resulting in the enhanced DNA damage. For the decrease of DNA damage at around 9-mM Cu ion, it is assumed to be related to the structural stabilization due to DNA inter- and intra-crosslinks via Cu ion.

The Dose Distribution of Arc therapy for High Energy Electron (고에너지 전자선 진자조사에 의한 선량분포)

  • Chu, S.S.;Kim, G.E.;Suh, C.O.;Park, C.Y.
    • Radiation Oncology Journal
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    • v.1 no.1
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    • pp.29-36
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    • 1983
  • The treatment of tumors along curved surfaces with stationary electron beams using cone collimation may lead to non-uniform dose distributions due to a varying air gap between the cone surface and patient. For large tumors, more than one port may have to be used in irradiation of the chest wall, often leading to regions of high or low dose at the junction of the adjacent ports. Electron-beam arc therapy may elimination many of these fixed port problems. When treating breast tumors with electrons, the energy of the internal mammary port is usually higher than that of the chest wall port. Bolus is used to increase the skin dose or limit the range of the electrons. We invertiaged the effect of various arc beam parameters in the isodose distributions, and combined into a single arc port for adjacent fixed ports of different electron beam eneries. The higher fixed port energy would be used as the arc beam energy while the beam penetration in the lower energy region would be controlled by a proper thickness of bolus. We obtained the results of following: 1. It is more uniform dose distribution of electron to use rotation than stationary irradiation. 2. Increasing isocenter depth on arc irradiation, increased depth of maximum dose, reduction in surface dose and an increasing penetration of the linear portion of the curve. 3. The deeper penetration of the depth dose curve and higher X-ray background for the smaller field sized. 4. If the isocenter depth increase, the field effect is small. 5. The decreasing arc beam penetration with decreasing isocenter depth and the isocenter depth effect appears at a greater depth as the energy increases. 6. The addition of bolus produces a shift in the penetration that is the same for all depths leaving the shape of the curves unchanged. 7. Lead strips 5 mm thick were placed at both ends of the arc to produce a rapid dose drop-off.

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Serial Block-Face Imaging by Field Emission Scanning Electron Microscopy (전계방사형 주사전자현미경에 의한 연속블록면 이미징)

  • Kim, Ki-Woo
    • Applied Microscopy
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    • v.41 no.3
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    • pp.147-154
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    • 2011
  • Backscattered electrons (BSE) are generated at the impact of the primary electron beam on the specimen. BSE imaging provides the compositional contrast to resolve chemical features of sectioned block-face. A focused ion beam (FIB) column can be combined with a field emission scanning electron microscope (FESEM) to ensure a dual (or cross)-beam system (FIB-FESEM). Due to the milling of the specimen material by 10 to 100 nm with the gallium ion beam, FIB-FESEM allows the serial block-face (SBF) imaging of plastic-embedded specimens with high z-axis resolution. After contrast inversion, BSE images are similar to transmitted electron images by transmission electron microscopy. As another means of SBF imaging, a specialized ultramirotome has been incorporated into the specimen chamber of FESEM ($3View^{(R)}$). Internal structures of plastic-embedded specimens can be serially revealed and analyzed by $3View^{(R)}$ with a large field of view to facilitate three-dimensional reconstruction. These two SBF approaches by FESEM can be employed to unravel spatial association of (sub)cellular entities for a comprehensive understanding of complex biological systems.

Effects of Electron Beam Treatment on the Characteristics of Pulping and Papermaking of Hemp Bast Fibers (전자빔 처리가 대마 인피섬유의 펄프화 및 초지 특성에 미치는 영향)

  • Bae, Paek-Hyun;Seo, Jae-Hwan;Jung, Jin-Ho;Lee, Jae-Jung;Paik, Ki-Hyun;Kim, Hyoung-Jin
    • Journal of Korea Technical Association of The Pulp and Paper Industry
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    • v.44 no.4
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    • pp.51-61
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    • 2012
  • The new alkali pulping process combined with electron beam treatment was applied to utilize hemp bast tissues as a new valuable fibrous resource. Hemp bast tissues have some chemical properties with high lignin contents and holocellulose not to be defiberized by alkali pulping only, compared with the bast tissue of paper mulberry. To make up for the weakness of traditional alkali pulping process, electron beams were directly irradiated into the swelled bast tissue of hemp in NaOH solution and distilled water, and then facilitated the defiberization of hemp bast tissues. The papermaking from hemp bast fibers manufactured by the combination pulping process showed good apparent density, formation structure and air permeability, and had some mechanical properties with lower tensile, tear, burst strength and folding endurance. It is finally concluded that the combination pulping process with electron beam treatment could be suggested a new alternative for non-woody fibers.

Study of 3 dimensional wide area continuous laser micro patterning (3차원 대면적 연속 마이크로 레이저 패터닝을 위한 연구)

  • Kim, Kyunghan;Sohn, Hyonkee;Lee, Jaehoon
    • Laser Solutions
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    • v.18 no.4
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    • pp.1-5
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    • 2015
  • For continuous laser micro patterning on three-dimensional free form surface, innovative laser system is developed. The two axis galvanometer is combined with the dynamic focusing unit to increase optical distance. Also, it is synchronized with the 3 axis mechanical system. To determine laser machining sequence, laser CAM system is developed. It can make possible of 3D surface micro patterning under $25{\mu}m$ pattern width. The uniformity of pattern width is about 2.8% and it is validated that focal plane is well conserved by the dynamic focusing unit. Velocity and positional information of 1 axis is stage is fed to the scanner control board by the encoder signal and it makes possible real time synchronization. With this system, possible patterning volume is enlarged from $40{\times}40mm^2$ to $40{\times}120{\times}30mm^3$.