• 제목/요약/키워드: Circuits

검색결과 4,523건 처리시간 0.027초

LED 조명기구의 EMI 디버깅 기술 (EMI Debugging Technique of LED Lighting Module)

  • 김진사
    • 한국전기전자재료학회논문지
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    • 제33권2호
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    • pp.151-154
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    • 2020
  • Radiation noise due to EMI noise generated by the driving circuits of LED lighting devices in a medical imaging room was reduced by decreasing the noise source in the driving circuits and changing the number of corrections in EMI filters. Noise attenuation and filter changes enabled driving circuits that reduced the electromagnetic waves. Such circuits were efficiently designed by using capacitors and inverters in a given space. Therefore, the malfunction of radiation devices can be minimized by using EMI-reduction filter circuits, and reliable operation of medical devices can be expected by blocking electromagnetic waves.

프린팅 방법을 통한 Micro-Nano 시스템을 위한 all polymer flexible cuircuit 개발 (Development of all-polymer flexible circuit for micro-nano system using printing method)

  • 이정훈;황교일;신창용;류경주;김훈모
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2002년도 추계학술대회 논문집
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    • pp.750-753
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    • 2002
  • At present, almost circuits are wired using copper in flexible circuits. But, these circuit have limit to flexibility so it occurs fracture about cyclic bending and, thermal load of bending stress occur a circuit trouble. a study of all-polymer flexible circuits get over that problem. Established fabrication method of all-polymer circuits is photolithograph. This method can not have mass production, so this method wastes time and human effort. In this study, all polymer flexible circuits are fabricated using the inkjet process.

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Si PIN Radiation Sensor with CMOS Readout Circuit

  • Kwon, Yu-Mi;Kang, Hee-Sung;Lee, Jung-Hee;Lee, Yong Soo
    • 센서학회지
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    • 제23권2호
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    • pp.73-81
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    • 2014
  • Silicon PIN diode radiation sensors and CMOS readout circuits were designed and fabricated in this study. The PIN diodes were fabricated using a 380-${\mu}m$-thick 4-inch n+ Si (111) wafer containing a $2-k{\Omega}{\cdot}cm$ n- thin epitaxial layer. CMOS readout circuits employed the driving and signal processes in a radiation sensor were mixed with digital logic and analog input circuits. The primary functions of readout circuits are amplification of sensor signals and the generation of the alarm signals when radiation events occur. The radiation sensors and CMOS readout circuits were fabricated in the Institute of Semiconductor Fusion Technology (ISFT) semiconductor fabrication facilities located in Kyungpook National University. The performance of the readout circuit combined with the Si PIN diode sensor was demonstrated.

Array Testing of TFT-LCD Panel with Integrated Gate Driver Circuits

  • Lee, Jonghwan
    • 반도체디스플레이기술학회지
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    • 제19권3호
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    • pp.68-72
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    • 2020
  • A new method for array testing of TFT-CD panel with the integrated gate driver circuits is presented. As larger size/high resolution TFT-LCD with the peripheral driver circuits has emerged, one of the important problems for manufacturing is array testing on the panel. This paper describes the technology of detecting defective arrays and optimizing the array testing process. For the effective characterization of pixel array, the pixel storage capability is simulated and measured with voltage imaging system. This technology permits full functional testing during the manufacturing process, enabling fabrication of large TFT-LCD panels with the integrated driver circuits.

Polarographic 산소전극용 센서회로 설계에 대한 일 방안 (A Method on the design of the Sensor Circuits for the polarographic Oxygen Probes)

  • 이동희;최복길;김남정;강문호
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1994년도 하계학술대회 논문집 C
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    • pp.1286-1288
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    • 1994
  • Methods are described for the design and fabrication of the sensor circuits on the polarographic oxygen sensing electrodes. The discussion includes: a method for the +5V single-supply driving for the sensor circuits, a method of low power comsumption for the front-end electronics. Typical polarograms for the commercial DO probes using this sensor circuits are presented. High accuracy of the I to V conversion using the circuits is verified.

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domino CMOS 논리회로의 테스트 생성에 관한 연구 (A Study on Test Generation for Domino CMOS Logic Circuits)

  • 이재민;이준모;정준모
    • 대한전자공학회논문지
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    • 제27권7호
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    • pp.1118-1127
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    • 1990
  • In this paper a new test generation method for Domino CMOS logic circuits is proposed. Because the stuck-at type fault is not adequate for Domino CMOS circuits the stuck-open fault, stuck-on fault and bridging fault are considered as fault models. It is shown that the test generation problem of Domino CMOS circuits results in functional block test generation problem. Test set is generated by using the logic minimizer which is a part of logic design system. An algorithm for reduction of test set is described. The proposed test method can be easily applied to various figures of circuits and make it easy to construct automatic test generator in design system. The proposed algorithms are programed and their efficiency is confirmed by examples.

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Practical Fault Coverage of Supply Current Testing for Open Fault in TTL Combinational Circuits

  • Mushiaki, Yukiko;Hashzume, Masaki;Yotsuyanagi, Hiroyuki;Tamesada, Takeomi
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2000년도 ITC-CSCC -1
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    • pp.383-386
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    • 2000
  • There are some variations in quiescent supply current or TTL SSIs. Thus, some variations in quiescent supply current of logic circuits made of TTL SSIs will be generated. The variations make it difficult to apply supply current test methods to tests of TTL circuits. In this paper, in order to examine the applicability to R circuits, fault coverages of a supply current test method for open faults in some ISCAS-85 benchmark circuits are evaluated, Which are made of TTL LS-type SSIs. The experimental results shows that if SSIs are used for implementation having the variation of quiescent supply current within 1%, supply current test methods are applicable for the tests.

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Discrete-Time CNN Using Chaos Circuits with Nonlinear function Controllability

  • Eguchi, Kei;Ueno, Fumio;Tabata, Torn;Zhu, Hongbing;Hamasaki, Yuuki
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2000년도 ITC-CSCC -2
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    • pp.1017-1020
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    • 2000
  • In this paper, a CNN using 1-dimensional chaos circuits with controllable nonlinear functions is proposed. The proposed CNN consists of $\p{times}q$ chaos circuits which are called cell circuits. The nonlinear functions of the cell circuits can be controlled by employing fuzzy scheme. Thanks to the controllability of the nonlinear functions, the proposed circuit can adjust transition behavior of the CNN electronically. Furthermore, the chaotic behavior of the cell circuit which is a portion of the proposed CNN is simple since the cell circuit is a 1-dimensional chaos circuit. To confirm the validity of the circuit design, SPICE simulations were performed concerning the proposed CNN.

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능동 전력 디커플링 회로의 커패시턴스 최적 설계에 관한 연구 (A Study on Optimal Design of Capacitance for Active Power Decoupling Circuits)

  • 백기호;박성민;정교범
    • 전력전자학회논문지
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    • 제24권3호
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    • pp.181-190
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    • 2019
  • Active power decoupling circuits have emerged to eliminate the inherent second-order ripple power in a single-phase power conversion system. This study proposes a design method to determine the optimal capacitance for active power decoupling circuits to achieve high power density. Minimum capacitance is derived by analyzing ripple power in a passive power decoupling circuit, a buck-type circuit, and a capacitor-split-type circuit. Double-frequency ripple power decoupling capabilities are also analyzed in three decoupling circuits under a 3.3 kW load condition for a battery charger application. To verify the proposed design method, the performance of the three decoupling circuits with the derived minimum capacitance is compared and analyzed through the results of MATLAB -Simulink and hardware-in-the-loop simulations.

대형 RSFQ 회로의 구성 (Issues in Building Large RSFQ Circuits)

  • 강준희
    • Progress in Superconductivity
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    • 제3권1호
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    • pp.17-22
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    • 2001
  • Practical implementation of the SFQ technology in most application requires more than single-chip-level circuit complexity. Multiple chips have to be integrated with a technology that is reliable at cryogenic temperatures and supports an inter-chip data transmission speed of tens of GHz. In this work, we have studied two basic issues in building large RSFQ circuits. The first is the reliable inter-chip SFQ pulse transfer technique using Multi-Chip-Module (MCM) technology. By noting that the energy contained in an SFQ pulse is less than an attojoule, it is not very surprising that the direct transmission of a single SFQ pulse through MCM solder bump connectors can be difficult and an innovative technique is needed. The second is the recycling of the bias currents. Since RSFQ circuits are dc current biased the large RSFQ circuits need serial biasing to reduce the total amount of current input to the circuit.

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