• Proceedings of the KIEE Conference
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• 1995.07c
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• pp.1350-1352
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• 1995

This paper discribed the characteristic of I-t cross-over-point between current limited-fuse and explusion fuse(Bay-O-Net Fuse) and fuse protection in pad-mounted transformer that was generated internal faults and the short circuit of secondary side(load side). In the I-t cross-over-point, current limited fuse was melted when transient recovery voltage was raised rapidly.

• 전기의세계
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• v.25 no.5
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• pp.75-78
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• 1976

The most difficult problem encountered in impulse test of transformer is the determination of exact fauly for coil layer short. This paper is to establish one of improved standards in the above case by means of wave form analysis, based on the equivalent circuits and experimental investigation. During the fault occurs, the local oscillation in fault circuit is applicable where as the reflection wave is utilized to the main circuit. The result current wave form at neutral impeadance point is similar to the wave form by impulse test and has the singular wave form respectively.

• Proceedings of the KIPE Conference
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• 2017.11a
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• pp.153-154
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• 2017

In this paper, a short-circuit protection function of a gate driver for SiC FET is investigated, which monitors voltage between drain and source of a FET under turn-on condition and turns off the FET if the voltage exceeds a predefined value.

• Proceedings of the KIEE Conference
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• 1988.11a
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• pp.236-240
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• 1988

The simplified equivalent by using the short circuit impedance has been used for analyzing the prospective transient recovery voltage of the large power system. But it sometimes generates untorelable error in the rate-of-rise of TRV when using the Thevenin equivalent source. This paper provides the new equivalent by using the multi-port theory. The application of the new method to the sample system gives satisfactory accuracy compared with the short-circuit equivalent.

• Proceedings of the KIEE Conference
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• 2005.07a
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• pp.57-59
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• 2005

This paper describes the applicability of HVDC system to KEPCO system in terms of educing short circuit current. Especially, the effect of reducing the short circuit current n Gyungin area and Seoul area by using HVDC system was mainly investigated. In addition, the transaction of electric power between ar was, security problem, and economic aspects were also examined.

• Proceedings of the KIEE Conference
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• 2006.07c
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• pp.1527-1528
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• 2006

This paper presents short-circuit tests for polymer-housed distribution arrestors depends on standards. The compared standards are IEC 60694(2004) and IEEE C62.11 (2005). Major differences depends on standards are prefaulted(pre-failure) method by means of a fuse wire and test procedure.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 1996.10a
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• pp.307-312
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• 1996

A torsional vibration analysis of a multi-stage reduction gear box connected to a gas turbine system is presented. For a free vibration analysis the Modified Hibner Branch Method, so called "Blank Matrix Method", and the .lambda.-Matrix Method are used in the modeling and the eigenvalue solution, respectively. Also, a short circuit forced analysis of the system is performed, utilizing the energy method modeling. It is shown that the results of the free vibration analysis have the same tendency as those of the short circuit analysis. analysis.

• International journal of advanced smart convergence
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• v.11 no.2
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• pp.59-63
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• 2022

In this study, we study of luminescent solar concentrators comprise thick glass with broadband antireflection coating deposited on the top surfaces and inorganic phosphor layers contacted on the bottom surfaces. Solar cells are contacted to the lateral surfaces of the glass. Experimental results show the broadband antireflection coating increased the short-circuit current of the solar cell.

• Proceedings of the KIEE Conference
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• 2006.04a
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• pp.330-332
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• 2006

A short distance laser range detector was developed on digital circuit. The circuit changed the analog circuit to digital circuit as possible as. The currently available laser range circuit one uses analog circuit mainly. But this ranger design targeted mass production with digital reporting function. So digital circuits replaced the analog circuit except amplifier and remained minor circuits those are hard to replace with digital circuit. The simulation shows that it is possible to make a reasonable distance measuring circuit on a digital circuit for very low price compare to analog circuit one.

• The Transactions of the Korean Institute of Electrical Engineers
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• v.44 no.10
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• pp.1311-1316
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• 1995

The electrical properties of the Langmuir-Blodgett (LB) films layered with arachidic acid were studied at the room temperature. The sample was formed with 2 different structure ; One was Al/LB/Al and the other was Au/LB/Au. The precise structure of Al/LB/Al was considered as Al/Al$_{2}$O$_{3}$/LB/Al, because the natural oxide layer was formed on surface of lower Al electrode. The electrical conductivity of Al/Al$_{2}$O$_{3}$/LB/Al structure was determined the value of 3.5 * 10$^{-14}$ S/cm from the measurement of current-voltage (I-V) characteristics. The sample with the structure of Au/LB/Au was made to eliminate the influence of oxide layer in the electrical properties of the LB films. The short circuit current was observed in this sample from the I-V characteristics. To verify the reason of short circuit current generation, copper decoration method was employed to the 15 layers of LB films deposited on the Al and Au electrode each. The defects were shown on the films deposited with Au electrode. This results means that the defects on the LB films which layered with the Au electrode were contributed to the short circuit current. Several films (15, 31, 51, 71L) were deposited on the Au electrode and measured the size of defects with the copper decoration method. The size of defects becomes smaller as the film layer was increased. We conclude that the existence of defects affects the short circuit current generation.