• Title/Summary/Keyword: Cercospora sojina Hara

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Assessing Frogeye Leaf Spot Resistance on Recommended Soybean Cultivars (콩 주요 품종에 대한 점무늬병 저항성 평가)

  • Kang, In Jeong;Shim, Hyeong Kwon;Shin, Dong Bum;Roh, Jae Hwan;Goh, Jaeduk;Heu, Sunggi
    • Research in Plant Disease
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    • v.21 no.3
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    • pp.243-249
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    • 2015
  • Soybean frogeye leaf spot caused by the fungus Cercospora sojina Hara, has known to lead a severe reduction of crop yield. Since frogeye leaf spot on soybean has recently become a serious problem in Korea, the susceptibility of recent recommended cultivars against C. sojina had been tested. To standardize the disease severity of soybean, the optimum sporulation condition of C. sojina and the disease index were established in this study. Sporulation was maximized on the 10% V8 juice agar with 12 h light and 12 h dark at $25^{\circ}C$. Spore suspension ($10^5spores/ml$) was sprayed on the leaves of soybean (V6 stage), and the disease responses to each isolate were evaluated on 28 days after inoculation. As a result, Daepung, Shinpaldal2ho, Yeonpung and Cheonga showed the resistance reaction to 8, 7, 6, 6 isolates of C. sojina, respectively, whereas Cheongja, Hwangkeum, Taekwang, Daewon, Cheonsang and Sinhwa showed the susceptible reaction to 8 isolates of C. sojina. Breeding the resistant soybean cultivars against C. sojina requires a uniform resistance for screening technique. The disease index of frogeye leaf spot on soybean developed in this study can be effectively used for the accurate field assay to select the frogeye leaf spot resistant soybean.

Establishment of Economic Threshold by Evaluation of Yield Component and Yield Damages Caused by Leaf Spot Disease of Soybean (콩 점무늬병(Cercospora sojina Hara) 피해해석에 의한 경제적 방제수준 설정)

  • Shim, Hongsik;Lee, Jong-Hyeong;Lee, Yong-Hwan;Myung, Inn-Shik;Choi, Hyo-Won
    • Research in Plant Disease
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    • v.19 no.3
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    • pp.196-200
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    • 2013
  • This study was carried out to investigate yield loss due to soybean leaf spot disease caused by Cercospora sojina Hara and to determine the economic threshold level. The investigations revealed highly significant correlations between disease severity (diseased leaf area) and yield components (pod number per plant, total grain number per plant, total grain weight per plant, percent of ripened grain, weight of hundred seed, and yield). The correlation coefficients between leaf spot severity and each component were -0.90, -0.90, -0.92, -0.99, -0.90 and -0.94, respectively. The yield was inversely proportional to the diseased leaf area increased. The regression equation, yield prediction model, between disease severity (x) and yield (y) was obtained as y = -3.7213x + 354.99 ($R^2$ = 0.9047). Based on the yield prediction model, economic injury level and economic threshold level could be set as 3.3% and 2.6% of diseased leaf area of soybean.