• Title/Summary/Keyword: Cd-Pb thin film

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Preparation and Characterization of Electrodeposited Cadmium and Lead thin Films from a Diluted Chloride Solution

  • Sulaymon, Abbas Hamid;Mohammed, Sawsan A.M.;Abbar, Ali Hussein
    • Journal of Electrochemical Science and Technology
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    • v.5 no.4
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    • pp.115-127
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    • 2014
  • Cd-Pb thin films were electrodeposited from a diluted chloride solution using stainless steel rotating disc electrode. The linear sweep voltammograms of the single metallic ions show that electrodeposition of these ions was mass transfer control due to the plateau observed for different rotations at concentration (50 and 200 ppm). The voltammograms of binary system elucidate that electrodeposition process always start at cathodic potential located between the potential of individual metals. Currents transients measurements, anodic linear sweep voltammetry (ALSV) and atomic force microscopy (AFM) were used to characterize the electrocryatalization process and morphology of thin films. ALSV profiles show a differentiation for the dissolution process of individual metals and binary system. Two peaks of dissolution Cd-Pb film were observed for the binary system with different metal ion concentration ratios. The model of Scharifker and Hills was used to analyze the current transients and it revealed that Cd-Pb electrocrystalization processes at low concentration is governed by three-dimensional progressive nucleation controlled by diffusion, while at higher concentration starts as a progressive nucleation then switch to instantaneous nucleation process. AFM images reveal that Cd-Pb film electrodeposited at low concentration is more roughness than Cd-Pb film electrodeposited at high concentrated solution.

Optical and Optoelectric Properties of PbCdS Ternary Thin Films Deposited by CBD

  • Mohammed, Modaffer. A.;Mousa, Ali M.;Ponpon, J.P.
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.9 no.2
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    • pp.117-123
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    • 2009
  • $Pb_{x}Cd_{1-x}S$ films are prepared in the composition range of 0.05${\leq}x{\leq}$0.25, using a chemical bath deposition growth technique under optimum conditions amide at realizing good photo response. The x-ray diffraction results show that the films are of PbS-CdS composite with individual CdS and PbS planes. The films exhibit two direct band gaps, 2.4 eV attributed to CdS, while the other varies continuously from 2.4 eV to 1.3 eV. The films surface morphology is smooth with crystallite, whose grain size increases with increasing mole fraction (x). The decrease in band gap with increase in lead concentration suggests inter-metallic compound of PbS (Eg=0.41 eV) with CdS (Eg=2.4 eV)

Blue-Emitting CaS:Pb Thin Film Electroluminescent Devices Fabricated by Controlled Atomic Layer Deposition

  • Yun, Sun-Jin;Kim, Yong-Shin;KoPark, Sang-Hee;Kang, Jung-Sook;Cho, Kyoung-Ik;Ma, Dong-Sung
    • 한국정보디스플레이학회:학술대회논문집
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    • 2000.01a
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    • pp.149-150
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    • 2000
  • Lead-doped calcium sulfide(CaS:Pb) thin film electroluminescent devices were deposited using atomic layer deposition(ALD). CaS:Pb is a very promising blue phosphor showing very high luminance and the color coordinate close to the blue of cathode ray tube. The luminance, $L_{25}$, of CaS:Pb(1.6 mol.%) EL device was higher than 80 $cd/cm^2$ at a driving frequency of 60Hz. The color coordinates of blue EL emission of CaS:Pb deposited by ALD are consistent with the Pb concentration ranging from approximately 0.5 to 3 mol.%.

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Magnetoresistance in Post-annealed Bi Thin Films on PbTe-buffered CdTe(111)B and on Mica Substrates (PbTe/CdTe(111)B와 마이카 기판 위에 성장된 Bi 박막의 후열처리 전후의 자기저항)

  • Kim Yun-Ki;Choi Jin-Sung;Li Hai-Bo;Cho Sung-Lae
    • Journal of the Korean Vacuum Society
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    • v.15 no.4
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    • pp.367-373
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    • 2006
  • We have observed a large increase in the magnetoresistance (MR) of Bi thin films, which were subjected to a post-annealing procedure at $268^{\circ}C$C, $3^{\circ}C$ below the Bi melting point. We have achieved an increase in the MR by 260-fold and 1200-fold at 5 K and 5 T after post-annealing, as compared with 190 and 620 for an as-deposited Bi film on PbTe/CdTe(111) and on mica, respectively. The large MR increase by post-annealing might be due to the improvement of crystallinity according to the x-ray analysis. However, post-annealing over a certain amount time showed the reduction in MR values.

A study on the indium purification for electronic materials by zone refining (대정제법에 의한 전자재료용 indium정제에 관한 연구)

  • 김백년;김선태;송복식;문동찬
    • Electrical & Electronic Materials
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    • v.7 no.2
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    • pp.130-137
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    • 1994
  • Indium, element of group III, was refined by using zone refining for high purity refinement. We have found the impurities of T1, Zn, Fe, Cd, Pb, Ni, Cu, Sn in the refined indium with ICP-AES, so that 3.9 weight ppm of T1 was reduced to less than 1 ppm, 1.0 weight ppm of Zn was reduced to 0.7 ppm, 2.8 weight ppm of Cd was reduced to 2.5 ppm and 14.0 weight ppm of Sn was reduced to 6.7 ppm with 5 melten zone passes only. 3.9 weight ppm of T1 was reduced to less than 1 ppm, 1.0 weight ppm of Zn was reduced to 0.3 ppm, 2.8 weight ppm of Cd was reduced to less than 1.0 ppm and 14.0 weight ppm of Sn was reduced to 0.4 ppm after vacuum baking with 5 melten zone passes. The surface morpholgy of metal Indium thin film in each conditions showed that porosities were reduced in the front of sampled ingot after vacuum baking with 5 zone melten zone passes. The average electrical resistivity of Indium thin film was reduced from 1.4*10$^{-3}$ .ohm.-cm in Indium origin ingot to 7.9*10$^{-6}$ .ohm.-cm after zone refined with 5 melten zone passes.

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Change of I-V Properties of Flexible CZTS Solar Cell Through Mechanical Bending Test (굽힘 시험에 의한 플렉시블 CZTS 태양전지의 I-V 특성 변화에 관한 연구)

  • Kim, Sungjun;Kim, Jeha
    • Journal of the Korea Convergence Society
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    • v.13 no.3
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    • pp.197-202
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    • 2022
  • The CZTS solar cell is a thin film solar cell using an absorption layer composed of Cu, Zn, Sn, Se, and S, and is cheaper than a CIGS solar cell using In and Ga and more eco-friendly than a perovskite and CdTe solar cell using Pb and Cd. In this study, we conducted a bending test for flexible CZTS solar cells. Experiments were conducted in the direction of inner benidng with compressive stress and outer bending with tensile stress, and during the number of bending 1,000 times with a radius of curvature of 50 mmR, the efficiency of the solar cell decreased by up to 12.7%, and the biggest cause of efficiency reduction in both directions was a large decrease in parallel resistance.

Electronic Structure and Elemental Composition of the Lead Sulfide Colloidal Quantum Dots Depending on the Types of Ligand and Post-Treatment (리간드 종류와 후처리 공정에 따른 황화납 콜로이드 양자점 박막의 전자 구조 및 원소 조성 분석)

  • Kim, Tae Gun;Choi, Hyekyoung;Jeong, Sohee;Kim, Jeong Won
    • Journal of the Korean Chemical Society
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    • v.60 no.6
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    • pp.402-409
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    • 2016
  • Thin films of lead sulfide colloidal quantum dots (CQDs) of 2.8 nm in diameter are fabricated and their surfaces are passivated by 3-mercaptopropionic acid (MPA) ligand or hybrid type ($MPA+CdCl_2$) ligand, respectively. The changes in valence band electronic structure and atomic composition of each PbS CQD film upon post-treatment such as air, N2 annealing or UV/Ozone have been studied by photoelectron spectroscopy. The air annealing makes the CQD fermi level to move toward the valence band leading to "p-type doping" regardless of ligand type. The UV/Ozone post-treatment generates $Pb(OH)_2$, $PbSO_x$ and PbO on both CQD surfaces. But the amount of the PbO has been reduced in hybrid type ligand case, especially. That is probably because the extra Pb cations in (111) surface are additionally passivated by $Cl_2$ ligand, which limits the reaction between the Pb cation and ozone.

Anodic Stripping Voltammetric Determinations of Zinc, Cadmium, Lead and Copper in Freshwater and Sediment (담수 및 퇴적물에 함유된 아연, 카드뮴, 납 및 구리의 산화전극 벗김 전압전류법 정량)

  • Hahn, Young Hee;Yoo, Jeong Yeon
    • Journal of the Korean Chemical Society
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    • v.41 no.4
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    • pp.180-185
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    • 1997
  • Zinc, cadmium, lead and copper were simultaneously determined by depositing metals at - 1.200 V vs. a Ag/AgCl(sat. KCl) reference electrode for 150 seconds on a hanging mercury drop electrode(HMDE) or a thin mercury film electrode(TMFE), followed by scanning towards anodic direction using differential pulse voltammetric(DPASV) and square wave voltammetric(SWASV) techniques. The linear calibration curves were obtained for four metal ions simultaneously determined by DPASV with a HMDE in the concentration range between 20 and 100 ppb. However, the linear calibration plots were obtained only for $Cd^{2+}$ and $Pb^{2+}$ in the simultaneous determinations with a TMFE in the concentration range up to 100 ppb using DPASV and up to 10 ppb using SWASV. DPASV with a TMFE was about 15 times more sensitive than DPASV with a HMDE for simultaneous determinations of $Cd^{2+}$ and $Pb^{2+}$. SWASV was about 5 times more sensitive than DPASV at a TMFE. Concentrations of zinc in seven different sediment samples determined by DPASV with a HMDE and inductively coupled plasma-mass spectrometry were compared, resulting with an excellent correlation coefficient of 0.9993 and with no significant difference between two methods after t-test.

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Low-resistance ohmic contacts to p-$Hg_{0.7}$$Cd_{0.3}$Te (p-$Hg_{0.7}$$Cd_{0.3}$Te에 낮은 저항의 접촉을 얻는 방법에 대한 연구)

  • Kim, Kwan;Chung, Han;Kim, Sung-Chul;Lee, Hee-Chul;Kim, Choong-Ki;Kim, Hong-Kook;Kim, Jae-Mook
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.31A no.10
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    • pp.87-93
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    • 1994
  • Ohmic contacts between Au and p-HgHg_{0.7}Cd_{0.3}Te$ with low specific contact resistance have been obtained. The contact region of the wafer is first pre-heated for 5 seconds in a rapid thermal processing equipment. The temperature reaches a maximum value of about 200$^{\circ}C$ at the end of the 5 seconds. Next, a thin Au film is formed on the contact region by immersing the sample in AuCl$_{3}$ solution. the sample is then post-annealed in the same condition as the pre-heating after Pb/In pad metals are deposited on the electroless Au contacts. The specific contact resistance measured by transmission line model is 5${\times}10^{-3}{\Omega}cm^{2}$ at 80K. RBS and differential Hall measurement data suggest that the above low resistance ohmic contact is ascribed to surface traps and increased gold diffusion rate.

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